IEEE Design & Test of Computers
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 2
-
News| 1993
- 4
-
Conference Reports| 1993
- 6
-
Highly reliable testing of ULSI memories with on-chip voltage-down convertersTsukude, M. / Arimoto, K. / Hidaka, H. et al. | 1993
- 6
-
Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters - New techniques assure low field-failure rates for 16-Mbit DRAMs.Tsukude, Masaki et al. | 1993
- 13
-
Failure Analysis of High-Density CMOS SRAMs Using Realistic Defect Modeling and I~D~D~Q TestingNaik, S. / Agricola, F. / Maly, W. et al. | 1993
- 13
-
Failure Analysis of High-Density CMOS SRAMs Using Realistic Defect Modeling and IDDQ Testing - A defect-based model greatly improves diagnostic resolution for multimegabit memory testing.Naik, Samir et al. | 1993
- 13
-
Failure analysis of high-density CMOS SRAMs: using realistic defect modeling and I/sub DDQ/ testingNaik, S. / Agricola, F. / Maly, W. et al. | 1993
- 24
-
Built-in self-diagnosis for repairable embedded RAMsTreuer, R. / Agarwal, V.K. et al. | 1993
- 24
-
Built-In Self-Diagnosis for Repairable Embedded RAMs - A built-in diagnosis-and-repair unit incurs minimal area overhead.Treuer, Robert et al. | 1993
- 34
-
Test algorithms for double-buffered random access and pointer-addressed memoriesVan Sas, J. / Catthoor, F. / De Man, H.J. et al. | 1993
- 34
-
Test Algorithms for Double-Buffered Random Access and Pointer-Addressed Memories - Inductive fault analysis provides a realistic fault model for double-buffered RAMs and PAMs.Sas, Jos van et al. | 1993
- 45
-
Call for Articles| 1993
- 46
-
RISE++: A Symbolic Environment for Scan-Based Testing - This powerful, flexible system supports development, application, and debugging for the HP-Apollo Series 10000 RISC workstation and other scan architectures.Vinoski, Steve et al. | 1993
- 46
-
RISE++: a symbolic environment for scan-based testingVinoski, S. et al. | 1993
- 55
-
1994 Editorial Calendar| 1993
- 56
-
CrossCheck: An Innovative Testability Solution - This embedded test technology combines controllability and observability to produce a highly testable ASIC having minimal area and performance overhead.Chandra, Susheel et al. | 1993
- 56
-
CrossCheck: an innovative testability solutionChandra, S. / Pierce, K. / Srinath, G. et al. | 1993
- 69
-
A tutorial on built-in self-test. 2. ApplicationsAgrawal, V.D. / Kime, C.R. / Saluja, K.K. et al. | 1993
- 69
-
A Tutorial on Built-In Self-Test, Part 2: ApplicationsAgrawal, V. D. / Kime, C. R. / Saluja, K. K. et al. | 1993
- 69
-
A Tutorial on Built-In Self-Test, Part 2: Applications - BIST applications in commercial products are increasing, and a number of BIST design tools have appeared.Agrawal, Vishwani D. et al. | 1993
- 78
-
Performing Effective Fault Isolation in Integrated Diagnostics - Fault trees developed for fault isolation must be modified for various diagnostic levels and operational conditions.Sheppard, John W. et al. | 1993
- 78
-
Performing effective fault isolation in integrated diagnosticsSheppard, J.W. / Simpson, W.R. et al. | 1993
- 91
-
New Products| 1993
- 92
-
TTTC Newsletter| 1993
- 94
-
DATC Newsletter| 1993
- 96
-
Advertiser-product Index; Moving Coupon| 1993
-
CS Information Page| 1993
-
Reader Service Card| 1993