A system-based component test plan for a series system, with type-II censoring (Englisch)
- Neue Suche nach: Rajgopal, J.
- Neue Suche nach: Mazumdar, M.
- Neue Suche nach: Rajgopal, J.
- Neue Suche nach: Mazumdar, M.
In:
IEEE TRANSACTIONS ON RELIABILITY R
;
45
, 3
;
375-378
;
1996
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:A system-based component test plan for a series system, with type-II censoring
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Beteiligte:Rajgopal, J. ( Autor:in ) / Mazumdar, M. ( Autor:in )
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Erschienen in:IEEE TRANSACTIONS ON RELIABILITY R ; 45, 3 ; 375-378
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Verlag:
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Erscheinungsdatum:01.01.1996
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Format / Umfang:4 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 620.00452
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 620.00452 -
Datenquelle:
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