X-ray standing waves as probes of surface structure: Incident beam energy effects (Unbekannt)
- Neue Suche nach: Kirchner, S.
- Neue Suche nach: Wang, J.
- Neue Suche nach: Yin, Z.
- Neue Suche nach: Caffrey, M.
- Neue Suche nach: Kirchner, S.
- Neue Suche nach: Wang, J.
- Neue Suche nach: Yin, Z.
- Neue Suche nach: Caffrey, M.
In:
JOURNAL OF APPLIED PHYSICS
;
78
, 4
;
2311
;
1995
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:X-ray standing waves as probes of surface structure: Incident beam energy effects
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Beteiligte:
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Erschienen in:JOURNAL OF APPLIED PHYSICS ; 78, 4 ; 2311
-
Verlag:
- Neue Suche nach: AMERICAN INSTITUTE OF PHYSICS
-
Erscheinungsdatum:01.01.1995
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Format / Umfang:2311 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Unbekannt
- Neue Suche nach: 530.5 / 530
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
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- 2883
-
Generation‐recombination noise in submicron semiconductor layers: Influence of the edgesKleinpenning, T. G. M. / Jarrix, S. / Lecoy, G. et al. | 1995
- 2886
-
Photoluminescence of three phonon replicas of the bound exciton in undoped InGaP prepared by liquid phase epitaxyJiang, G. C. / Chang, Y. / Chang, L. B. / Juang, Y. D. / Lu, W. L. / Lu, Luke S. / Chang, K. H. et al. | 1995
- 2889
-
Optimization and characterization of interfaces of InGaAs/InGaAsP quantum well structures grown by gas‐source molecular beam epitaxyBi, W. G. / Tu, C. W. et al. | 1995
- 2892
-
Detection of very small defects and tiny inclusions just under mirror polished surfaces of silicon wafers by inside total reflectionNango, Nouhito / Furuya, Hisashi / Furukawa, Jun / Ogawa, Tomoya et al. | 1995
- 2894
-
Angular‐selective optical transmittance of highly transparent Al‐oxide‐based films made by oblique‐angle sputteringLe Bellac, D. / Niklasson, G. A. / Granqvist, C. G. et al. | 1995
- 2897
-
CUMULATIVE AUTHOR INDEX| 1995