IEEE Design & Test of Computers
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 1
-
IEEE Design & Test of Computers publication information| 2012
- 2
-
Table of contents| 2012
- 3
-
Departments [Table of Contents]| 2012
- 4
-
Towards more digital content in wireless systems [From the EiC]Chakrabarty, Krishnendu et al. | 2012
- 5
-
Guest Editors' Introduction: Digitally Enhanced Wireless TransceiversStratigopoulos, Haralampos-G. / Valdes-Garcia, Alberto et al. | 2012
- 7
-
Digitally Intensive Wireless Transceivers (Invited Paper)Staszewski, R.B. et al. | 2012
- 7
-
Digitally intensive wireless transceiversStaszewski, R. B. et al. | 2012
- 19
-
Digitally intensive receiver design: opportunities and challengesNanda, R. / Markovic, D. et al. | 2012
- 27
-
Mixed-Signal SoCs With In Situ Self-Healing CircuitryMaxey, C. / Creech, G. / Raman, Sanjay et al. | 2012
- 40
-
Dual-Control Self-Healing Architecture for High-Performance Radio SoCsChien, C. / Tang, A. / Hsiao, F. et al. | 2012
- 52
-
Pioneering in Asia With the US Venture Capital ModelMarinissen, Erik Jan et al. | 2012
- 56
-
IEEE Xplore [advertisement]| 2012
- 57
-
Bringing up a chip on the cheapWachs, M. / Shacham, O. / Asgar, Z. et al. | 2012
- 66
-
Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault InjectionGil-Tomas, D. / Gracia-Moran, J. / Baraza-Calvo, J-C et al. | 2012
- 74
-
Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF CircuitsTing Zhu, / Steer, M. B. / Franzon, P. D. et al. | 2012
- 84
-
OpenDFM Bridging the Gap Between DRC and DFMBuurma, J. / Sayah, R. / Valente, F. et al. | 2012
- 91
-
Employing the STDF V4-2007 Standard for Scan Test Data LoggingSeuring, M. / Braun, M. / Ma, A. et al. | 2012
- 100
-
IEEE Advancing Technology [advertisement]| 2012
- 101
-
Predicting the future of information technology and society [The Road Ahead]Kahng, A. B. et al. | 2012
- 103
-
Discover more. IEEE Educational Activities [advertisement]| 2012
- 104
-
Multicore madness, many-core dreams [Book Reviews]| 2012
- 107
-
Can new uses for phaser data measurements prevent blackouts? [advertisement]| 2012
- 108
-
CEDA Currents| 2012
- 110
-
IEEE Was Here [advertisement]| 2012
- 111
-
Test Technology TC NewsletterTheocharides, Theo et al. | 2012
- C1
-
[Front cover]| 2012
- C2
-
IEEE Xplore Digital Library [advertisement]| 2012
- C3
-
[Back inside cover]| 2012
- C4
-
Technology insight on demand on IEEE.tv [Back cover - advertisement]| 2012