Microelectronic engineering
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 2831
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Local doping of silicon by a point-contact microwave applicatorLivshits, P. / Dikhtyar, V. / Inberg, A. et al. | 2011
- 2837
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Non-volatile memory with zinc oxide nanoparticles embedded in a hybrid polymethylsilsesquioxane layerLee, W.K. / Wong, H.Y. / Aw, K.C. et al. | 2011
- 2840
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Instabilities in Focused Ion Beam-patterned Au nanowiresNaik, J.P. / Prewett, P.D. / Das, K. et al. | 2011
- 2844
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Organized porous alumina membranes for high density silicon nanowires growthBernardin, T. / Dupré, L. / Burnier, L. et al. | 2011
- 2848
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Microstructure characterization of SnAgCu solder bearing Ce for electronic packagingZhang, Liang / Xue, Song-bai / Gao, Li-li et al. | 2011
- 2852
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Impact of adhesive rheology on stress-distortion of bonded plastic substrates for flexible electronics applicationsHaq, Jesmin / Vogt, Bryan D. / Raupp, Gregory B. et al. | 2011
- 2857
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Pattern evolution in shallow trench isolation chemical mechanical planarization via real-time shear and down forces spectral analysesSampurno, Yasa / Sudargho, Fransisca / Zhuang, Yun et al. | 2011
- 2862
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A lubrication model between the soft porous brush and rigid flat substrate for post-CMP cleaningHuang, Yating / Guo, Dan / Lu, Xinchun et al. | 2011
- 2871
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Dry etching fin process for SOI finFET manufacturing: Transition from 32 to 22nm node on a 6T-SRAM cellAltamirano-Sánchez, E. / Paraschiv, V. / Demand, M. et al. | 2011
- 2879
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Numerical analysis of zeptogram/Hz-level mass responsivity for in-plane resonant nano-electro-mechanical sensorsHassani, F.A. / Cobianu, C. / Armini, S. et al. | 2011
- 2885
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Creation of convex microlenses in PDMS with focused MeV ion beamSzilasi, S.Z. / Hegman, N. / Csik, A. et al. | 2011
- 2889
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Fabrication of biomimic GaAs subwavelength grating structures for broadband and angular-independent antireflectionChen, Xi / Fan, Zhong-Chao / Xu, Yun et al. | 2011
- 2894
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Characterization and performance of Schottky diode based on wide band gap semiconductor ZnO using a low-cost and simplified sol–gel spin coating techniqueFarag, A.A.M. / Farooq, W.A. / Yakuphanoglu, F. et al. | 2011
- 2900
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Fabrication of nickel stamp with improved sidewall roughness for optical devicesOh, Seung Hun / Cho, Sang Uk / Kim, Chang Seok et al. | 2011
- 2908
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Fabrication of anti-reflective structures using hot embossing with a stainless steel template irradiated by femtosecond laserYao, Tsung-Fu / Wu, Ping-Han / Wu, Tzong-Ming et al. | 2011
- 2913
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Control over pattern fidelity and surface wettability of imprinted templates for flexible color filter manufacturingBessonov, Aleksander / Seo, Jung-Woo / Kim, Jeong-Gil et al. | 2011
- 2919
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Thermally enhanced single-walled carbon nanotube microfluidic alignmentYe, Zhijiang / Lee, Dongjin / Campbell, Stephen A. et al. | 2011
- 2924
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A review of recent results on diamond vacuum lateral field emission device operation in radiation environmentsSubramanian, K. / Kang, W.P. / Davidson, J.L. et al. | 2011
- 2930
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Fabrication of 2D photonic crystal assisted Y2O3:Eu3+ thin-film phosphors by direct nano-imprintingKo, Ki-Young / Her, Eun-Jin / Nichols, William T. et al. | 2011
- 2934
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Preparation and characterization of Fe3+-doped Ni0.9Co0.8Mn1.3− xFexO4 (0≤ x ≤0.7) negative temperature coefficient ceramic materialsZhang, Huimin / Chang, Aimin / Peng, Changwen et al. | 2011
- 2934
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Preparation and characterization of Fe3+-doped Ni0.9Co0.8Mn1.3-xFexO4 (0x<=0.7) negative temperature coefficient ceramic materialsZhang, H. / Chang, A. / Peng, C. et al. | 2011
- 2941
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Contactless read-out of printed memoryAllen, Mark / Aronniemi, Mikko / Mattila, Tomi et al. | 2011
- 2946
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Single-material-based multilayered nanostructures fabrication via reverse thermal nanoimprintingYew, S.Y. / Kustandi, T.S. / Low, H.Y. et al. | 2011
- 2951
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Interface control and photovoltaic properties of n-type silicon/metal junction by organic dyeYakuphanoglu, F. / Ocak, Y.S. / Kılıçoğlu, T. et al. | 2011
- 2955
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High mobility strained Si0.5Ge0.5/SSOI short channel field effect transistors with TiN/GdScO3 gate stackMinamisawa, R.A. / Schmidt, M. / Durgun Özben, E. et al. | 2011
- 2959
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Pentacene/n−-Si heterojunction diodes and photovoltaic devices investigated by I–V and C–V measurementsOyama, N. / Takanashi, Y. / Kaneko, S. et al. | 2011
- 2964
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Study of interfacial reactions between Sn3.5Ag0.5Cu composite alloys and Cu substrateTsao, L.C. / Chu, C.P. / Peng, S.F. et al. | 2011
- 2970
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Environmental protection of inkjet-printed Ag conductorsHalonen, Eerik / Pynttäri, Vesa / Lilja, Juha et al. | 2011
- 2977
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Permittivity of modified polyimide layers on LTCCBittner, Achim / Seidel, Helmut / Schmid, Ulrich et al. | 2011
- 2981
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Effects of abrasive particle size and tool surface irregularities on wear rates of work and tool in polishing processesHung, Tu-Chieh / Chang, Shao-Heng / Lin, Cheng-Chi et al. | 2011
- 2991
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Anomalous thermal oxidation of gadolinium thin films deposited on silicon by high pressure sputteringPampillón, M.A. / Feijoo, P.C. / San Andrés, E. et al. | 2011
- 2997
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Effects of temperature on series resistance determination of electrodeposited Cr/n-Si/Au–Sb Schottky structuresDemircioglu, Ö. / Karataş, Ş. / Yıldırım, N. et al. | 2011
- 3003
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One port contour-mode ZnO piezoelectric MEMS resonatorGryba, Tadeusz / Carlier, Julien / Wang, Shengxiang et al. | 2011
- 3011
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Nanoimprint lithography resist profile inversion for lift-off applicationsShields, Philip A. / Allsopp, Duncan W.E. et al. | 2011
- 3015
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Development of flexible piezoelectric nanogenerator: Toward all wet chemical methodCheng, Yao-Yi / Chou, Shang-Chih / Chang, Jun-An et al. | 2011
- 3020
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Effect of mechanical process parameters on friction behavior and material removal during sapphire chemical mechanical polishingZhang, Zefang / Yan, Weixia / Zhang, Lei et al. | 2011
- 3024
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Golden bump for 20micron diameter wire bond enhancement at reduced process temperatureNan, Chunyan / Mayer, Michael / Zhou, Norman et al. | 2011
- 3030
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Study of metal barrier deposition-induced damage to porous low-k materialsZhao, Larry / Volders, Henny / Baklanov, Mikhail et al. | 2011
- 3035
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Gas sensing of colloidal polyaniline in a chemoresistor consisting of nanometer electrodesPark, S.Y. / Bae, M.S. / Jeon, I.D. et al. | 2011
- 3043
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Fabrication of high aspect ratio nanostructures on 3D surfacesSenn, T. / Esquivel, J.P. / Sabaté, N. et al. | 2011
- IFC
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Inside Front Cover - Editorial Board| 2011