New sensor for triangulation measurement of AGV attitude and position [4420-05] (Englisch)
- Neue Suche nach: De Cecco, M.
- Neue Suche nach: Society for Optical Engineering
- Neue Suche nach: IMEKO - The International Measurement Confederation
- Neue Suche nach: Metrologia - The Brazilian Society of Metrology
- Neue Suche nach: De Cecco, M.
- Neue Suche nach: Albertazzi, A.
- Neue Suche nach: Society for Optical Engineering
- Neue Suche nach: IMEKO - The International Measurement Confederation
- Neue Suche nach: Metrologia - The Brazilian Society of Metrology
In:
Laser metrology for precision measurement and inspection in industry
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42-50
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2001
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:New sensor for triangulation measurement of AGV attitude and position [4420-05]
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Beteiligte:
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Kongress:Technical conference, Laser metrology for precision measurement and inspection in industry ; 1999 ; Florianopolis, Brazil
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Erschienen in:
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:01.01.2001
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Format / Umfang:9 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Sources of error in absolute distance interferometry [4420-01]Stone, J. A. / Stejskal, A. / Howard, L. P. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 1
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Sources of error in absolute distance interferometryStone, Jack A. / Stejskal, A. / Howard, Lowell P. et al. | 2001
- 10
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High-precision measurement of cylinder form deviations with grazing incidence interferometryWeckenmann, Albert / Kersting, Thomas / Schimke, Wilfried et al. | 2001
- 10
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High-precision measurement of cylinder form deviations with grazing incidence interferometry [4420-02]Weckenmann, A. / Kersting, T. / Schimke, W. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 20
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Interferometric length and roughness measurements with nanometer accuracy level [4420-03]Titov, A. / Malinovsky, I. / Belaidi, H. / Franca, R. S. / Massone, C. A. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 20
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Interferometric length and roughness measurements with nanometer accuracy levelTitov, Alexandre / Malinovsky, Igor / Belaidi, H. / Franca, R. S. / Massone, C. A. et al. | 2001
- 32
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Unique criterion to estimate the performances of some laser diode range finders [4420-04]Journet, B. / Bazin, G. / Durieu, C. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 32
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Unique criterion to estimate the performances of some laser diode range findersJournet, Bernard A. / Bazin, Gaelle / Durieu, Cecile et al. | 2001
- 42
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New sensor for triangulation measurement of AGV attitude and positionDe Cecco, Mariolino et al. | 2001
- 42
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New sensor for triangulation measurement of AGV attitude and position [4420-05]De Cecco, M. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 51
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Material testing of laser welds and claddings using digital speckle photography [4420-06]Holstein, D. / Juptner, W. P. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 51
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Material testing of laser welds and claddings using digital speckle photographyHolstein, Daniel / Jueptner, Werner P. O. et al. | 2001
- 59
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Interferometric method for in-situ characterization of coating industrial processes [4420-07]Michels, A. F. / Horowitz, F. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 59
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Interferometric method for in-situ characterization of coating industrial processesMichels, Alexandre F. / Horowitz, Flavio et al. | 2001
- 70
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Comparison between laser interferometric and calibrated artifacts for the geometric test of machine tools [4420-08]Sousa, A. R. / Schneider, C. A. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 70
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Comparison between laser interferometric and calibrated artifacts for the geometric test of machine toolsSousa, Andre R. / Schneider, Carlos A. et al. | 2001
- 79
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User's guide to IR detectorsBoreman, Glenn D. et al. | 2001
- 79
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User's guide to IR detectors [4420-09]Boreman, G. D. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 91
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New generation of lasermikeJablonski, Ryszard / Fotowicz, Pawel et al. | 2001
- 91
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New generation of lasermike [4420-10]Jablonski, R. / Fotowicz, P. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 99
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New strategic challenges for instrumentation in precision laser metrology for industryChour, Matthias / Mueller, Jochen / Hofmann, Dietrich et al. | 2001
- 99
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New strategic challenges for instrumentation in precision laser metrology for industry [4420-11]Chour, M. / Muller, J. / Hofmann, D. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 107
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Application of endoscopic ESPI in NDIHack, Erwin K. et al. | 2001
- 107
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Application of endoscopic ESPI in NDI [4420-12]Hack, E. K. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 112
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Portable residual stresses measurement device using ESPI and a radial in-plane interferometerAlbertazzi, Armando / Kanda, Cesar / Borges, Maikon R. / Hrebabetzky, Frank et al. | 2001
- 112
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Portable residual stress measurement device using ESPI and a radial in-plane interferometer [4420-13]Albertazzi, A. / Kanda, C. / Borges, M. R. / Hrebabetzky, F. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 123
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Comparison of strain/stress measurements on free form surfaces using ESPI and strain gauge technique [4420-14]de Lemos, J. / Mischo, H. K. / Pfeifer, T. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 123
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Comparison of strain/stress measurements on free form surfaces using ESPI and strain gauge techniquede Lemos, Juliano / Mischo, Horst K. / Pfeifer, Tilo et al. | 2001
- 132
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Multipulsed digital holography applied to full 3D measurements of dynamic eventsMendoza Santoyo, Fernando / Pedrini, Giancarlo / Schedin, Staffan / Tiziani, Hans J. et al. | 2001
- 132
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Multipulsed digital holography applied to full 3D measurements of dynamic events [4420-15]Santoyo, F. M. / Pedrini, G. / Schedin, S. / Tiziani, H. J. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 139
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Recent developments in double-pulsed video speckle interferometry and its application to the measurement of high-speed transient deformations [4420-16]Kaufmann, G. H. / Ruiz, P. D. / Galizzi, G. E. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 139
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Recent developments in double-pulsed video speckle interferometry and its application to the measurement of high-speed transient deformationsKaufmann, Guillermo H. / Ruiz, Pablo D. / Galizzi, Gustavo E. et al. | 2001
- 149
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Robust spatial phase-stepping ESPI systemSesselmann, Meinhard / Albertazzi, Armando et al. | 2001
- 149
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Robust spatial phase-stepping ESPI system [4420-17]Sesselmann, M. / Albertazzi, A. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 155
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Camera-based active phase stabilization for electronic holography [4420-18]Hrebabetzky, F. / Albertazzi, A. / Veiga, C. L. N. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 155
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Camera-based active phase stabilization for electronic holographyHrebabetzky, Frank / Albertazzi, Armando / Veiga, Celso L. N. et al. | 2001
- 162
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Spatial phase-stepping using a computer-generated diffractive optical element [4420-19]Rodriguez-Vera, R. / Barrientos, B. / Moore, A. J. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 162
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Spatial phase-stepping using a computer-generated diffractive optical elementRodriguez-Vera, Ramon / Barrientos, Bernardino / Moore, Andrew J. et al. | 2001
- 174
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Noninvasive microtomographic inspection of rough surfaces by active triangulation [4420-20]Costa, M. F. M. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 174
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Noninvasive microtomographic inspection of rough surfaces by active triangulationCosta, Manuel F. M. et al. | 2001
- 185
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Traceable measurement results from scanning probe microscopes by laser interferometry [4420-21]Hasche, K. / Herrmann, K. / Seemann, R. / Buchner, H. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001
- 185
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Traceable measurement results from scanning probe microscopes by laser interferometryHasche, K. / Herrmann, Konrad / Seemann, R. / Buechner, Hans-Joachim et al. | 2001
- 193
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Laser-based measurement to nanometer scale accuracyJaeger, Gerd et al. | 2001
- 193
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Laser-based measurement to nanometer scale accuracy [4420-22]Jager, G. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology et al. | 2001