IEEE transactions on reliability
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 2
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Spare Routing Reliability for a Stochastic Flow Network Through Two Minimal Paths Under Budget ConstraintYi-Kuei Lin, et al. | 2010
- 2
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Extended Best Papers From the 2008 Asian International Workshop on Advanced Reliability Modeling - Spare Routing Reliability for a Stochastic Flow Network Through Two Minimal Paths Under Budget ConstraintPeng, C-Y et al. | 2010
- 11
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Useful Lifetime Prediction of Rubber Components Using Accelerated TestingChang Su Woo, / Sung Seen Choi, / Seong Beom Lee, et al. | 2010
- 18
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Availability Analysis of an Intrusion Tolerant Distributed Server System With Preventive MaintenanceUemura, T. / Dohi, T. / Kaio, N. et al. | 2010
- 30
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Progressive-Stress Accelerated Degradation Test for Highly-Reliable ProductsChien-Yu Peng, / Sheng-Tsaing Tseng, et al. | 2010
- 38
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Nonparametric Estimation of Decreasing Mean Residual Life With Type II Censored DataYan Shen, / Min Xie, / Loon Ching Tang, et al. | 2010
- 45
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Lifetime Data Analysis - Evaluating the Reliability Function and the Mean Residual Life for Equipment With Unobservable StatesPark, J J et al. | 2010
- 45
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Evaluating the Reliability Function and the Mean Residual Life for Equipment With Unobservable StatesGhasemi, A. / Yacout, S. / Ouali, M.-S. et al. | 2010
- 55
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Mean Residual Life Function, Associated Orderings and PropertiesNanda, A.K. / Bhattacharjee, S. / Balakrishnan, N. et al. | 2010
- 66
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Higher Order Equilibrium Life DistributionsAhmad, I.A. / Mugdadi, A.R. et al. | 2010
- 74
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Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation TestsJong In Park, / Suk Joo Bae, et al. | 2010
- 91
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Accelerated Testing - A Practical Application of Quantitative Accelerated Life Testing in Power Systems EngineeringGera, A E et al. | 2010
- 91
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A Practical Application of Quantitative Accelerated Life Testing in Power Systems EngineeringTurner, M.D. et al. | 2010
- 102
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Accelerated Degradation Tests Applied to Software Aging ExperimentsMatias, R. / Barbetta, P.A. / Trivedi, K.S. et al. | 2010
- 115
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Accelerated Life Test Plans for Repairable Systems With Multiple Independent RisksXiao Liu, / Long-Ching Tang, et al. | 2010
- 128
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A New Start-Up Demonstration TestGera, A.E. et al. | 2010
- 128
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Demonstration Testing - A New Start-Up Demonstration TestShrestha, A et al. | 2010
- 132
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Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic DevicesTao Yuan, / Yue Kuo, et al. | 2010
- 132
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Burn-In - Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic DevicesGottumukkala, N R et al. | 2010
- 139
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Nanocomponents - Assessing 2-Dimensional Nanocomponent's Limiting ReliabilityLi, G-D et al. | 2010
- 139
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Assessing 2-Dimensional Nanocomponent's Limiting ReliabilityEbrahimi, N. et al. | 2010
- 145
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Decision Diagram Based Methods and Complexity Analysis for Multi-State SystemsShrestha, A. / Liudong Xing, / Yuanshun Dai, et al. | 2010
- 145
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Systems - Decision Diagram Based Methods and Complexity Analysis for Multi-State SystemsEryilmaz, S et al. | 2010
- 162
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Reliability of a System of k Nodes for High Performance Computing ApplicationsGottumukkala, N.R. / Nassar, R. / Paun, M. et al. | 2010
- 170
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A New Reliability Prediction Model in Manufacturing SystemsGuo-Dong Li, / Masuda, S. / Yamaguchi, D. et al. | 2010
- 178
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Conditional Lifetimes of Consecutive $k$-Out-of- $n$ SystemsEryilmaz, S. et al. | 2010
- 178
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Conditional Lifetimes of Consecutive Formula Not Shown -Out-of- Formula Not Shown SystemsEryilmaz, S. et al. | 2010
- 183
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Networks - Reliability of k Separate Minimal Paths Under Both Time and Budget ConstraintsYeh, W-C et al. | 2010
- 183
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Reliability of Formula Not Shown Separate Minimal Paths Under Both Time and Budget ConstraintsLin, Y. K. et al. | 2010
- 183
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Reliability of $k$ Separate Minimal Paths Under Both Time and Budget ConstraintsYi-Kuei Lin, et al. | 2010
- 191
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Modeling Link Events in High Reliability Networks With Support Vector MachinesFeijoo, J. / Rojo-Alvarez, J.L. / Sueiro, J.C. et al. | 2010
- 203
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A New Efficient Algorithm for Generating All Minimal Tie-Sets Connecting Selected Nodes in a Mesh-Structured NetworkMalinowski, J. et al. | 2010
- 212
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A Particle Swarm Optimization Approach Based on Monte Carlo Simulation for Solving the Complex Network Reliability ProblemWei-Chang Yeh, / Yi-Cheng Lin, / Yuk Ying Chung, et al. | 2010
- 222
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A Genetic Programming Approach for Software Reliability ModelingCosta, E.O. / Pozo, A. / Vergilio, S.R. et al. | 2010
- 222
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Software Reliability - A Genetic Programming Approach for Software Reliability ModelingMerle, G et al. | 2010
- 231
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Security - Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc Networks| 2010
- 231
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Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc NetworksJin-Hee Cho, / Ing-Ray Chen, / Phu-Gui Feng, et al. | 2010
- 242
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Linear and Nonlinear Preventive Maintenance ModelsShaomin Wu, / Zuo, M.J. et al. | 2010
- 242
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Maintenance - Linear and Nonlinear Preventive Maintenance ModelsLange, Barbara H et al. | 2010
- 250
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Probabilistic Algebraic Analysis of Fault Trees With Priority Dynamic Gates and Repeated EventsMerle, G. / Roussel, J.-M. / Lesage, J.-J. et al. | 2010
- 250
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Fault Trees - Probabilistic Algebraic Analysis of Fault Trees With Priority Dynamic Gates and Repeated Events| 2010
- 262
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IEEE Transactions on Reliability Information for authors| 2010
- 264
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Information for Authors| 2010
- 264
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TR Upcoming Events| 2010
- C1
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Table of contents| 2010
- C2
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IEEE Transactions on Reliability publication information| 2010
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IEEE Transactions on Reliability institutional listings| 2010