INTERNATIONAL JOURNAL OF MACHINE TOOLS AND MANUFACTURE
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 405
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Trends in surface roughnessThomas, T.R. et al. | 1998
- 413
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Opportunities and problems when standardising and implementing surface structure parameters in industryWestberg, J. et al. | 1998
- 417
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Problems in surface metrologyVorburger, T.V. et al. | 1998
- 419
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Roller burnishing of hard turned surfacesKlocke, F. et al. | 1998
- 425
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Optimization of gear tooth surfacesAmini, N. et al. | 1998
- 437
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The 3-D characterisation of the surface topography of the ballizing processWang, K.H. et al. | 1998
- 445
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A development of three-dimensional surface measurement on cylinderSasajima, K. et al. | 1998
- 451
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Visual comparators of propeller surface roughnessMosaad, M.A. et al. | 1998
- 457
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Analysis of surface topography changes in steel sheet strips during bending under tension friction testJonasson, M. et al. | 1998
- 469
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Surface treatment of cutting tool substratesTönshoff, H.K. et al. | 1998
- 477
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Surface analysis of injection molded TV componentsSkands, U. et al. | 1998
- 485
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3-D surface analysis of worn spherical roller thrust bearingsOlofsson, U. et al. | 1998
- 495
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Levels of topography in mechanics of precision jointsChizhik, S.A. et al. | 1998
- 503
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Quantification of galling in sheet metal forming by surface topography characterisationAndreasen, J.L. et al. | 1998
- 511
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Contact and thermal analysis of bronze and steel machined surfaces in sliding contactVáradi, K. et al. | 1998
- 519
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Nano metrology of cylinder bore wearRosén, B.-G. et al. | 1998
- 529
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Characterization of surface texture generated by multi-process manufactureSannareddy, H. et al. | 1998
- 537
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A vector modelling technique for the representation of 3-dimensional surface topographyBurrows, J.M. et al. | 1998
- 543
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A surface topography model for automated surface finishingChen, C.-C.A. et al. | 1998
- 551
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A new fractal model for anisotropic surfacesBlackmore, D. et al. | 1998
- 559
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Foundations of topological characterization of surface textureScott, P.J. et al. | 1998
- 567
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Fractal dimension measurement of engineering surfacesRuss, J.C. et al. | 1998
- 573
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Geometrical description of surface topography by means of an equivalent conformal profile modelRoques-Carmes, C. et al. | 1998
- 581
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Morphological characterisation of engineered surfaces by wavelet transformLee, S.-H. et al. | 1998
- 591
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Neural network applications in surface topographyMainsah, E. et al. | 1998
- 599
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Approximate numerical models of 3-D surface topography generated using sparse frequency domain descriptionsSherrington, I. et al. | 1998
- 607
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3D-surface parameters and their application on deterministic textured metal sheetsPfestorf, M. et al. | 1998
- 615
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Spectral and 3D motifs identification of anisotropic topographical components. Analysis and filtering of anisotropic patterns by morphological rose approachZahouani, H. et al. | 1998
- 625
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The MOTIF-method (ISO 12085) - A suitable description for functional, manufactural and metrological requirementsDietzsch, M. et al. | 1998
- 633
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Scale-sensitivity, fractal analysis and simulationsBrown, C.A. et al. | 1998
- 639
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Why filtering surface profiles?Trumpold, H. et al. | 1998
- 647
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Assessment of steel surface roughness and waviness in relation with paint appearanceScheers, J. et al. | 1998
- 657
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The importance of surface roughness for implant incorporationWennerberg, A. et al. | 1998
- 663
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Surface roughness of (110) orientation silicon based micro heat exchanger channelKang, S.-W. et al. | 1998
- 669
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Surface characterisation of electro-active thin polymeric film bearingsLiu, X. et al. | 1998
- 677
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Direct length comparison between regular crystalline lattice and SEM standard grating using dual tunneling unit STMAketagawa, M. et al. | 1998
- 685
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Evaluation of surface roughness by vision systemKiran, M.B. et al. | 1998
- 691
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Large field of view, high spatial resolution, surface measurementsWyant, J.C. et al. | 1998
- 699
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Measurement of optical surfaces generated by diamond turningBrinksmeier, E. et al. | 1998
- 707
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Nanometrology of surface topography: Application to the reseach in development of a new mass standardLin, T.Y. et al. | 1998
- 707
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Nanometrology of surface topography: application to the research in development of a new mass standardLin, T. Y. / Peng, G. S. et al. | 1998
- 715
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Roughness measurements in the picometric range using a polarization interferometer and a multichannel lockin detection techniqueGleyzes, P. et al. | 1998
- 719
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Texture classification of engineering surfaces with nanoscale roughnessGrigoriev, A.Ya et al. | 1998
- 725
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The in-process surface roughness measurement using fringe field capacitive (FFC) methodNowicki, B. et al. | 1998
- 733
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AFM and light scattering measurements of optical thin films for applications in the UV spectral regionJakobs, S. et al. | 1998
- 741
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The Abbott curve -- Well known in metrology but not on technical drawingsProstrednik, D. et al. | 1998
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IntroductionCrafoord, R.J. et al. | 1998