AES and XPS analysis of nanowear and thin films (Japanisch)
- Neue Suche nach: Grant, J. T.
- Neue Suche nach: Surface Analysis Society of Japan
- Neue Suche nach: Grant, J. T.
- Neue Suche nach: Surface Analysis Society of Japan
In:
New trends and possibilities of surface analysis: towards the analysis of nano-structured materials
1
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4-10
;
2002
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:AES and XPS analysis of nanowear and thin films
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Beteiligte:Grant, J. T. ( Autor:in ) / Surface Analysis Society of Japan
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Kongress:International symposium, New trends and possibilities of surface analysis: towards the analysis of nano-structured materials ; 2002 ; Tokyo
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Erschienen in:New trends and possibilities of surface analysis: towards the analysis of nano-structured materials , 1 ; 4-10JOURNAL OF SURFACE ANALYSIS ; 9, 1 ; 4-10
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Verlag:
- Neue Suche nach: Surface Analysis Society of Japan
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Erscheinungsdatum:01.01.2002
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Format / Umfang:7 pages
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Anmerkungen:Text in Japanese and English, with summaries in English
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Japanisch
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Schlagwörter:
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Datenquelle:
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