IEEE Design & Test of Computers
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 11
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The future of test and DFTSinger, G. et al. | 1997
- 1
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EIC Message -- Welcome ITC 97 attendees!| 1997
- 6
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News -- DAC 97: EDA focus; IEEE CAS changes| 1997
- 7
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Panel Summaries -- Next generation HDLs| 1997
- 8
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Conference Reports -- VTS 97: 15 years of success; VLSI Design 97 and multimedia| 1997
- 15
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Guest Editors' Introduction: Design and Test Economics -- An Extra DimensionAmbter, Tony et al. | 1997
- 15
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Design And Test Economics - an Extra DimensionAmbler, T. / Abadir, M. et al. | 1997
- 17
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A BIST and boundary-scan economics frameworkMiranda, J.M. et al. | 1997
- 24
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Incorporating cost modeling in embedded-system designDebardelaben, J.A. / Madisetti, V.K. / Gadient, A.J. et al. | 1997
- 24
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Incorporating Cost Modeling in Embedded-System Design Embedded-System DesignDebardelaben, J. A. / Madisetti, V. K. / Gadient, A. J. et al. | 1997
- 35
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Moving Coupon| 1997
- 36
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Analyzing manufacturing test costsPynn, C.T. et al. | 1997
- 41
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Test Economics in the 21st CenturyTurino, Jon et al. | 1997
- 41
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Test economics in the 2lst CenturyTurino, J. et al. | 1997
- 45
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Cost-driven ranking of memory elements for partial intrusionAbadir, M. / Kapur, R. et al. | 1997
- 51
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The economics of system-level testingFarren, D. / Ambler, T. et al. | 1997
- 59
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IC failure analysis: magic, mystery, and scienceSoden, J.M. / Anderson, R.E. / Henderson, C.L. et al. | 1997
- 70
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Diagnosing IC failures in a fast environmentStaab, D. / Hnatek, E.R. et al. | 1997
- 76
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IC failure analysis: the importance of test and diagnosticsVallett, D.P. et al. | 1997
- 83
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Automated diagnosis in testing and failure analysisButler, K.M. / Johnson, K. / Platt, J. et al. | 1997
- 90
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Shmoo plotting: the black art of IC testingBaker, K. / Van Beers, J. et al. | 1997
- 98
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Modeling the unmodelable: algorithmic fault diagnosisAitken, R.C. et al. | 1997
- 104
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A Microprocessor Architecture Design with ATLASZagar, Mario et al. | 1997
- 104
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Microprocessor architecture design with ATLASZagar, M. / Basch, D. et al. | 1997
- 113
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Built-in self-test for designers| 1997
- 113
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A D&T Roundtable Built-In Self-Test for Designers| 1997
- 123
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DATC Newsletter| 1997
- 126
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TTTC Newsletter| 1997
- 128
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The Last Byte -- Still in the Stone Age?| 1997
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CS Information Page| 1997