Focused Ion Beam in Failure Analysis of Microelectronic Devices (Englisch)
- Neue Suche nach: Liu, L.
- Neue Suche nach: Wang, P.
- Neue Suche nach: International Metallographic Society
- Neue Suche nach: Liu, L.
- Neue Suche nach: Wang, P.
- Neue Suche nach: Stevens, D. W.
- Neue Suche nach: International Metallographic Society
In:
International Metallographic Society: Advances and applications in the metallography and characterization of materials and microelectronic components
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99-102
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1996
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Focused Ion Beam in Failure Analysis of Microelectronic Devices
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Beteiligte:Liu, L. ( Autor:in ) / Wang, P. ( Autor:in ) / Stevens, D. W. / International Metallographic Society
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Kongress:Annual technical meeting; 28th, International Metallographic Society: Advances and applications in the metallography and characterization of materials and microelectronic components ; 1995 ; Albuquerque; NM
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Erschienen in:MICROSTRUCTURAL SCIENCE ; 23 ; 99-102
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Verlag:
- Neue Suche nach: ASM International
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Erscheinungsort:Columbus, Ohio , International Metallographic Society , Materials Park, Ohio
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Erscheinungsdatum:01.01.1996
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Format / Umfang:4 pages
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Method to Evaluate Damage Induced by Dicing and Laser Cutting of Silicon WafersEbbutt, R. / Danyluk, S. / Weisshaus, I. / International Metallographic Society et al. | 1996
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Focused Ion Beam in Failure Analysis of Microelectronic DevicesLiu, L. / Wang, P. / International Metallographic Society et al. | 1996
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New Metallographic Preparation Techniques for Tantalum and Tantalum AlloysKelly, A. M. / Bingert, S. R. / Reiswig, R. D. / International Metallographic Society et al. | 1996
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Effect of Surface Preparation on High Temperature Oxidation of Ni-Cr-Be and Co-Cr AlloysMueller, H. J. / International Metallographic Society et al. | 1996
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Microstructural Characterization Methodologies for Ni/Ni(OH)~2 Powders for Battery ApplicationsShehata, M. T. / Carpenter, G. J. C. / International Metallographic Society et al. | 1996
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