Nanofabrication of Materials with a Scanning Tunneling Microscope (Englisch)
- Neue Suche nach: Kondo, S.
- Neue Suche nach: Heike, S.
- Neue Suche nach: Lutwyche, M.
- Neue Suche nach: Wada, Y.
- Neue Suche nach: Materials Research Society
- Neue Suche nach: Kondo, S.
- Neue Suche nach: Heike, S.
- Neue Suche nach: Lutwyche, M.
- Neue Suche nach: Wada, Y.
- Neue Suche nach: Demczyk, B. G.
- Neue Suche nach: Materials Research Society
In:
Evolution of thin film and surface structure and morphology
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191-196
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1995
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Nanofabrication of Materials with a Scanning Tunneling Microscope
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Beteiligte:Kondo, S. ( Autor:in ) / Heike, S. ( Autor:in ) / Lutwyche, M. ( Autor:in ) / Wada, Y. ( Autor:in ) / Demczyk, B. G. / Materials Research Society
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Kongress:Symposium; Fall meeting, Evolution of thin film and surface structure and morphology ; 1994 ; Boston; MA
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Erschienen in:MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS ; 355 ; 191-196
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Verlag:
- Neue Suche nach: Materials Research Society
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Erscheinungsort:Pittsburgh, Pa.
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Erscheinungsdatum:01.01.1995
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Format / Umfang:6 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 3
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Surface Energy Driven Crystallization of Amorphous Ni~6~9Cr~1~4P~1~7 AlloySchumacher, G. / Wanderka, N. / Wahi, R. P. / Materials Research Society et al. | 1995
- 9
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Structure, Morphology and Evolution of Interfaces in Si/Si~1~-~xGe~x SuperlatticesBaribeau, J.-M. / Lockwood, D. J. / Headrick, R. L. / Materials Research Society et al. | 1995
- 15
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Surface Diffusion of Large Ag Clusters on Ag(100)Wen, J.-M. / Evans, J. W. / Chang, S.-L. / Burnett, J. W. / Materials Research Society et al. | 1995
- 21
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Atomic Force Microscopy and Raman Spectroscopy Study of Strain Relaxation in InGaAs on GaAs(100) Grown by Chemical Beam Epitaxy Using Unprecracked MonoethylarsinePark, S.-J. / Kim, S.-B. / Jeong Sook Ha / Ro, J.-R. / Materials Research Society et al. | 1995
- 27
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Manipulation of Nucleation During Si Molecular Beam EpitaxyLarsson, M. I. / Ni, W.-X. / Hansson, G. V. / Materials Research Society et al. | 1995
- 33
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Structural Evolution or Rapid Thermal Carbonized Si SurfacesCimalla, V. / Pezoldt, J. / Materials Research Society et al. | 1995
- 39
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Pulsed Laser Deposition and Characterization of Novel Cu/TiN/Si(100) Heterostructures Grown Via Domain EpitaxyChowdhury, R. / Vispute, R. D. / Narayan, J. / Materials Research Society et al. | 1995
- 45
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Growth Morphology of Vicinal Hillocks on the {101} Face of KH~2PO~4: Evidence of Surface DiffusionLand, T. A. / De Yoreo, J. J. / Lee, J. D. / Ferguson, J. R. / Materials Research Society et al. | 1995
- 51
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^*The Morphology of Cu Clusters on SrTiO~3(001) at Initial Stages of Metal Film GrowthLiang, Y. / Carroll, D. L. / Bonnell, D. A. / Materials Research Society et al. | 1995
- 59
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Microstructural Evolution During the Epitaxial Growth of Ag/InP (100)Krishnamurthy, M. / Drucker, J. S. / Materials Research Society et al. | 1995
- 65
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Structural Evolution of Highly Crosslinked Polymer NetworksAnseth, K. S. / Bowman, C. N. / Materials Research Society et al. | 1995
- 71
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Morphology of Thin FilmsKeblinski, P. / Maritan, A. / Messier, R. / Toigo, F. / Materials Research Society et al. | 1995
- 77
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Nucleation and Growth of CVD Si Thin Films: AFM, SE and TEM AnalysisPaulson, W. M. / Hegde, R. I. / Doris, B. B. / Kaushik, V. / Materials Research Society et al. | 1995
- 83
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Probing the Nucleation of a Thin Metal Film: Atom Deposition vs. Cluster Beam DepositionMahoney, W. / Lin, S. T. / Andres, R. P. / Materials Research Society et al. | 1995
- 89
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Morphology and Step Coverage of In-Situ Doped Polysilicon Films Deposited by Single Wafer CVDFitch, J. T. / Hegde, R. I. / Beinglass, I. / Venkatesan, M. / Materials Research Society et al. | 1995
- 95
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Microstructural Evolution of Ag/GaAs (110)Drucker, J. / Krishnamurthy, M. / Materials Research Society et al. | 1995
- 101
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Growth Morphology of Ag Islands on GaAs (110) at Low Coverage: Monte Carlo SimulationsChalla, A. / Cale, T. S. / Drucker, J. / Materials Research Society et al. | 1995
- 107
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Patterns of Competitive Crystal GrowthGarcia-Ruiz, J. M. / Rodriguez-Navarro, A. / Materials Research Society et al. | 1995
- 115
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A Dynamic View of Step Configurations on Ag(110) and Their Role in the Formation of Oxygen OverlayersOzcomert, J. S. / Pai, W. W. / Bartelt, N. C. / Reutt-Robey, J. E. / Materials Research Society et al. | 1995
- 123
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Epitaxial Growth of Metastable Sn~xGe~1~-~x Alloy Films by Ion-Assisted Molecular Beam EpitaxyAtwater, H. A. / He, G. / Saipetch, K. / Materials Research Society et al. | 1995
- 135
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Morphology Maps of Small ParticlesDoraiswamy, N. / Marks, L. D. / Materials Research Society et al. | 1995
- 141
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Structure of Nanophase Gold Particles on Iron Oxide SupportsDemczyk, B. G. / Sze, C. / Gulari, E. / Materials Research Society et al. | 1995
- 147
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Using Atomic Force Microscopy to Image Langmuir Blodgett Films of Disk Shaped MoleculesMaliszewskyj, N. C. / Josefowicz, J. Y. / Heiney, P. A. / McCauley, J. P. / Materials Research Society et al. | 1995
- 153
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A Soft Incommensurate Reconstruction on Pb/Si(111)Hwang, I.-S. / Martinez, R. E. / Liu, C. / Golovchenko, J. A. / Materials Research Society et al. | 1995
- 157
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Measuring Vacancy Diffusivity and Vacancy Assisted Clustering by Nitridation Enhanced Diffusion of Sb in Si(100) Doping SuperlatticesMogi, T. K. / Gossmann, H.-J. / Rafferty, C. S. / Luftman, H. S. / Materials Research Society et al. | 1995
- 163
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Co~3O~4 Epitaxial Formation on CoO(100)Carson, G. A. / Nassir, M. H. / Langell, M. A. / Materials Research Society et al. | 1995
- 169
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Tetragonal Au-Ni (001) Solid Solutions Grown by MBEMarty, A. / Dynna, M. / Gilles, B. / Patrat, G. / Materials Research Society et al. | 1995
- 175
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Microstructure and Reconstruction of LaAlO~3 {100} and {110} SurfacesWang, Z. L. / Shapiro, A. J. / Materials Research Society et al. | 1995
- 181
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Atomic Imaging of Metal-Semiconductor Surfaces Using UHV-HREM and DiffractionMarks, L. D. / Jayaram, G. / Plass, R. / Doraiswamy, N. / Materials Research Society et al. | 1995
- 191
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Nanofabrication of Materials with a Scanning Tunneling MicroscopeKondo, S. / Heike, S. / Lutwyche, M. / Wada, Y. / Materials Research Society et al. | 1995
- 197
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Surface and Defect Structure of Epitaxial Gallium Phosphide on Si(001)Miller, A. E. / Kelliher, J. T. / Dietz, N. / Bachmann, K. J. / Materials Research Society et al. | 1995
- 203
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Step-Step Interactions on the Vicinal Ge(001) SurfaceKersten, B. A. / Sjerps-Koomen, L. / Zandvliet, H. J. W. / Blank, D. H. A. / Materials Research Society et al. | 1995
- 209
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Characterization of Sputtered Cerium Dioxide Thin FilmsGuo, S. / Jacobsen, S. N. / Helmersson, U. / Jaerrendahl, K. / Materials Research Society et al. | 1995
- 215
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Crystalline Perfection of Semiconductor Surfaces by X-Ray Multiple DiffractionMorelhao, S. L. / Avanci, L. H. / Cardoso, L. P. / Materials Research Society et al. | 1995
- 221
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SFM Studies of the Surface Morphology of IceNickolayev, O. / Petrenko, V. / Materials Research Society et al. | 1995
- 227
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Molecular Dynamics Study of Disordering and Premelting of the Pb(110) SurfaceLanda, A. / Hakkinen, H. / Barnett, R. N. / Wynblatt, P. / Materials Research Society et al. | 1995
- 235
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Role of Surface Steps in Thin Film Growth and Properties Studied by LEEMAltman, M. S. / Cai, Q. / Chung, W. F. / Luo, E. Z. / Materials Research Society et al. | 1995
- 247
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In-Situ Scanning Probe Microscopy of Solid-Liquid Interfaces: Role of Epitaxial Oxide Adlayers on Cu ElectrodepositionLaGraff, J. R. / Gewirth, A. A. / Materials Research Society et al. | 1995
- 253
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Probing Biopolymer Films with Scanning Force MethodsHaugstad, G. / Gladfelter, W. L. / Weberg, E. B. / Weberg, R. T. / Materials Research Society et al. | 1995
- 259
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Reconstruction from an Oxidized Si(111) Surface Studied by High-Temperature STMSato, T. / Sueyoshi, T. / Iwatsuki, M. / Kersker, M. / Materials Research Society et al. | 1995
- 263
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Monte Carlo Simulation of a Growing Pb-Film on Cu (100) and (111) SurfacesBauer, W. / Betz, G. / Bangert, H. / Bergauer, A. / Materials Research Society et al. | 1995
- 269
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Interface Morphology of RF-Sputtered Nb/Al~2O~3 Multilayers Studied by X-Ray Reflectivity and Diffuse ScatteringSalditt, T. / Metzger, T. H. / Peisl, J. / Morawe, C. / Materials Research Society et al. | 1995
- 275
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Structure of the Annealed Au-Si(100) System: A UHV-HREM StudyJayaram, G. / Marks, L. D. / Materials Research Society et al. | 1995
- 281
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Atomic Structure of Ultrathin Erbium Silicides on Si(111)Lohmeier, M. / Huisman, W. J. / Ter Horst, G. / Zagwijn, P. M. / Materials Research Society et al. | 1995
- 287
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Ambient and High Temperature STM Investigations of the Growth of Titanium Silicide on Silicon SubstratesStephenson, A. W. / Wong, T. M. H. / Welland, M. E. / Materials Research Society et al. | 1995
- 293
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Structural Characterization of Ga on Si(112) by Auger Electron DiffractionYater, J. E. / Shih, A. / Idzerda, Y. U. / Materials Research Society et al. | 1995
- 301
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Roughness Analysis of Si~1~-~xGe~x FilmsFeenstra, R. M. / Lutz, M. A. / Copel, M. / Materials Research Society et al. | 1995
- 311
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Magnetic Force Microscopy: Recent Advances and ApplicationsBabcock, K. / Dugas, M. / Manalis, S. / Elings, V. / Materials Research Society et al. | 1995
- 323
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Step Coverage and Material Properties of CVD Titanium Nitride Films from TDMAT and TDEAT Organic PrecursorsToprac, A. J. / Wang, S.-Q. / Musher, J. / Gordon, R. G. / Materials Research Society et al. | 1995
- 329
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Validation of the Modelling of a Solid-Liquid Reaction by a Solid-Vapor ReactionReumont, G. / Perrot, P. / Foct, J. / Materials Research Society et al. | 1995
- 335
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Orientation Selection and Microstructural Evolution of Epitaxial Pt Films on (001) MgOMcIntyre, P. C. / Maggiore, C. J. / Nastasi, M. / Materials Research Society et al. | 1995
- 341
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Comparison of Properties of CVD Copper Films Deposited on Different Substrate MaterialsChong Mu Lee / Sung Hee Han / Materials Research Society et al. | 1995
- 347
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Preferred Orientation and Magnetic Properties of Barium Hexaferrite Thin Films Devitrified from the GlassAgarwal, G. / Speyer, R. F. / Lee, C.-K. / Spratt, G. / Materials Research Society et al. | 1995
- 353
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Evaluation of Surface Characteristics of ZnS and Zn~2SiO~4 Powders by SFMLi, G. / Materials Research Society et al. | 1995
- 359
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A Comparison of the Physical Properties of Cluster-Based and Vacuum-Evaporated Thin Metal FilmsBielefeld, J. D. / Osifchin, R. G. / Andres, R. P. / Materials Research Society et al. | 1995
- 365
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Evolution of Microstructure During Low-Temperature Solid Phase Epitaxial Growth of Si~xGe~1~-~x on Si(001)Ramanath, G. / Xiao, H. Z. / Lai, S. L. / Ma, Z. / Materials Research Society et al. | 1995
- 373
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Spectral Sensitivities of X-Ray Diffraction and Atomic Force Microscopy to the Roughness of Si/SiO~2 InterfacesEvans-Lutterodt, K. W. / Tang, M.-T. / Materials Research Society et al. | 1995
- 377
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Surface Roughness Investigation of Thin SiO~2 Films Deposited from N~2O and SiH~4Watt, V. H. C. / Moinpour, M. / Sadjadi, R. / Lu, W. / Materials Research Society et al. | 1995
- 383
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Wear Resistance of Pearlitic Steel MicrostructuresPerez-Unzueta, A. J. / Materials Research Society et al. | 1995
- 389
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Surface Roughness and Specific Contact Resistance of AuGeNi/InP Ohmic ContactsClausen, T. / Leistiko, O. / Materials Research Society et al. | 1995
- 395
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Dynamic Surface Evolution of Sputtered Cu-Coatings: A Quantification of Surface Diffusion Effects by AFMEisenmenger-Sittner, C. / Bangert, H. / Bergauer, A. / Bauer, W. / Materials Research Society et al. | 1995
- 401
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Study of Surface Structure, Morphology and Hardness of Several Different Diamond-Like Carbon FilmsYip, P. W. / Hsieh, A. / Dehmer, P. G. / Materials Research Society et al. | 1995
- 409
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Dissolution of CaCO~3(1014) SurfaceLiang, Y. / Baer, D. R. / Lea, A. S. / Materials Research Society et al. | 1995
- 415
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Tungsten Silicide Stability and Interface Reaction Determined by Modeling and ExperimentsFeng, T. / Christou, A. / Materials Research Society et al. | 1995
- 421
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A Model for Oxide Film Evolution on Alloys and Prediction of Resulting Layer StructureCocke, D. L. / Dorris, K. / Naugle, D. G. / Hess, T. R. / Materials Research Society et al. | 1995
- 427
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Phase Transformations in a-Si/Ni/c-Si Structures with Different Interfacial Ni Layer ThicknessesKuznetsov, A. Y. / Khodos, I. I. / Linnros, J. / Mohadjeri, B. / Materials Research Society et al. | 1995
- 433
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An HREM Study of the Microstructure of A1 Contact on GaN/AlN/SiC Thin FilmsHuang, Y. / Smith, L. / Kim, M. J. / Carpenter, R. W. / Materials Research Society et al. | 1995
- 441
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Comparison of Amorphous and Polycrystalline Tungsten Nitride Diffusion Barrier for MOCVD-Cu MetallizationChul Soon Kwon / Dong Joon Kim / Chang Woo Lee / Yong Tae Kim / Materials Research Society et al. | 1995
- 447
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Characterization and Annealing of Sputtered AlN Films for Piezoelectric ResonatorsSchade, M. R. / Anderson, T. / Deal, P. W. / Evans, K. / Materials Research Society et al. | 1995
- 453
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Mechanism of Facet Formation During Epitaxial CoSi~2 Growth Using Co/Refractory BilayersByun, J. S. / Rha, K. G. / Kim, W. S. / Kim, H. J. / Materials Research Society et al. | 1995
- 459
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Amorphous Ti-Si-N Barrier Metal for Cu Metallization on ULSIsIijima, T. / Shimooka, Y. / Suguro, K. / Materials Research Society et al. | 1995
- 465
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Epitaxial TiSi~2 Growth on Si(100) from Reactive Sputtered TiN~x and Subsequent AnnealingByun, J. S. / Rha, K. G. / Kim, W. S. / Materials Research Society et al. | 1995
- 471
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Microstructure and Interfacial Reactions in RuO~2/Ta~2N Precision Thin Film ResistorsMa, E. / Wallace, R. L. / Anderson, W. A. / Materials Research Society et al. | 1995
- 477
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High Resolution Microscopy of Pd/InP InterfacesPalmer, J. W. / Anderson, W. A. / Hoelzer, D. T. / Materials Research Society et al. | 1995
- 483
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Characterization of Tantalum Oxide Thin Film and its Electrodes for Dram's Capacitor ApplicationPark, J.-W. / Jeon, S.-R. / Lee, J.-S. / Lee, J.-Y. / Materials Research Society et al. | 1995
- 491
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Microstructures of Tungsten Silicide Films Deposited by CVD and by SputteringKim, Y.-W. / Lee, N.-I. / Park, M.-H. / Materials Research Society et al. | 1995
- 497
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Structural-Chemical Properties of InP Own OxidesKorotchenkov, G. S. / Skryshevsky, V. A. / Materials Research Society et al. | 1995
- 503
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Condition of Interface: Anodic Oxide - A^3B^3 SemiconductorKorotchenkov, G. S. / Michailov, V. A. / Materials Research Society et al. | 1995
- 507
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Surface Structure and Morphology of CdS Thin Films Deposited by Spray PyrolysisGolovanov, V. / Lantto, V. / Leppaevuori, S. / Uusimaeki, A. / Materials Research Society et al. | 1995
- 513
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Epitaxial Formation and Characterization of CeO~2 FilmsTian, C. / Du, Y. / Chan, S.-W. / Materials Research Society et al. | 1995
- 519
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XPS Study of Sub-Monolayer Native Oxide on HF-Treated Si SurfacesYano, F. / Hiraoka, A. / Itoga, T. / Kojima, H. / Materials Research Society et al. | 1995
- 525
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Characterization of the Degradation Processes in the Buried Heterostructure Quantum Well Laser Diodes Using Internal Second Harmonic EmissionLupu, A. T. / Syrbu, A. V. / Mereutza, A. Z. / Yakovlev, V. P. / Materials Research Society et al. | 1995
- 531
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Surface Alloy Phases of Immiscible Metals: A Semiempirical Study of Au Growth on Ni(110)Bozzolo, G. / Iba�ez-Meier, R. / Ferrante, J. / Materials Research Society et al. | 1995
- 539
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A Model for Low-Resistivity TiSi~2 Formation on Narrow Polysilicon LinesApte, P. P. / Pollack, G. / Materials Research Society et al. | 1995
- 545
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Influence of Interface Roughness Scattering on Electron Mobility in GaAs-Al~0~.~3Ga~0~.~7As Two Dimensional Electron Gas (2DEG) HeterostructuresYang, B. / Cheng, Y.-H. / Wang, Z.-G. / Liang, J.-B. / Materials Research Society et al. | 1995
- 551
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Ceramic Coatings in Pump ManufacturingKuehl, A. / Riegger, H. / Scott, K. T. / McCabe, A. / Materials Research Society et al. | 1995
- 557
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ZrO~2 and ZrO~2-Y~2O~3 Phase Structure in Films and PowdersCaruso, R. / Pellegri, N. / De Sanctis, O. / Caracoche, M. C. / Materials Research Society et al. | 1995
- 563
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RF Aerosol Mist Plasma Deposition of Oxide FilmsWilliams, J. A. A. / Shen, C. Q. / Vuong, K. D. / Tenpas, E. / Materials Research Society et al. | 1995
- 569
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Elastic Misfit Strain Relaxation in Highly Strained InAs Dots on GaAs as Studied by TEM, AFM and VFF Atomistic CalculationsAndroussi, Y. / Francois, P. / Lefebvre, A. / Priester, C. / Materials Research Society et al. | 1995
- 575
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Modeling of Collimated Titanium Nitride Physical Vapor Deposition Using a Combined Specular-Diffuse FormulationToprac, A. J. / Jones, B. P. / Schlueter, J. / Cale, T. S. / Materials Research Society et al. | 1995
- 581
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Very Low Temperature Deposition of Polycrystalline Silicon Films with Micro-Meter-Order Grains on SiO~2Wang, K.-C. / Yew, T.-R. / Hwang, H.-L. / Materials Research Society et al. | 1995
- 587
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ZnO:In Thin Films Prepared with Different Precursor Salts by Spray Pyrolysis and Studied by Electron MicroscopyAcosta, D. R. / Lovera, O. / Maldonado, A. / Asomoza, R. / Materials Research Society et al. | 1995
- 593
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Capillary Instabilities in Cobalt Silicide Thin FilmsPramanick, S. / Patnaik, B. / Rozgonyi, G. A. / Materials Research Society et al. | 1995
- 601
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Surface Topography and Cocondensed Amorphous ZrCo-Alloy Films Investigated In Situ by UHV-STMReinker, B. / Moske, M. / Geisler, H. / Samwer, K. / Materials Research Society et al. | 1995
- 607
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Grain Growth Behavior of Bismuth Titanate Thin Film on Metallic Silicon SubstratesLu, Y. / Schulze, W. A. / Hoelzer, D. T. / Materials Research Society et al. | 1995
- 613
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Microstructure and Surface Morphology of Ag and Au Films Grown on Hydrogen-Terminated Si(111) SubstratesNaik, R. / Auner, G. W. / Gebremariam, S. / Tatham, A. / Materials Research Society et al. | 1995
- 625
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Direct Sub-Lattice Imaging of Interface Dislocation Structures in CdTe/GaAs(001)McGibbon, A. J. / Pennycook, S. J. / Angelo, J. E. / Mills, M. J. / Materials Research Society et al. | 1995
- 631
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The Effect of Si on TiAl~3 Formation in Ti/Al Alloy BilayersBesser, P. R. / Sanchez, J. E. / Alvis, R. / Materials Research Society et al. | 1995
- 637
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Effects of Rapid Thermal Annealing on Heavily Boron Doped Silicon Epitaxial LayersWang, J. / Xu, Q. / Lu, F. / Sun, H. / Materials Research Society et al. | 1995
- 643
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Computer Simulation of Surface Diffusion of Copper on Copper (111) and (100) SurfacesTakano, J. / Mochizuki, M. / Doyama, M. / Materials Research Society et al. | 1995
- 649
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Reduction of Defects in Highly Lattice Mismatched InGaAs Grown on GaAs by MOCVDLee, B. / Yoon, M. / Baek, J.-H. / Lee, E.-H. / Materials Research Society et al. | 1995
- 655
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Defect-Free GaAs Cap Layer on Aluminum Oxide Generated by Thermal Oxidation of AlAsLee, B. / Yoon, M. / Baek, J.-H. / Lee, E.-H. / Materials Research Society et al. | 1995