Active optical metrology: a definition with examples [3478-02] (Englisch)
- Neue Suche nach: Osten, W.
- Neue Suche nach: SPIE
- Neue Suche nach: Osten, W.
- Neue Suche nach: Pryputniewicz, R. J.
- Neue Suche nach: Brown, G. M.
- Neue Suche nach: Juptner, W. P. O.
- Neue Suche nach: SPIE
In:
Laser interferometry: applications
3478
;
11-25
;
1998
-
ISBN:
- Aufsatz (Konferenz) / Print
-
Titel:Active optical metrology: a definition with examples [3478-02]
-
Beteiligte:
-
Kongress:Conference; 9th, Laser interferometry: applications ; 1998 ; San Diego; CA
-
Erschienen in:Laser interferometry: applications , 3478 ; 11-25
-
Verlag:
- Neue Suche nach: SPIE
-
Erscheinungsdatum:01.01.1998
-
Format / Umfang:15 pages
-
ISBN:
-
Medientyp:Aufsatz (Konferenz)
-
Format:Print
-
Sprache:Englisch
-
Schlagwörter:
-
Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2
-
Intelligent approaches in image analysis (Invited Paper) [3478-01]Liedtke, C.-E. / SPIE et al. | 1998
- 2
-
Intelligent approaches in image analysisLiedtke, Claus E. et al. | 1998
- 2
-
Interferometric measurements of deviations from flatness: some new techniques (Invited Paper) [3479-01]Hariharan, P. / SPIE et al. | 1998
- 2
-
Interferometric measurements of deviations from flatness: some new techniquesHariharan, Parameswaran et al. | 1998
- 11
-
Active optical metrology: a definition with examples [3478-02]Osten, W. / SPIE et al. | 1998
- 11
-
Active optical metrology: a definition with examplesOsten, Wolfgang et al. | 1998
- 14
-
Adjustable coherence depth in a geometrically desensitized interferometerde Groot, Peter J. / Deck, Leslie L. / Colonna de Lega, Xavier et al. | 1998
- 14
-
Adjustable coherence depth in a geometrically desensitized interferometer [3479-02]De Groot, P. J. / Deck, L. L. / Colonna de Lega, X. / SPIE et al. | 1998
- 24
-
Surface topography by wavelength scanning interferometryYamaguchi, Ichirou / Yamamoto, Akihiro / Yano, Masaru et al. | 1998
- 24
-
Surface topography by wavelength scanning interferometry [3479-03]Yamaguchi, I. / Yamamoto, A. / Yano, M. / SPIE et al. | 1998
- 26
-
Regularization methods for processing fringe pattern imagesMarroquin Zaleta, Jose L. / Rivera, Mariano / Botello, Salvador / Rodriguez-Vera, Ramon / Servin Guirado, Manuel et al. | 1998
- 26
-
Regularization methods for processing fringe pattern images [3478-03]Marroquin, J. L. / Rivera, M. / Botello, S. / Rodriguez-Vera, R. / SPIE et al. | 1998
- 36
-
Wide-scale surface measurement using white light interferometry and atomic force microscopyRecknagel, Rolf-Juergen / Feigl, Torsten / Duparre, Angela / Notni, Gunther et al. | 1998
- 36
-
Wide-scale surface measurement using white light interferometry and atomic force microscopy [3479-04]Recknagel, R.-J. / Feigl, T. / Duparre, A. / Notni, G. / SPIE et al. | 1998
- 37
-
Sinusoidal wavelength-scanning interferometersSasaki, Osami / Tsuji, Kenichiro / Sato, Shouichi / Kuwahara, Tomokazu / Suzuki, Takamasa et al. | 1998
- 37
-
Sinusoidal wavelength-scanning interferometers [3478-04]Sasaki, O. / Tsuji, K. / Sato, S. / Kuwahara, T. / SPIE et al. | 1998
- 43
-
Stitching: high-spatial-resolution microsurface measurements over large areasTang, Shouhong et al. | 1998
- 43
-
Stitching: high-spatial-resolution microsurface measurements over large areas [3479-05]Tang, S. / SPIE et al. | 1998
- 45
-
Principles of digital holographic interferometryKreis, Thomas M. / Jueptner, Werner P. O. / Geldmacher, Juergen et al. | 1998
- 45
-
Principles of digital holographic interferometry [3478-05]Kreis, T. M. / Jueptner, W. P. O. / Geldmacher, J. / SPIE et al. | 1998
- 50
-
Development of the nitride film thickness standard (NFTS) [3479-34]Durgapal, P. / SPIE et al. | 1998
- 50
-
Development of the nitride film thickness standard (NFTS)Durga Pal, Prabha et al. | 1998
- 56
-
Direct group-delay measurement and 3D profilometry using a white-light interferometer [3478-06]Liang, Y. / Wu, Q. M. J. / Grover, C. P. / SPIE et al. | 1998
- 56
-
Direct group-delay measurement and 3D profilometry using a white-light interferometerLiang, Yi / Wu, Q. M. Jonathan / Grover, Chander P. et al. | 1998
- 62
-
Subnanometer laser metrology for spacecraft interferometryLeitch, James W. / Kopp, Greg A. / Noecker, Charley et al. | 1998
- 62
-
Subnanometer laser metrology for spacecraft interferometry [3479-08]Leitch, J. W. / Kopp, G. A. / Noecker, C. / SPIE et al. | 1998
- 68
-
High-speed 3D shape measurement using a nonscanning multiple-beam confocal imaging systemIshihara, Mitsuhiro / Sasaki, Hiromi et al. | 1998
- 68
-
High-speed 3D shape measurement using a nonscanning multiple-beam confocal imaging system [3478-07]Ishihara, M. / Sasaki, H. / SPIE et al. | 1998
- 70
-
CAD/CAM/CAE representation of 3D objects measured by fringe projection [3479-09]Pancewicz, T. / Kujawinska, M. / SPIE et al. | 1998
- 70
-
CAD/CAM/CAE representation of 3D objects measured by fringe projectionPancewicz, Tomasz / Kujawinska, Malgorzata et al. | 1998
- 76
-
Analysis of some intrinsic limitations of a laser range finder using self-mixing interferenceServagent, Noel / Mourat, Gregory / Gouaux, Flore / Bosch, Thierry M. et al. | 1998
- 76
-
Three-dimensional shape measurement using fiber optic low-coherence speckle interferometry [3478-08]Balboa, I. / Tatam, R. P. / SPIE et al. | 1998
- 76
-
Analysis of some intrinsic limitations of a laser range finder using self-mixing interference [3479-10]Servagent, N. / Mourat, G. / Gouaux, F. / Bosch, T. M. / SPIE et al. | 1998
- 76
-
Three-dimensional shape measurement using fiber optic low-coherence speckle interferometryBalboa, Itziar / Tatam, Ralph P. et al. | 1998
- 84
-
Fringe locking in a laser diode interferometer by optical feedbackLiu, Jiyuan / Yamaguchi, Ichirou et al. | 1998
- 84
-
Fringe locking in a laser diode interferometer by optical feedback [3479-11]Liu, J. / Yamaguchi, I. / SPIE et al. | 1998
- 86
-
Electro-optic holography method for determination of surface shape and deformation [3478-53]Furlong, C. / Pryputniewicz, R. J. / SPIE et al. | 1998
- 86
-
Electro-optic holography method for determination of surface shape and deformationFurlong, Cosme / Pryputniewicz, Ryszard J. et al. | 1998
- 94
-
Development of a combined optical and x-ray interferometer (COXI) system for nanometrologyYim, Noh B. / Kim, Min Seok / Eom, Cheon I. et al. | 1998
- 94
-
Development of a combined optical and x-ray interferometer (COXI) system for nanometrology [3479-12]Yim, N. B. / Kim, M. S. / Eom, C. I. / SPIE et al. | 1998
- 98
-
Self-mixing interference inside a laser diode: application for displacement, velocity, and distance measurementBosch, Thierry M. / Servagent, Noel / Gouaux, Flore / Mourat, Gregory et al. | 1998
- 98
-
Self-mixing interference inside a laser diode: application for displacement, velocity, and distance measurement [3478-09]Bosch, T. M. / Servagent, N. / Gouaux, F. / Mourat, G. / SPIE et al. | 1998
- 104
-
Measuring shape and deformation of small objects using digital holography [3479-13]Seebacher, S. / Osten, W. / Jueptner, W. P. O. / SPIE et al. | 1998
- 104
-
Measuring shape and deformation of small objects using digital holographySeebacher, Soenke / Osten, Wolfgang / Jueptner, Werner P. O. et al. | 1998
- 110
-
Phase determination algorithms compensating for spatially nonuniform phase modulation in phase-shifting interferometry [3478-10]Hibino, K. / Yamauchi, M. / SPIE et al. | 1998
- 110
-
Phase determination algorithms compensating for spatially nonuniform phase modulation in phase-shifting interferometryHibino, Kenichi / Yamauchi, Makoto et al. | 1998
- 116
-
Phase correction for coated-pole-tip recession measurementHan, Sen et al. | 1998
- 116
-
Phase correction for coated-pole-tip recession measurement [3479-14]Han, S. / SPIE et al. | 1998
- 121
-
New error-compensating seven-sample phase-shifting algorithm and application in 3D fringe projection profilometryZhang, Hong / Lalor, Michael J. / Burton, David R. et al. | 1998
- 121
-
New error-compensating seven-sample phase-shifting algorithm and application in 3D fringe projection profilometry [3478-11]Zhang, H. / Lalor, M. J. / Burton, D. R. / SPIE et al. | 1998
- 122
-
Characterization of an optical subsystem for 2-μm coherent lidarsLi, Ye / Blackwell, Timothy S. / Geary, Joseph M. / Amzajerdian, Farzin / Spiers, Gary D. / Peters, Bruce R. / Chambers, Diana et al. | 1998
- 122
-
Characterization of an optical subsystem for 2-m coherent lidars [3479-15]Li, Y. / Blackwell, T. S. / Geary, J. M. / Amzajerdian, F. / SPIE et al. | 1998
- 130
-
Frequency-shifting shadow moire technique [3479-16]Wang, Z. / Tan, Y. / Zhao, H. / Chen, W. / SPIE et al. | 1998
- 130
-
Frequency-shifting shadow moire techniqueWang, Zhao / Tan, Yushan / Zhao, Hong / Chen, Wenyi et al. | 1998
- 133
-
New approaches for phase determination [3478-12]Thesing, J. / SPIE et al. | 1998
- 133
-
New approaches for phase determinationThesing, Jan et al. | 1998
- 140
-
Mechanical properties of microsystem componentsMichel, Bernd / Vogel, Dietmar / Grosser, Volker et al. | 1998
- 140
-
Mechanical properties of microsystem components (Invited Paper) [3479-17]Michel, B. / Vogel, D. / Grosser, V. / SPIE et al. | 1998
- 142
-
New robust algorithms for a phase-stepping technique [3478-13]Kosinski, C. / SPIE et al. | 1998
- 142
-
New robust algorithms for ap hase-stepping techniqueKosinski, Cezary et al. | 1998
- 152
-
3D microscopy with phase-shifting digital holography [3479-19]Zhang, T. / Yamaguchi, I. / SPIE et al. | 1998
- 152
-
3D microscopy with phase-shifting digital holographyZhang, Tong / Yamaguchi, Ichirou et al. | 1998
- 153
-
Single phase-step algorithm for phase difference measurement using ESPISesselmann, Meinhard / Albertazzi, Armando et al. | 1998
- 153
-
Single phase-step algorithm for phase difference measurement using ESPI [3478-14]Sesselmann, M. / Albertazzi Goncalves, A. / SPIE et al. | 1998
- 160
-
Measurement of birefringence of textile fibers based on the analysis of the interference pattern in the backfocal plane of the microscope objective [3479-18]Litwin, D. / Sadik, A. M. / SPIE et al. | 1998
- 160
-
Measurement of birefringence of textile fibers based on the analysis of the interference pattern in the backfocal plane of the microscope objectiveLitwin, Dariusz / Sadik, Adel M. et al. | 1998
- 162
-
Two-dimensional phase unwrapping by direct elimination of rotational vector fields from phase gradients obtained by heterodyne techniques [3478-15]Aoki, T. / Sotomaru, T. / Miyamoto, Y. / Takeda, M. / SPIE et al. | 1998
- 162
-
Two-dimensional phase unwrapping by direct elimination of rotational vector fields from phase gradients obtained by heterodyne techniquesAoki, Takahiro / Sotomaru, Toshihiro / Miyamoto, Yoko / Takeda, Mitsuo et al. | 1998
- 170
-
Unwrapping of digital speckle pattern interferometry phase maps using a minimum L0-norm algorithmKaufmann, Guillermo H. / Ruiz, Pablo D. / Galizzi, Gustavo E. et al. | 1998
- 170
-
Unwrapping of digital speckle pattern interferometry phase maps using a minimum L^0-norm algorithm [3478-16]Kaufmann, G. H. / Ruiz, P. D. / Galizzi, G. E. / SPIE et al. | 1998
- 172
-
Laser and Mach-Zehnder interferometry for in-situ monitoring of crystal growth and concentration variationKim, Yong-Kee / Reddy, B. R. / Lal, Ravindra B. et al. | 1998
- 172
-
Laser and Mach-Zehnder interferometry for in-situ monitoring of crystal growth and concentration variation [3479-21]Kim, Y. / Reddy, B. R. / Lal, R. B. / SPIE et al. | 1998
- 181
-
Feature extraction from interferograms for phase distribution analysis [3478-17]Merz, T. / Paulus, D. W. / Niemann, H. / SPIE et al. | 1998
- 181
-
Interferometric optical time-domain reflectometry for distributed optical fiber sensing [3479-22]Shatalin, S. V. / Treschikov, V. N. / Rogers, A. J. / SPIE et al. | 1998
- 181
-
Interferometric optical time-domain reflectometry for distributed optical fiber sensingShatalin, Sergey V. / Treschikov, Vladimir N. / Rogers, Alan J. et al. | 1998
- 181
-
Feature extraction from interferograms for phase distribution analysisMerz, Torsten / Paulus, Dietrich W. / Niemann, Heinrich et al. | 1998
- 192
-
Fringe processing in nonregular domains by boundary-fitted image mappingAlbertazzi, Armando et al. | 1998
- 192
-
Impact detection in carbon fiber reinforced polymer composites using in-fiber Bragg gratings [3479-23]O'Dwyer, M. J. / Dykes, N. D. / James, S. W. / Tatam, R. P. / SPIE et al. | 1998
- 192
-
Impact detection in carbon fiber reinforced polymer composites using in-fiber Bragg gratingsO'Dwyer, Martin J. / Dykes, N. D. / James, Stephen W. / Tatam, Ralph P. / Irving, P. E. et al. | 1998
- 192
-
Fringe processing in nonregular domains by boundary-fitted image mapping [3478-18]Albertazzi Goncalves, A. / SPIE et al. | 1998
- 200
-
In-situ internal strain development and cure monitoring in a curing composite using in-fiber Bragg gratings and dielectric sensors [3479-43]O'Dwyer, M. J. / Maistros, G. M. / James, S. W. / Tatam, R. P. / SPIE et al. | 1998
- 200
-
In-situ internal strain development and cure monitoring in a curing composite using in-fiber Bragg gratings and dielectric sensorsO'Dwyer, Martin J. / Maistros, G. M. / James, Stephen W. / Tatam, Ralph P. / Partridge, I. K. et al. | 1998
- 202
-
Interferometry with VUV wavelengths [3478-19]Emer, W. / Schwider, J. / SPIE et al. | 1998
- 202
-
Interferometry with VUV wavelengthsEmer, Wolfgang / Schwider, Johannes et al. | 1998
- 207
-
Optical coherence tomography in scattering media using a continuous-wave tunable laser diode [3479-24]Yoshimura, T. / Hiratsuka, H. / Kido, E. / Yamada, K. / SPIE et al. | 1998
- 207
-
Optical coherence tomography in scattering media using a continuous-wave tunable laser diodeYoshimura, Takeaki / Hiratsuka, Hajime / Kido, Eiji / Yamada, Keiichi et al. | 1998
- 214
-
Precise measurement of nonoptical surfaces by an oblique incidence interferometer [3478-20]Otani, Y. / Kuwahara, T. / Yamamoto, M. / Yoshizawa, T. / SPIE et al. | 1998
- 214
-
Precise measurement of nonoptical surfaces by an oblique incidence interferometerOtani, Yukitoshi / Kuwahara, Toyoaki / Yamamoto, Masayuki / Yoshizawa, Toru et al. | 1998
- 216
-
Transient strain monitoring on a gun barrel using optical fiber Bragg grating sensors [3479-25]James, S. W. / Fuller, S. R. / Crompton, C. / Tatam, R. P. / SPIE et al. | 1998
- 216
-
Transient strain monitoring on a gun barrel using optical fiber Bragg grating sensorsJames, Stephen W. / Fuller, Steven R. / Crompton, Colin / Tatam, Ralph P. et al. | 1998
- 218
-
Dual-hologram shearing interference technique with regulated sensitivity [3478-21]Toker, G. R. / Levin, D. / SPIE et al. | 1998
- 218
-
Dual-hologram shearing interference technique with regulated sensitivityToker, Gregory R. / Levin, Daniel et al. | 1998
- 222
-
Large-amplitude point vibration measurement with optical fiber moire-based technique [3479-41]Valera, J. D. R. / Sinha, P. G. / Yoshino, T. T. / Loekberg, O. J. / SPIE et al. | 1998
- 222
-
Large-amplitude point vibration measurement with optical fiber moire-based techniqueValera, Jesus D. R. / Sinha, Pranay G. / Yoshino, Toshihiko T. / Lokberg, Ole J. et al. | 1998
- 227
-
Interferometric analysis of stress-induced birefringence in a rotating glass disk [3478-22]De Groot, P. J. / Dergevorkian, A. / Erickson, T. / SPIE et al. | 1998
- 227
-
Interferometric analysis of stress-induced birefringence in a rotating glass diskde Groot, Peter J. / Dergevorkian, Ara / Erickson, Tod et al. | 1998
- 228
-
Automatic flaw detection using recognition by synthesis: practical resultsElandaloussi, Frank / Jueptner, Werner P. O. / Osten, Wolfgang et al. | 1998
- 228
-
Automatic flaw detection using recognition by synthesis: practical results [3479-26]Elandaloussi, F. / Jueptner, W. P. O. / Osten, W. / SPIE et al. | 1998
- 234
-
Analyses of light diffracted on rough surfaces to measure in-plane displacements using a heterodyne interferometerTkaczyk, Tomasz S. et al. | 1998
- 234
-
Analyses of light diffracted on rough surfaces to measure in-plane displacements using a heterodyne interferometer [3478-23]Tkaczyk, T. / SPIE et al. | 1998
- 235
-
Digital shearography for strain measurement: an analysis of measuring errors [3479-07]Steinchen, W. / Yang, L. / Maeckel, G. / Maeckel, P. / SPIE et al. | 1998
- 235
-
Digital shearography for strain measurement: an analysis of measuring errorsSteinchen, Wolfgang / Yang, Lian Xiang / Maeckel, Gerhard / Maeckel, Peter / Voessing, Frank et al. | 1998
- 245
-
Improved method for measuring refractive index of a medium [3478-24]Su, D.-C. / Lee, J.-Y. / SPIE et al. | 1998
- 245
-
Improved method for measuring refractive index of a mediumSu, Der-Chin / Lee, JuYi et al. | 1998
- 247
-
Autoanalysis system for stroboscopic holographic interferometryWang, Xiwen / Kang, Ming et al. | 1998
- 247
-
Autoanalysis system for stroboscopic holographic interferometry [3479-29]Wang, X. / Kang, M. / SPIE et al. | 1998
- 252
-
Extension of electronic speckle correlation interferometry to large deformationsSciammarella, Cesar A. / Sciammarella, Federico M. et al. | 1998
- 252
-
Extension of electronic speckle correlation interferometry to large deformations [3479-30]Sciammarella, C. A. / Sciammarella, F. M. / SPIE et al. | 1998
- 254
-
Synthesis of the optical coherence function and its applications in photonic sensingHotate, Kazuo / He, Zuyuan / Saida, Takashi et al. | 1998
- 254
-
Synthesis of the optical coherence function and its applications in photonic sensing (Invited Paper) [3478-25]Hotate, K. / He, Z. / Saida, T. / SPIE et al. | 1998
- 264
-
Simulation and experiment on the thermal deformation of composite tubesHolstein, Daniel / Aswendt, Petra / Hoefling, Roland / Schmidt, Claus-Dieter / Jueptner, Werner P. O. et al. | 1998
- 264
-
Simulation and experiment on the thermal deformation of composite tubes [3479-31]Holstein, D. / Aswendt, P. / Hoefling, R. / Schmidt, C.-D. / SPIE et al. | 1998
- 266
-
Pseudoheterodyne signal processing scheme for interrogation of fiber Bragg grating sensor arraysChatterjea, Clare K. / James, Stephen W. / Tatam, Ralph P. et al. | 1998
- 266
-
Pseudoheterodyne signal processing scheme for interrogation of fiber Bragg grating sensor arrays [3478-26]Chatterjea, C. K. / James, S. W. / Tatam, R. P. / SPIE et al. | 1998
- 274
-
Measurement of thermal deformation of an engine piston using a conical mirror and ESPI [3479-32]Albertazzi Goncalves, A. / Melao, I. / Devece, E. / SPIE et al. | 1998
- 274
-
Measurement of thermal deformation of an engine piston using a conical mirror and ESPIAlbertazzi, Armando / Melao, Iza / Devece, Eugenio et al. | 1998
- 275
-
Heterodyne interferometer with frequency-modulated laser diodes for in- and out-of-plane measurements of vibrations [3478-27]Drabarek, P. / Van Keulen, M. / Steinlechner, S. / SPIE et al. | 1998
- 275
-
Heterodyne interferometer with frequency-modulated laser diode for in- and out-of-plane measurements of vibrationsDrabarek, Pawel / van Keulen, Michael / Steinlechner, Siegbert et al. | 1998
- 283
-
Miniature fiber optic pressure sensors for turbomachinery applicationsMacPherson, William N. / Kilpatrick, James M. / Barton, James S. / Jones, Julian D. C. et al. | 1998
- 283
-
Miniature fiber optic pressure sensors for turbomachinery applications [3478-28]MacPherson, W. N. / Kilpatrick, J. M. / Barton, J. S. / Jones, J. D. C. / SPIE et al. | 1998
- 284
-
Application of fiber optic gyroscope for quality research of angular rotation in slow-speed platforms [3479-33]Jaroszewicz, L. R. / Szelmanowski, A. / SPIE et al. | 1998
- 284
-
Application of fiber optic gyroscope for quality research of angular rotation in slow-speed platformsJaroszewicz, Leszek R. / Szelmanowski, Andrzej et al. | 1998
- 294
-
Investigation of laser welds by means of digital speckle photography [3478-29]Holstein, D. / Hartmann, H.-J. / Jueptner, W. P. O. / SPIE et al. | 1998
- 294
-
Investigation of laser welds by means of digital speckle photographyHolstein, Daniel / Hartmann, Hans-Juergen / Jueptner, Werner P. O. et al. | 1998
- 294
-
Dual-hologram shearing interferometry with regulated sensitivity [3479-28]Toker, G. R. / Levin, D. / SPIE et al. | 1998
- 294
-
Dual-hologram shearing interferometry with regulated sensitivityToker, Gregory R. / Levin, Daniel et al. | 1998
- 302
-
Speckle interferometry in situ: a feasibility study [3478-30]Facchini, M. / SPIE et al. | 1998
- 302
-
Speckle interferometry in situ: a feasibility studyFacchini, Massimo et al. | 1998
- 304
-
Improved technique for measurement of a long radius of curvature by a digital moire methodZhang, Hong / Lalor, Michael J. / Burton, David R. et al. | 1998
- 304
-
Improved technique for measurement of a long radius of curvature by a digital moire method [3479-35]Zhang, H. / Lalor, M. J. / Burton, D. R. / SPIE et al. | 1998
- 311
-
Using a laser vibrometer for monitoring dynamic strain, modal analysis, and calculating damping [3479-36]Camden, M. P. / Simmons, L. W. / SPIE et al. | 1998
- 311
-
Using a laser vibrometer for monitoring dynamic strain, modal analysis, and calculating dampingCamden, Michael P. / Simmons, Larry W. et al. | 1998
- 314
-
Real-time two-color laser speckle-shift strain measurement systemTuma, Meg L. / Greer, Lawrence C. / Krasowski, Michael J. / Oberle, Lawrence G. / Elam, Kristie A. / Spina, Daniel C. et al. | 1998
- 314
-
Real-time two-color laser speckle-shift strain measurement system [3478-31]Tuma, M. L. / Greer, L. C. / Krasowski, M. J. / Oberle, L. G. / SPIE et al. | 1998
- 319
-
Laser-tracking interferometer system based on trilateration and a restriction on the position of its laser trackersTakatsuji, Toshiyuki / Koseki, Yoshihiko / Goto, Mitsuo / Kurosawa, Tomizo / Tanimura, Yoshihisa et al. | 1998
- 319
-
Laser-tracking interferometer system based on trilateration and a restriction on the position of its laser trackers [3479-37]Takatsuji, T. / Koseki, Y. / Goto, M. / Kurosawa, T. / SPIE et al. | 1998
- 322
-
Quantitative three-dimensional measurements of vibration amplitudes and phases as a function of frequency by digital speckle pattern interferometry [3478-32]De Veuster, C. / Renotte, Y. L. / Berwart, L. / Lion, Y. F. / SPIE et al. | 1998
- 322
-
Quantitative three-dimensional measurements of vibration amplitudes and phases as a function of frequency by digital speckle pattern interferometryDe Veuster, Christophe / Renotte, Yvon L. M. / Berwart, Leon / Lion, Yves F. et al. | 1998
- 327
-
Measurement of the electrical resistance of aluminum samples by holographic interferometryHabib, Khaled J. et al. | 1998
- 327
-
Measurement of the electrical resistance of aluminum samples by holographic interferometry [3479-38]Habib, K. J. / SPIE et al. | 1998
- 334
-
New simultaneous initialization and online phase calculation in ESPI displacement measurementFriebe, Harald et al. | 1998
- 334
-
New simultaneous initialization and online phase calculation in ESPI displacement measurement [3478-33]Friebe, H. / SPIE et al. | 1998
- 339
-
Tunable laser diode for absolute distance measurement [3479-40]Hafidi, A. / Pfeiffer, P. / Meyrueis, P. / SPIE et al. | 1998
- 339
-
Tunable laser diode for absolute distance measurementHafidi, Abdeslam / Pfeiffer, Pierre / Meyrueis, Patrick et al. | 1998
- 344
-
Developmental steps for double-pulse shearography [3478-34]Steinchen, W. / Yang, L. / Kupfer, G. / Maeckel, P. / SPIE et al. | 1998
- 344
-
Developmental steps for double-pulse shearographySteinchen, Wolfgang / Yang, Lian Xiang / Kupfer, Gerhard / Maeckel, Peter / Voessing, Frank et al. | 1998
- 345
-
Theory of speckle displacement and decorrelation: application in mechanics [3479-42]Hrabovsky, M. / SPIE et al. | 1998
- 345
-
Theory of speckle displacement and decorrelation: application in mechanicsHrabovsky, Miroslav et al. | 1998
- 352
-
Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis [3478-35]Fernandez, A. / Doval, A. F. / Davila, A. / Blanco-Garcia, J. / SPIE et al. | 1998
- 352
-
Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysisFernandez, J. L. / Fernandez, Antonio / Doval, Angel F. / Davila, Abundio / Blanco-Garcia, Jesus / Perez-Lopez, Carlos et al. | 1998
- 359
-
Local measurements of high-gradient in-plane displacement/strain fields by automated grating interferometryKujawinska, Malgorzata / Salbut, Leszek A. / Sitnik, Robert et al. | 1998
- 359
-
Local measurements of high-gradient in-plane displacement/strain fields by automated grating interferometry [3476-36]Kujawinska, M. / Salbut, L. A. / Sitnik, R. / SPIE et al. | 1998
- 366
-
Displacement measurement for vibration with large amplitude using moire topography [3478-37]Arai, Y. / Yokozeki, S. / SPIE et al. | 1998
- 366
-
Displacement measurement for vibration with large amplitude using moire topographyArai, Yasuhiko / Yokozeki, Shunsuke et al. | 1998
- 376
-
New methods to stabilize frequency and power of a two-longitudinal-mode He-Ne laser in two-mode laser interferometers [3478-39]Yin, J. / Noh, H.-R. / Jhe, W. / Zhu, Y. / SPIE et al. | 1998
- 376
-
New methods to stabilize frequency and power of a two-longitudinal-mode He-Ne laser in two-mode laser interferometersYin, Jianping / Noh, Heung-Ruoul / Jhe, Wonho / Zhu, Yifu / Wang, Yiqiu et al. | 1998
- 385
-
Polarization fading elimination of interferometric fiber optic arrays by input polarization control [3478-40]Zhou, X. / Tang, W. / Zhou, W. / SPIE et al. | 1998
- 385
-
Polarization fading elimination of interferometric fiber optic arrays by input polarization controlZhou, Xiaodong / Tang, Weizhong / Zhou, Wen et al. | 1998
- 393
-
Fourier transform moire deflectometry [3478-42]Wang, M. / Li, D. / Zhong, J. / Chen, W. / SPIE et al. | 1998
- 393
-
Fourier transform moire deflectometryWang, Ming / Li, Dacheng / Zhong, Jingang / Chen, Weimin et al. | 1998
- 405
-
Phase measurement algorithm without phase-unwrapping problem for phase-stepping interferometryWei, Chunlong / Chen, Mingyi / Hou, Weidong / Wang, Zhijiang et al. | 1998
- 405
-
Phase measurement algorithm without phase-unwrapping problem for phase-stepping interferometry [3478-44]Wei, C. / Chen, M. / Hou, W. / Wang, Z. / SPIE et al. | 1998
- 411
-
General phase-stepping algorithm using a Lissajous figure technique [3478-45]Wei, C. / Chen, M. / Guo, H. / Wang, Z. / SPIE et al. | 1998
- 411
-
General phase-stepping algorithm using a Lissajous figure techniqueWei, Chunlong / Chen, Mingyi / Guo, Hongwei / Wang, Zhijiang et al. | 1998
- 417
-
Versatile electronic speckle pattern interferometry [3478-47]Sirohi, R. S. / SPIE et al. | 1998
- 417
-
Versatile electronic speckle pattern interferometrySirohi, Rajpal S. et al. | 1998
- 421
-
Polarization interferometry in fiber optic smart structures [3478-49]Wolinski, T. R. / Konopka, W. / Domanski, A. W. / SPIE et al. | 1998
- 421
-
Polarization interferometry in fiber optic smart structuresWolinski, Tomasz R. / Konopka, Witold / Domanski, Andrzej W. et al. | 1998
- 427
-
3D object model construction from multiple range viewsLi, Yongho / Strand, Jarle / Jain, Anil K. / Mercer, Carolyn R. et al. | 1998
- 427
-
3D object model construction from multiple range views [3478-51]Li, Y. H. / Strand, J. / Jain, A. K. / Mercer, C. R. / SPIE et al. | 1998
- 436
-
Coherent light-beating scattering (CLBS) as a new interference technique for size and velocity control [3478-52]Sukhodolsky, A. T. / Sukhodolsky, P. A. / SPIE et al. | 1998
- 436
-
Coherent light-beating scattering (CLBS) as a new interference technique for size and velocity controlSukhodolsky, Anatoly T. / Sukhodolsky, P. A. et al. | 1998
- 444
-
Flatness measurement by a UV moire technique [3478-54]Fujiwara, H. / Kodera, Y. / Otani, Y. / Yoshizawa, T. / SPIE et al. | 1998
- 444
-
Flatness measurement by a UV moire techniqueFujiwara, Hisatoshi / Kodera, Yutaka / Otani, Yukitoshi / Yoshizawa, Toru et al. | 1998
- 448
-
New ellipsometric configuration based on a Zeeman laser for fast measurements [3478-55]Singher, L. / Boim, L. / Toker, G. R. / SPIE et al. | 1998
- 448
-
New ellipsometric configuration based on a Zeeman laser for fast measurementsSingher, Liviu / Boim, Leonid / Toker, Gregory R. et al. | 1998
- 454
-
Liquid-core fiber for temperature sensing [3478-56]Wang, Y. / Li, Z. / Zhang, Z. / Zhong, X. / SPIE et al. | 1998
- 454
-
Liquid-core fiber for temperature sensingWang, Yiding / Li, ZuoWei / Zhang, ZhiGuo / Zhong, XianWei / Hu, ZhiYoung / Li, Yu-Dong / Liu, Shiyong et al. | 1998
- 457
-
Vortex flowmeter with polarimetric sensing [3478-57]Roszko, M. / Domanski, A. W. / Sierakowski, M. W. / Swillo, M. / SPIE et al. | 1998
- 457
-
Vortex flowmeter with polarimetric sensingRoszko, Marcin / Domanski, Andrzej W. / Sierakowski, Marek W. / Swillo, Marcin et al. | 1998