Thin films: stress, strain and structure-property relations (Englisch)
- Neue Suche nach: Yeadon, M.
- Neue Suche nach: Kaiyang, Z.
- Neue Suche nach: Huey Hoon, H.
- Neue Suche nach: Twesten, R. D.
- Neue Suche nach: Abothu, R.
- Neue Suche nach: Yeadon, M.
- Neue Suche nach: Kaiyang, Z.
- Neue Suche nach: Huey Hoon, H.
- Neue Suche nach: Twesten, R. D.
- Neue Suche nach: Abothu, R.
In:
THIN SOLID FILMS
;
424
, 1
;
1
;
2003
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Thin films: stress, strain and structure-property relations
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Beteiligte:Yeadon, M. ( Autor:in ) / Kaiyang, Z. ( Autor:in ) / Huey Hoon, H. ( Autor:in ) / Twesten, R. D. ( Autor:in ) / Abothu, R. ( Autor:in )
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Erschienen in:THIN SOLID FILMS ; 424, 1 ; 1
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Verlag:
- Neue Suche nach: Elsevier Science B.V., Amsterdam.
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Erscheinungsdatum:01.01.2003
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Format / Umfang:1 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 530.4275
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 530.4275 -
Datenquelle:
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- 1
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Thin films: stress, strain and structure–property relationsYeadon, Mark / Kaiyang, Zeng / Huey Hoon, Hng / Twesten, Ray D / Abothu, Robin et al. | 2002
- 2
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Quantitative characterization of self-assembled coherent islandsLiu, Chuan-Pu / Gibson, J.Murray et al. | 2002
- 9
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Morphological evolution driven by strain induced surface diffusionZhang, Y.W. et al. | 2003
- 15
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On the island nucleation process in LPOMVPE In0.2Ga0.8As-GaAs multilayers grown on GaAs and AlAs buffersGartstein, E. et al. | 2003
- 23
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Effects of hydrostatic pressure on Raman scattering in Ge quantum dot superlatticesQin, L. / Shen, Z.X. / Teo, K.L. / Peng, C.S. / Zhou, J.M. / Tung, C.H. / Tang, S.H. et al. | 2002
- 28
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In situ ultrahigh vacuum transmission electron microscopy studies of palladium silicide island formation on silicon (111) 7x7 surfaceTakeguchi, M. et al. | 2003
- 28
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In situ ultrahigh vacuum transmission electron microscopy studies of palladium silicide island formation on silicon (111) 7×7 surfaceTakeguchi, M. / Liu, J. / Zhang, Q. / Tanaka, M. / Furuya, K. et al. | 2002
- 33
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Effects of stress on the interfacial reactions of metal thin films on (001)SiCheng, S.L. / Lo, H.M. / Cheng, L.W. / Chang, S.M. / Chen, L.J. et al. | 2002
- 40
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Study of step instability on Si surfacesMinoda, Hiroki et al. | 2002
- 45
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Motion and conversion energies of adatom and adatom clusters on gold (001) surfaceTakano, J. / Doyama, Masao / Kogure, Y. et al. | 2002
- 50
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Quantitative characterization of the composition, thickness and orientation of thin films in the analytical electron microscopeWilliams, D.B. / Watanabe, M. / Papworth, A.J. / Li, J.C. et al. | 2002
- 56
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Thin films of iron oxide by low pressure MOCVD using a novel precursor: tris(t-butyl-3-oxo-butanoato)iron(III)Shalini, K / Subbanna, G.N / Chandrasekaran, S / Shivashankar, S.A et al. | 2002
- 61
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Optical property of Eu in strontium barium niobate optical thin film grown by pulsed laser depositionLiu, H / Li, S.T / Fernandez, F.E / Liu, G.K et al. | 2002
- 66
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Determination of optical constants of Cd1−xZnxTe thin films by spectroscopic ellipsometryPrabakar, K. / Sridharan, M. / Narayandass, Sa.K. / Mangalaraj, D. / Gopal, Vishnu et al. | 2002
- 70
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Ferroelectric and dielectric properties of sol–gel derived BaxSr1−xTiO3 thin filmsAdikary, S.U / Chan, H.L.W et al. | 2002
- 75
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Determination of the nature of principal scattering mechanism in well-annealed vacuum deposited thin films of the ternary thermoelectric material Bi2(Te0.8Se0.2)3Damodara Das, V. / Chandra Mallik, Ramesh et al. | 2002
- 79
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Structure of post-annealed ferroelectric PbZrxTi1–xO3 and SrBi2Ta2O9 thin filmsGao, Jianxia / Liu, Erjia / Zhang, Zhibin / Cao, Jianqing / Zeng, Aiping et al. | 2002
- 84
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Landau–Khalatnikov simulations for the effects of external stresses on the ferroelectric properties of Pb(Zr,Ti)O3 thin filmsSong, T.K. / Kim, J.S. / Kim, M.H. / Lim, W. / Kim, Y.S. / Lee, J. et al. | 2002
- 88
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Plastic deformation of copper thin foilsNozaki, N. / Doyama, Masao / Kogure, Y. et al. | 2002
- 93
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Sputter deposited nanocrystalline Ni-25Al alloy thin films and Ni/Ni3Al multilayersBanerjee, R / Thompson, G.B / Anderson, P.M / Fraser, H.L et al. | 2002
- 99
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Nanometric-layered CrN/TiN thin films: mechanical strength and thermal stabilityZeng, X.T. / Zhang, S. / Sun, C.Q. / Liu, Y.C. et al. | 2002
- 103
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Effects of energetic particle bombardment on residual stress, microstrain and grain size of plasma-assisted PVD Cr thin filmsHsieh, J.H. / Li, C. / Wu, W. / Hochman, R.F. et al. | 2002
- 107
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Interfacial structure, residual stress and adhesion of diamond coatings deposited on titaniumFu, Yongqing / Du, Hejun / Sun, Chang Q. et al. | 2002
- 115
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A shaft-loaded blister test for elastic response and delamination behavior of thin film–substrate systemXu, Xiaojing / Shearwood, Christopher / Liao, Kin et al. | 2002
- 120
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Mechanical integrity and adhesion of thin films for applications in electronics packaging and cell biologyDuan, Jin et al. | 2003
- 125
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Steel surface treatment by a dual process of ion nitriding and thermal shockFeugeas, J.N / Gómez, B.J / Nachez, L / Lesage, J et al. | 2002
- 130
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Time evolution of Cr and N on AISI 304 steel surface during pulsed plasma ion nitridingFeugeas, J.N / Gómez, B.J / Sánchez, G / Ferron, J / Craievich, A et al. | 2002
- 139
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2 MeV proton channeling contrast microscopy of LEO GaN thin film structuresOsipowicz, T. / Teo, E.J. / Bettiol, A.A. / Watt, F. / Hao, M.S. / Chua, S.J. et al. | 2002
- 143
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Correlation between the composition, structure and properties of dual ion beam deposited SiNx filmsTsang, M.P. / Ong, C.W. / Choy, C.L. / Lim, P.K. / Hung, W.W. et al. | 2002
- 148
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Defects in silicon oxynitride filmsFutatsudera, M / Kimura, T / Matsumoto, A / Inokuma, T / Kurata, Y / Hasegawa, S et al. | 2002
- 152
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Author Index| 2003
- 153
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Subject Index| 2003