Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summary [8036-18] (Englisch)
- Neue Suche nach: Wyatt, J.M.
- Neue Suche nach: Wyatt, J.M.
- Neue Suche nach: Postek, Michael T.
In:
Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences
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8036 04
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2011
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summary [8036-18]
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Beteiligte:Wyatt, J.M. ( Autor:in ) / Postek, Michael T.
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Kongress:Conference, Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 2011 ; Orlando, FL
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Erschienen in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 8036 ; 8036 04
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsort:Bellingham, WA
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Erscheinungsdatum:01.01.2011
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Format / Umfang:8036 04
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Anmerkungen:Also known as SCANNING 2011. Held with SPIE defense, security, and sensing 2011 (DSS 2011) conference. Includes bibliographical references and author index.
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 80360D
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Advanced image composition with intra-frame drift correctionCizmar, Petr / Vladár, András E. / Postek, Michael T. et al. | 2011
- 80360E
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The characterization of nanoparticles using analytical electron microscopyHill, Whitney B. et al. | 2011
- 80360F
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Transmission electron microscopy of electrospun GaN nanofibersRobles-García, Joshua L. / Meléndez, Anamaris / Yates, Douglas / Santiago-Avilés, Jorge J. / Ramos, Idalia / Campo, Eva M. et al. | 2011
- 80360G
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Study of LCE nanocomposites through electron microscopyTorras, N. / Jobet, J. / Marshall, J. E. / Zinoviev, K. / Yates, D. / Rotkina, L. / Esteve, J. / Terentjev, E. M. / Campo, E. M. et al. | 2011
- 80360H
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Morphological classification and microanalysis of tire tread particles worn by abrasion or corrosionCrosta, Giovanni F. et al. | 2011
- 80360I
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Nanodispersion, nonlinear image filtering, and materials classificationCrosta, Giovanni F. / Lee, Jun S. et al. | 2011
- 80360K
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Investigation of cellular interactions of nanoparticles by helium ion microscopyArey, B. W. / Shutthanandan, V. / Xie, Y. / Tolic, A. / Williams, N. / Orr, G. et al. | 2011
- 80360M
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Creating nanohole arrays with the helium ion microscopeAnanth, Mohan / Stern, Lewis / Ferranti, David / Huynh, Chuong / Notte, John / Scipioni, Larry / Sanford, Colin / Thompson, Bill et al. | 2011
- 80360O
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Secondary electron emission spectra and energy selective imaging in helium ion microscopePetrov, Yu. / Vyvenko, O. et al. | 2011
- 80360P
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A metrological scanning probe microscope based on a quartz tuning fork detectorBabic, Bakir / Freund, Christopher H. / Lawn, Malcolm / Miles, John R. / Herrmann, Jan et al. | 2011
- 80360Q
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Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFMKorpelainen, V. / Seppä, J. / Lassila, A. et al. | 2011
- 80360R
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Study of a large range metrological atomic force microscope applied for calibration of a vertical PZT stageWang, S. H. / Tan, S. L. / Xu, G. et al. | 2011
- 80360S
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Traceable calibration of a critical dimension atomic force microscopeDixson, Ronald / Orji, Ndubuisi G. / McGray, Craig D. / Geist, Jon et al. | 2011
- 80360T
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Particle number density gradient samples for nanoparticle metrology with atomic force microscopyLawn, Malcolm A. / Goreham, Renee V. / Herrmann, Jan / Jämting, Asa K. et al. | 2011
- 80360U
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Development of photomask linewidth measurement and calibration using AFM and SEM in NMIJSugawara, Kentaro / Sato, Osamu / Misumi, Ichiko / Gonda, Satoshi / Lu, Mingzi et al. | 2011
- 80360V
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New developments at PTB in 3D-AFM with tapping and torsion AFM mode and vector approach probing strategyDai, G. / Hässler-Grohne, W. / Hüser, D. / Wolff, H. / Fluegge, J. / Bosse, H. et al. | 2011
- 803601
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Front Matter: Volume 8036| 2011
- 803602
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Is scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDS) quantitative? Effect of specimen shapeNewbury, Dale E. / Ritchie, Nicholas W. M. et al. | 2011
- 803604
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Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summaryWyatt, J. Matney et al. | 2011
- 803605
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Probative value of gunshot residue on victims of shootings and comparison of gunshot residue results with modern technology versus older testing of samplesWhite, Robert S. / Mershon, William J. et al. | 2011
- 803606
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Scientific working group on gunshot residue (SWGGSR): a progress reportTrimpe, Michael A. et al. | 2011
- 803607
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Characterization and source identification of fugitive dusts by light and electron microscopyBrown, Richard S. et al. | 2011
- 803608
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Application possibilities of several modern methods of microscopy and microanalysis in forensic science fieldKotrly, Marek / Turkova, Ivana et al. | 2011
- 803610
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Through-focus scanning optical microscopyAttota, Ravikiran / Dixson, Ronald G. / Vladár, Andras E. et al. | 2011
- 803612
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Dispersion free all reflective confocal microscope objectiveWalecki, Wojtek J. / Scaggs, Mike / Walecki, Peter S. / Szondy, Fanny et al. | 2011
- 803613
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Use of fluorescence and scanning electron microscopy as tools in teaching biologyGhosh, Nabarun / Silva, Jessica / Vazquez, Aracely / Das, A B. / Smith, Don W. et al. | 2011
- 803615
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3D-measurement using a scanning electron microscope with four Everhart-Thornley detectorsVynnyk, Taras / Scheuer, Renke / Reithmeier, Eduard et al. | 2011
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Creating nanohole arrays with the helium ion microscope [8036-22]Ananth, M. / Stern, L. / Ferranti, D. / Huynh, C. / Notte, J. / Scipioni, L. / Sanford, C. / Thompson, B. et al. | 2011
-
Investigation of cellular interactions of nanoparticles by helium ion microscopy [8036-20]Arey, B.W. / Shutthanandan, V. / Xie, Y. / Tolic, A. / Williams, N. / Orr, G. et al. | 2011
-
Probative value of gunshot residue on victims of shootings and comparison of gunshot residue results with modern technology versus older testing of samples [8036-04]White, R.S. / Mershon, W.J. et al. | 2011
-
Nanodispersion, nonlinear image filtering, and materials classification [8036-17]Crosta, G.F. / Lee, J.S. et al. | 2011
-
Through-focus scanning optical microscopy [8036-36]Attota, R. / Dixson, R.G. / Vladar, A.E. et al. | 2011
-
Is scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDS) quantitative? Effect of specimen shape (Keynote Paper) [8036-01]Newbury, D.E. / Ritchie, N.W.M. et al. | 2011
-
The characterization of nanoparticles using analytical electron microscopy [8036-13]Hill, W.B. et al. | 2011
-
New developments at PTB in 3D-AFM with tapping and torsion AFM mode and vector approach probing strategy [8036-31]Dai, G. / Hassler-Grohne, W. / Huser, D. / Wolff, H. / Fluegge, J. / Bosse, H. et al. | 2011
-
Traceable calibration of a critical dimension atomic force microscope [8036-28]Dixson, R. / Orji, N.G. / McGray, C.D. / Geist, J. et al. | 2011
-
Characterization and source identification of fugitive dusts by light and electron microscopy [8036-06]Brown, R.S. et al. | 2011
-
Advanced image composition with intra-frame drift correction [8036-12]Cizmar, P. / Vladar, A.E. / Postek, M.T. et al. | 2011
-
A metrological scanning probe microscope based on a quartz tuning fork detector [8036-25]Babic, B. / Freund, C.H. / Lawn, M. / Miles, J.R. / Herrmann, J. et al. | 2011
-
Scientific working group on gunshot residue (SWGGSR): a progress report [8036-05]Trimpe, M.A. et al. | 2011
-
Application possibilities of several modern methods of microscopy and microanalysis in forensic science field [8036-07]Kotrly, M. / Turkova, I. et al. | 2011
-
Transmission electron microscopy of electrospun GaN nanofibers [8036-14]Robles-Garcia, J.L. / Melendez, A. / Yates, D. / Santiago-Aviles, J.J. / Ramos, I. / Campo, E.M. et al. | 2011
-
Study of a large range metrological atomic force microscope applied for calibration of a vertical PZT stage [8036-27]Wang, S.H. / Tan, S.L. / Xu, G. et al. | 2011
-
Use of fluorescence and scanning electron microscopy as tools in teaching biology [8036-40]Ghosh, N. / Silva, J. / Vazquez, A. / Das, A.B. / Smith, D.W. et al. | 2011
-
3D-measurement using a scanning electron microscope with four Everhart-Thornley detectors [8036-42]Vynnyk, T. / Scheuer, R. / Reithmeier, E. et al. | 2011
-
Dispersion free all reflective confocal microscope objective [8036-38]Walecki, W.J. / Scaggs, M. / Walecki, P.S. / Szondy, F. et al. | 2011
-
Secondary electron emission spectra and energy selective imaging in helium ion microscope [8036-24]Petrov, Y. / Vyvenko, O. et al. | 2011
-
Development of photomask linewidth measurement and calibration using AFM and SEM in NMIJ [8036-30]Sugawara, K. / Sato, O. / Misumi, I. / Gonda, S. / Lu, M. et al. | 2011
-
Morphological classification and microanalysis of tire tread particles worn by abrasion or corrosion [8036-16]Crosta, G.F. et al. | 2011
-
Particle number density gradient samples for nanoparticle metrology with atomic force microscopy [8036-29]Lawn, M.A. / Goreham, R.V. / Herrmann, J. / Jamting, A.K. et al. | 2011
-
Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFM [8036-26]Korpelainen, V. / Seppa, J. / Lassila, A. et al. | 2011
-
Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summary [8036-18]Wyatt, J.M. et al. | 2011
-
Study of LCE nanocomposites through electron microscopy [8036-15]Torras, N. / Jobet, J. / Marshall, J.E. / Zinoviev, K. / Yates, D. / Rotkina, L. / Esteve, J. / Terentjev, E.M. / Campo, E.M. et al. | 2011