Nuclear instruments & methods in physics research : a journal on accelerators, instrumentation and techniques applied to research in nuclear and atomic physics, materials science and related fields in physics - Section B , Beam interactions with materials and atoms
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 1
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RF ion linacs for applied research and industrial applicationsHamm, Robert W. et al. | 1992
- 7
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Design of a compact ECRIPAC device for 1–400 MeV/amu heavy ion bunches productionGeller, Richard / Golovanivsky, Konstantin S. et al. | 1992
- 17
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Laser cooling of stored ions in ASTRID: a storage ring for ions and electronsHangst, J.S. / Berg-Sørensen, K. / Jessen, P.S. et al. | 1992
- 23
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Prospects of analytical models for accelerator technology in industry (past, present, future)Hagedoorn, H.L. / Botman, J.I.M. / Mutsaers, P.H.A. et al. | 1992
- 28
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Development of the fluorescent materials test chamberHollerman, W.A. / Holland, L.R. / Nisen, D.B. et al. | 1992
- 32
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Possibilities of the DAW structure for application to industrial linacsEsin, S.K. / Kravchuk, L.V. / Paramonov, V.V. et al. | 1992
- 36
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Properties of RFQ accelerators for ion implantationSchempp, A. / Deitinghoff, H. et al. | 1992
- 41
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A cold cathode ion source with a magnetic hollow cathodeKerkow, H. / Boubetra, D. / Holldack, K. et al. | 1992
- 45
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Superconducting synchrotron radiation sources for industrial applicationsWeihreter, E. et al. | 1992
- 53
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Applications of electron accelerators in radioactive waste inspection and assaySené, M.R. et al. | 1992
- 61
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Application of free-electron lasersGrill, Wolfgang et al. | 1992
- 68
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Examination of sea freight containers using modern electron linear acceleratorsDönges, G. / Geus, G. / Henkel, R. et al. | 1992
- 73
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LEA electron accelerators for radiation processingMehnert, R. / Klenert, P. / Hartmann, E. et al. | 1992
- 79
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An operating method to reduce damping time of betatron oscillations at beam injection in an electron storage ringHiramoto, Kazuo / Nishi, Masatsugu et al. | 1992
- 83
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Fringe field calculations for the inhomogeneous Twente Eindhoven microtron magnetsWebers, G.A. / Delhez, J.L. / Botman, J.I.M. et al. | 1992
- 87
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Numerical design and model measurements for a 1.3 GHz microtron accelerating cavityKleeven, W.J.G.M. / Theeuwen, M.E.H.J. / Knoben, M.H.M. et al. | 1992
- 92
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Rhodotron: an accelerator for industrial irradiationBassaler, J.M. / Capdevila, J.M. / Gal, O. et al. | 1992
- 96
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Electron beam focusing in a racetrack microtron by means of rotated two-sector dipole magnetsDelhez, J.L. / Webers, G.A. / Botman, J.I.M. et al. | 1992
- 101
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Design study of the storage ring EUTERPEXi, Boling / Botman, J.I.M. / Timmermans, C.J. et al. | 1992
- 105
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Determination of polymerization particle morphology using synchrotron computed microtomographyJones, K.W. / Spanne, P. / Lindquist, W.B. et al. | 1992
- 111
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XAFS-analysis of materialsDobson, B.R. / Greaves, G.N. et al. | 1992
- 115
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Trace element determinations in selected geological samples using a 15 keV synchrotron microprobe at the SRS, Daresbury, UKPrzybylowicz, W. / van Langevelde, F. / Kucha, H. et al. | 1992
- 122
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Microanalysis using synchrotron radiationKwiatek, Wojciech M. / Cichocki, Tadeusz / Galka, Marek et al. | 1992
- 125
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The fundamental parameter method applied to X-ray fluorescence analysis with synchrotron radiationPantenburg, F.J. / Beier, T. / Hennrich, F. et al. | 1992
- 133
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Hydrogen in and on natural and synthetic diamondSellschop, J.P.F. / Connell, S.H. / Madiba, C.C.P. et al. | 1992
- 141
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A study of the effects of 15N ion beam irradiation on organic compoundsPilakouta, M. / Aslanoglou, X. / Savidou, A. et al. | 1992
- 145
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Excitation functions for 107Ag(d, 2n)107Cd, 109Ag(d, 2n)109Cd and 109Ag(d, p) 110mAg reactionsPeng, Xiufeng / Long, Xianguan / He, Fuqing et al. | 1992
- 149
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Lattice location of implanted carbon in GaAsMader, A. / Meyer, J.D. / Bethge, K. et al. | 1992
- 154
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Investigation of the deuterium distribution in a JET limiter using the nuclear microprobe and ion beam slope cuttingGrambole, D. / Herrmann, F. / Klabes, R. et al. | 1992
- 158
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Test of a new standard for fluorine determination with PIGEZschau, H.-E. / Plier, F. / Vogt, J. et al. | 1992
- 161
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Internal standardization in charged particle activation analysisCasteleyn, K. / Strijckmans, K. / Dams, R. et al. | 1992
- 166
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Determination of oxygen in high purity gallium by using charged particle activation analysisDitrói, F. / Takács, S. / Mahunka, I. et al. | 1992
- 170
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Crystalline order and disorder in epitaxial GaNLindén, M. / Hellborg, R. et al. | 1992
- 175
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Sodium diffusion in metals observed by the 23Na(p,γ) reactionUhrmacher, M. / Lieb, K.P. et al. | 1992
- 181
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Light element depth profiling using elastic recoil detectionHabraken, F.H.P.M. et al. | 1992
- 190
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RBS analysis of heteroepitaxial layered structuresFlagmeyer, R. et al. | 1992
- 202
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Stoichiometry and profiling of surface layers by means of TOF-E ERDA and RBSArai, E. / Funaki, H. / Katayama, M. et al. | 1992
- 207
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Developments in low-energy ion scattering from surfacesBrongersma, H.H. / Bergmans, R.H. / Buijs, L.G.C. et al. | 1992
- 213
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PDMS and surface analysis with fast heavy ion beamsRiggi, F. et al. | 1992
- 218
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Hydrogen profiles of thin PVD silicon nitride films using elastic recoil detection analysisMarkwitz, A. / Bachmann, M. / Baumann, H. et al. | 1992
- 223
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Characterization of thin Si1On surface layers on Si by proton and alpha particle backscatteringHavránek, V. / Hnatowicz, V. / Kvítek, J. et al. | 1992
- 227
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Characterization by Rutherford backscattering, elastic recoil and nuclear reaction analysis of near-surface modifications of glasses submitted to a DC potentialFreire, F.L. Jr. / Lepienski, C.M. / Achete, C.A. et al. | 1992
- 231
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Simultaneous analysis of Li and B in amorphous thin film glasses using ERDANeelmeijer, C. / Grötzschel, R. / Klabes, R. et al. | 1992
- 235
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High energy ERDA with very heavy ions using mass and energy dispersive spectrometryGoppelt, P. / Gebauer, B. / Fink, D. et al. | 1992
- 241
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Investigation of ion beam synthesized iron silicide by RBS, XRD, and Mössbauer spectroscopy (CEMS)Reuther, H. / Wieser, E. / Panknin, D. et al. | 1992
- 245
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HEIRD analysis of the low-Z deposits on probes from the vessel walls of fusion experimentsBehrisch, R. / Grötzschel, R. / Hentschel, E. et al. | 1992
- 249
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A channeling goniometer with a wide temperature range sample holderFischer, U.S. / Döbeli, M. / Suter, M. et al. | 1992
- 253
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Quantitative depth-dependent structural and strain analysis in superlattices by ion channelingLenkeit, K. / Pirrwitz, A. et al. | 1992
- 258
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Sputtering and RBS investigations of ordered and disordered Ni4MoSarholt-Kristensen, L. / Andreev, A. / Johansen, A. et al. | 1992
- 262
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Analysis of tungsten oxide films using MeV ion beamsWagner, W. / Rauch, F. / Ottermann, C. et al. | 1992
- 266
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The hydrogen concentration of diamondlike amorphous carbon films by elastic recoil detection analysisLong, Xianguan / Peng, Xiufeng / He, Fuqing et al. | 1992
- 269
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Heavy element distribution profiles in archaeological samples of human tooth enamel and dentine using the proton-induced X-ray emission techniqueBuoso, M.C. / Fazinic, S. / Haque, A.M.I. et al. | 1992
- 273
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Light element analysis using PIXE and PIGE spectroscopyFazinić, S. / Jakšić, M. / Kukec, L. et al. | 1992
- 277
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Film thickness determination with PIXEKlatt, C. / Ensinger, W. / Martin, H. et al. | 1992
- 281
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Elemental analysis with external-beam PIXELin, E.K. / Wang, C.W. / Teng, P.K. et al. | 1992
- 285
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Elemental analysis of mineral grains by means of simultaneous use of PIXE, PIGE and proton backscatteringVogt, J. / Wirth, C. / Zschau, H.-E. et al. | 1992
- 289
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High resolution PIXE using different orders of reflectionTörök, I. et al. | 1992
- 292
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X-ray intensity ratios for microprobes and PIXESieber, K. / Mohammedein, A.M.M. / Musiol, G. et al. | 1992
- 300
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DATTPIXE, a computer package for TTPIXE data analysisReis, M.A. / Alves, L.C. et al. | 1992
- 305
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Determination of Hg concentration in gases by PIXEDutkiewicz, E. / van Kuijen, W.J.P. / Munnik, F. et al. | 1992
- 309
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Measurements of 14C from nuclear power plants with the AMS techniqueErlandsson, Bengt / Hellborg, Ragnar / Håkansson, Kjell et al. | 1992
- 313
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Accelerator mass spectrometry with a gas-filled magnetic spectrographMüller, D. / Bante, B. / Faestermann, T. et al. | 1992
- 319
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Development of 26Al accelerator mass spectrometry for aluminium absorption experiments in humansBarker, J. / Day, J.P. / Priest, N.D. et al. | 1992
- 323
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High-temperature ion implantation in siliconKachurin, G.A. / Tyschenko, I.E. / Fedina, L.I. et al. | 1992
- 331
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Modification of the mechanical properties of ceramic surfaces by energetic ion irradiationBolse, Wolfgang / Peteves, Stathis D. et al. | 1992
- 342
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Ion implantation in III–V compoundsWesch, W. et al. | 1992
- 355
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Ion implantation of optical devicesBuchal, Ch. et al. | 1992
- 361
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Surface modification by ion implantation and ion beam mixingRivière, J.P. et al. | 1992
- 369
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Ion beam synthesis of epitaxial CoSi2 layers and the redistribution of dopants within themReeson, Karen J. / Spraggs, Russell S. / Gwilliam, Russell M. et al. | 1992
- 380
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Ion implantation as an efficient surface treatmentStraede, Chr.A. et al. | 1992
- 389
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Radiation-induced diffusion during ion implantationKerkow, H. / Holldack, K. / Mertens, A. et al. | 1992
- 394
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Electron emission and desorption from frozen gases under fast (MeV) ion bombardmentSchosnig, Markus / Rothard, Hermann / Kroneberger, Kurt et al. | 1992
- 398
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Oxidation and corrosion studies of Al-implanted stainless steel AISI 321 using nuclear reaction and electrochemical techniquesNoli, F. / Misaelides, P. / Spathis, P. et al. | 1992
- 402
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A multipurpose implanter with various target chambers for basic studies on the influence of ion bombardment on material propertiesFrech, G. / Ensinger, W. / Müller, H. et al. | 1992
- 408
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MeV carbon implantation into silicon: microstructure and electrical propertiesSkorupa, W. / Kögler, R. / Voelskow, M. et al. | 1992
- 413
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Oxygen dependence of light emission from sputtered atoms and ions following ion bombardment of polycrystalline aluminum targetsHippler, Rainer / Reinke, Stefan et al. | 1992
- 417
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Phase diagram of implanted systemKopcewicz, M. / Jagielski, J. / Gawlik, G. et al. | 1992
- 422
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Ion implantation effects in Na β″-alumina crystalsFreire, F.L. Jr. et al. | 1992
- 426
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Xenon ion beam mixing in Ni3N/Al bilayersMilosavljevic, M. / Corts, T. / Lieb, K.P. et al. | 1992
- 430
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Influence of implantation defects on the nucleation and growth of CoSi2 precipitatesWitzmann, A. / Schippel, S. / Zentgraf, A. et al. | 1992
- 435
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Radiation damage in a CdF2 ionic crystal by a channeled proton beamRajchel, Boguslaw et al. | 1992
- 438
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Ion beam mixing of Cu/Ti bilayersRauschenbach, B. / Erfurth, W. / Linker, G. et al. | 1992
- 443
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Study of proton-bombardment-induced radiation damage in elemental and compound semiconductors by RBS channelingAscheron, C. / Biersack, J.P. / Fink, D. et al. | 1992
- 451
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The use of pulsed spallation neutrons in applied condensed matter researchFinney, J.L. et al. | 1992
- 459
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Muons as a probe in solid state and surface physics and in materials researchDaniel, H. et al. | 1992
- 468
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A continuous time-tagged positron beam and its application to materials researchWesolowski, P. / Maier, K. / Major, J. et al. | 1992
- 474
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Accelerator-driven transmutation technology for incinerating radioactive waste and for advanced application to power productionJameson, R.A. / Lawrence, G.P. / Bowman, C.D. et al. | 1992
- 481
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STIM tomography: a three-dimensional high resolution imaging toolBench, G. / Saint, A. / Cholewa, M. et al. | 1992
- 491
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L-shell ionization in Au/Ag foils by electron and positron impactSchneider, Hans / Tobehn, Ingo / Hippler, Rainer et al. | 1992
- 495
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Applied research and technology with accelerators state of the art, 1991Duggan, Jerome L. / Bethge, Klaus et al. | 1992
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Editorial Board| 1992
- vii
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Editorial| 1992