CdWO~4 Crystal in Gamma-Ray Spectrometry (Englisch)
- Neue Suche nach: Moszynski, M.
- Neue Suche nach: Balcerzyk, M.
- Neue Suche nach: Kapusta, M.
- Neue Suche nach: Syntfeld, A.
- Neue Suche nach: Wolski, D.
- Neue Suche nach: Pausch, G.
- Neue Suche nach: Stein, J.
- Neue Suche nach: Schotanus, P.
- Neue Suche nach: Moszynski, M.
- Neue Suche nach: Balcerzyk, M.
- Neue Suche nach: Kapusta, M.
- Neue Suche nach: Syntfeld, A.
- Neue Suche nach: Wolski, D.
- Neue Suche nach: Pausch, G.
- Neue Suche nach: Stein, J.
- Neue Suche nach: Schotanus, P.
In:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
;
52
, 6
;
3124-3128
;
2005
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:CdWO~4 Crystal in Gamma-Ray Spectrometry
-
Beteiligte:Moszynski, M. ( Autor:in ) / Balcerzyk, M. ( Autor:in ) / Kapusta, M. ( Autor:in ) / Syntfeld, A. ( Autor:in ) / Wolski, D. ( Autor:in ) / Pausch, G. ( Autor:in ) / Stein, J. ( Autor:in ) / Schotanus, P. ( Autor:in )
-
Erschienen in:IEEE TRANSACTIONS ON NUCLEAR SCIENCE ; 52, 6 ; 3124-3128
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsdatum:01.01.2005
-
Format / Umfang:5 pages
-
ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 621.3 / 621
- Weitere Informationen zu Dewey Decimal Classification
-
Klassifikation:
-
Datenquelle:
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- 2085
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Table of contents| 2005
- 2090
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EDITORIAL - Editorial Conference Comments by the General ChairmanSexton, F.W. et al. | 2005
- 2090
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Editorial Conference Comments by the General ChairmanSexton, F.W. et al. | 2005
- 2093
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EDITORIAL - 2005 Special NSREC Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE Comments by the Guest EditorCressler, J.D. et al. | 2005
- 2093
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2005 Special NSREC Issue of the IEEE Transactions on Nuclear Science Comments by the Guest EditorCressler, J.D. et al. | 2005
- 2094
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2005 December Special NSREC Issue of the IEEE Transactions on N uclear Science List of Reviewers| 2005
- 2094
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LIST OF REVIEWERS - 2005 December Special NSREC Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE List of Reviewers| 2005
- 2095
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AWARDS - 2005 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Awards Comments by the ChairmanKinnison, J.D. et al. | 2005
- 2095
-
2005 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Awards Comments by the ChairmanKinnison, J.D. et al. | 2005
- 2097
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Outstanding Conference Paper Award 2005 IEEE Nuclear and Space Radiation Effects Conference (NSREC)| 2005
- 2097
-
AWARDS - Outstanding Conference Paper Award 2005 IEEE Nuclear and Space Radiation Effects Conference (NSREC)| 2005
- 2101
-
In Memoriam for James T. (Jim) Blandford, Jr.| 2005
- 2101
-
IN MEMORIAM - James T. (Jim) Blandford, Jr.Pickel, J.C. et al. | 2005
- 2101
-
James T. (Jim) Blandford, JrPickel, J. C. et al. | 2005
- 2102
-
IN MEMORIAM - Len AdamsHolmes-Siedle, A. et al. | 2005
- 2102
-
In Memoriam for Len AdamsHolmes-Siedle, A. / Harboe-Sorensen, R. et al. | 2005
- 2102
-
Len AdamsHolmes-Siedle, A. / Harboe-Sorensen, R. et al. | 2005
- 2104
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Direct Measurement of Transient Pulses Induced by Laser and Heavy Ion Irradiation in Deca-Nanometer DevicesFeriet-Cavrois, V. et al. | 2005
- 2104
-
Direct measurement of transient pulses induced by laser and heavy ion irradiation in deca-nanometer devicesFerlet-Cavrois, V. / Paillet, P. / McMorrow, D. / Torres, A. / Gaillardin, M. / Melinger, J.S. / Knudson, A.R. / Campbell, A.B. / Schwank, J.R. / Vizkelethy, G. et al. | 2005
- 2114
-
Variation of digital SET pulse widths and the implications for single event hardening of advanced CMOS processesBenedetto, J.M. / Eaton, P.H. / Mavis, D.G. / Gadlage, M. / Turflinger, T. et al. | 2005
- 2114
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Variation of Digital SET Pulse Widths and the Implications for Single Event Hardening of Advanced CMOS ProcessesBenedetto, J.M. et al. | 2005
- 2120
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Comparison of Heavy Ion and Proton Induced Combinatorial and Sequential Logic Error Rates in a Deep Submicron ProcessGadlage, M.J. et al. | 2005
- 2120
-
Comparison of heavy ion and proton induced combinatorial and sequential logic error rates in a deep submicron processGadlage, M.J. / Eaton, P.H. / Benedetto, J.M. / Turflinger, T.L. et al. | 2005
- 2125
-
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAMWarren, K.M. / Weller, R.A. / Mendenhall, M.H. / Reed, R.A. / Ball, D.R. / Howe, C.L. / Olson, B.D. / Alles, M.L. / Massengill, L.W. / Schrimpf, R.D. et al. | 2005
- 2125
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - The Contribution of Nuclear Reactions to Heavy Ion Single Event Upset Cross-Section Measurements in a High-Density SEU Hardened SRAMWarren, K.M. et al. | 2005
- 2132
-
Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM designOlson, B.D. / Ball, D.R. / Warren, K.M. / Massengill, L.W. / Haddad, N.F. / Doyle, S.E. / McMorrow, D. et al. | 2005
- 2132
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Simultaneous Single Event Charge Sharing and Parasitic Bipolar Conduction in a Highly-Scaled SRAM DesignOlson, B.D. et al. | 2005
- 2137
-
Simulation analysis of the bipolar amplification induced by heavy-ion irradiation in double-gate MOSFETsCastellani-Coulie, K. / Munteanu, D. / Autran, J.L. / Ferlet-Cavrois, V. / Paillet, P. / Baggio, J. et al. | 2005
- 2137
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Simulation Analysis of the Bipolar Amplification Induced by Heavy-Ion Irradiation in Double-Gate MOSFETsCastellani-Coulié, K. et al. | 2005
- 2144
-
Radiation induced leakage current in floating gate memory cellsCellere, G. / Larcher, L. / Paccagnella, A. / Visconti, A. / Bonanomi, M. et al. | 2005
- 2144
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Radiation Induced Leakage Current in Floating Gate Memory CellsCellere, G. et al. | 2005
- 2153
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Simulation of a New Back Junction Approach for Reducing Charge Collection in 200 GHz SiGe HBTsNiu, G. et al. | 2005
- 2153
-
Simulation of a new back junction approach for reducing charge collection in 200 GHz SiGe HBTsGuofu Niu, / Hua Yang, / Varadharajaperumal, M. / Yun Shi, / Cressler, J.D. / Krithivasan, R. / Marshall, P.W. / Reed, R. et al. | 2005
- 2158
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Rate Predictions for Single-Event Effects -- Critique IIPetersen, E.L. et al. | 2005
- 2158
-
Rate predictions for single-event effects - critique IIPetersen, E.L. / Pouget, V. / Massengill, L.W. / Buchner, S.P. / McMorrow, D. et al. | 2005
- 2168
-
Prediction of SOI single-event effects using a simple physics-based SPICE modelFulkerson, D.E. / Vogt, E.E. et al. | 2005
- 2168
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Prediction of SOI Single-Event Effects Using a Simple Physics-Based SPICE ModelFulkerson, D.E. et al. | 2005
- 2175
-
Straggling and extreme cases in the energy deposition by ions in submicron silicon volumesBarak, J. / Akkerman, A. et al. | 2005
- 2175
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Straggling and Extreme Cases in the Energy Deposition by Ions in Submicron Silicon VolumesBarak, J. et al. | 2005
- 2182
-
Role of heavy-ion nuclear reactions in determining on-orbit single event error ratesHowe, C.L. / Weller, R.A. / Reed, R.A. / Mendenhall, M.H. / Schrimpf, R.D. / Warren, K.M. / Ball, D.R. / Massengill, L.W. / LaBel, K.A. / Howard, J.W. et al. | 2005
- 2182
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Role of Heavy-Ion Nuclear Reactions in Determining On-Orbit Single Event Error RatesHowe, C.L. et al. | 2005
- 2189
-
The effect of metallization Layers on single event susceptibilityKobayashi, A.S. / Ball, D.R. / Warren, K.M. / Reed, R.A. / Haddad, N. / Mendenhall, M.H. / Schrimpf, R.D. / Weller, R.A. et al. | 2005
- 2189
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - The Effect of Metallization Layers on Single Event SusceptibilityKobayashi, A.S. et al. | 2005
- 2194
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Coupled Electro-Thertnal Simulations of Single Event Burnout in Power DiodesAlbadri, A.M. et al. | 2005
- 2194
-
Coupled electro-thermal Simulations of single event burnout in power diodesAlbadri, A.M. / Schrimpf, R.D. / Walker, D.G. / Mahajan, S.V. et al. | 2005
- 2200
-
Analysis of angular dependence of proton-induced multiple-bit upsets in a synchronous SRAMIkeda, N. / Kuboyama, S. / Matsuda, S. / Handa, T. et al. | 2005
- 2200
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Analysis of Angular Dependence of Proton-Induced Multiple-Bit Upsets in a Synchronous SRAMIkeda, N. et al. | 2005
- 2205
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Single-Event-Upset-Like Fault Injection: A Comprehensive FrameworkFaure, F. et al. | 2005
- 2205
-
Single-event-upset-like fault injection: a comprehensive frameworkFaure, F. / Velazco, R. / Peronnard, P. et al. | 2005
- 2210
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Radiation-Induced Breakdown in 1.7 nm Oxynitrided Gate OxidesGerardin, S. et al. | 2005
- 2210
-
Radiation-induced breakdown in 1.7 nm oxynitrided gate oxidesGerardin, S. / Cester, A. / Paccagnella, A. / Gasiot, G. / Mazoyer, P. / Roche, P. et al. | 2005
- 2217
-
A new analytical approach to estimate the effects of SEUs in TMR architectures implemented through SRAM-based FPGAsSterpone, L. / Violante, M. et al. | 2005
- 2217
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - A New Analytical Approach to Estimate the Effects of SEUs in TMR Architectures Implemented Through SRAM-Based FPGAsSterpone, L. et al. | 2005
- 2224
-
Comparison of SEUTool results to experimental results in boeing radiation tolerant DSP (BDSP C30)Duncan, A.R. / Srinivasan, V. / Sternberg, A.L. / Robinson, W.H. / Bhuva, B.L. / Massengill, L.W. et al. | 2005
- 2224
-
SESSION A - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Comparison of SEUTool Results to Experimental Results in Boeing Radiation Tolerant DSP (BDSP C30)Duncan, A.R. et al. | 2005
- 2231
-
SESSION B - BASIC MECHANISMS OF RADIATION EFFECTS - Bias-Temperature Instabilities and Radiation Effects in MOS DevicesZhou, X.J. et al. | 2005
- 2231
-
Bias-temperature instabilities and radiation effects in MOS devicesZhou, X.J. / Fleetwood, D.M. / Felix, J.A. / Gusev, E.P. / D'Emic, C. et al. | 2005
- 2239
-
Proton-induced damage in gallium nitride-based Schottky diodesKarmarkar, A.P. / White, B.D. / Buttari, D. / Fleetwood, D.M. / Schrimpf, R.D. / Weller, R.A. / Brillson, L.J. / Mishra, U.K. et al. | 2005
- 2239
-
SESSION B - BASIC MECHANISMS OF RADIATION EFFECTS - Proton-Induced Damage in Gallium Nitride-Based Schottky DiodesKarmarkar, A.P. et al. | 2005
- 2245
-
SESSION B - BASIC MECHANISMS OF RADIATION EFFECTS - Estimation and Verification of Radiation Induced Not and Nit Energy Distribution Using Combined Bipolar and MOS Characterization Methods in Gated Bipolar DevicesChen, X.J. et al. | 2005
- 2245
-
Estimation and Verification of Radiation Induced N~o~t and N~i~t Energy Distribution Using Combined Bipolar and MOS Characterization Methods in Gated Bipolar DevicesChen, X. J. / Barnaby, H. J. / Pease, R. L. / Schrimpf, R. D. / Platteter, D. / Shaneyfelt, M. / Vermeire, B. et al. | 2005
- 2245
-
Estimation and verification of radiation induced N/sub ot/ and N/sub it/ energy distribution using combined bipolar and MOS characterization methods in gated bipolar devicesChen, X.J. / Barnaby, H.J. / Pease, R.L. / Schrimpf, R.D. / Platteter, D. / Shaneyfelt, M. / Vermeire, B. et al. | 2005
- 2252
-
Electrical stresses on ultra-thin gate oxide SOI MOSFETs after irradiationCester, A. / Gerardin, S. / Paccagnella, A. / Simoen, E. / Claeys, C. et al. | 2005
- 2252
-
SESSION B - BASIC MECHANISMS OF RADIATION EFFECTS - Electrical Stresses on Ultra-Thin Gate Oxide SOI MOSFETs After IrradiationCester, A. et al. | 2005
- 2259
-
SESSION B - BASIC MECHANISMS OF RADIATION EFFECTS - Two-Dimensional Methodology for Modeling Radiation-Induced Off-State Leakage in CMOS TechnologiesEsqueda, I.S. et al. | 2005
- 2259
-
Two-dimensional methodology for modeling radiation-induced off-state leakage in CMOS technologiesEsqueda, I.S. / Barnaby, H.J. / Alles, M.L. et al. | 2005
- 2265
-
Common origin for enhanced low-dose-rate sensitivity and bias temperature instability under negative biasTsetseris, L. / Schrimpf, R.D. / Fleetwood, D.M. / Pease, R.L. / Pantelides, S.T. et al. | 2005
- 2265
-
SESSION B - BASIC MECHANISMS OF RADIATION EFFECTS - Common Origin for Enhanced Low-Dose-Rate Sensitivity and Bias Temperature Instability Under Negative BiasTsetseris, L. et al. | 2005
- 2272
-
Identification of the Atomic Scale Defects Involved in Radiation Damage in HfO2 Based MOS DevicesRyan, J.T. et al. | 2005
- 2272
-
Identification of the atomic scale defects involved in radiation damage in HfO/sub 2/ based MOS devicesRyan, J.T. / Lenahan, P.M. / Kang, A.Y. / Conley, J.F. / Bersuker, G. / Lysaght, P. et al. | 2005
- 2276
-
Criteria for identifying radiation resistant semiconductor materialsMessenger, S.R. / Burke, E.A. / Summers, G.P. / Walters, R.J. / Warner, J.H. et al. | 2005
- 2276
-
SESSION B - BASIC MECHANISMS OF RADIATION EFFECTS - Criteria for Identifying Radiation Resistant Semiconductor MaterialsMessenger, S.R. et al. | 2005
- 2281
-
SESSION C - SPACE RADIATION ENVIRONMENTS AND EFFECTS - High-Energy Trapped Particle Environments at Jupiter: An UpdateJun, I. et al. | 2005
- 2281
-
High-energy trapped particle environments at Jupiter: an updateInsoo Jun, / Garrett, H.B. / Evans, R.W. et al. | 2005
- 2287
-
A model for Mars radiation environment characterizationKeating, A. / Mohammadzadeh, A. / Nieminen, P. / Maia, D. / Coutinho, S. / Evans, H. / Pimenta, M. / Huot, J.-P. / Daly, E. et al. | 2005
- 2287
-
SESSION C - SPACE RADIATION ENVIRONMENTS AND EFFECTS - A Model for Mars Radiation Environment CharacterizationKeating, A. et al. | 2005
- 2294
-
SESSION C - SPACE RADIATION ENVIRONMENTS AND EFFECTS - GRAS: A General-Purpose 3-D Modular Simulation Tool for Space Environment Effects AnalysisSantin, G. et al. | 2005
- 2294
-
GRAS: a general-purpose 3-D Modular Simulation tool for space environment effects analysisSantin, G. / Ivanchenko, V. / Evans, H. / Nieminen, P. / Daly, E. et al. | 2005
- 2300
-
Microdosimetry of the ultraviolet erasable programmable read-only memory experiment on the microelectronics and photonics test bed: recent advances in small-volume analysisScheick, L.Z. / Blake, B. / McNulty, P.J. et al. | 2005
- 2300
-
SESSION C - SPACE RADIATION ENVIRONMENTS AND EFFECTS - Microdosimetry of the Ultraviolet Erasable Programmable Read-Only Memory Experiment on the Microelectronics and Photonics Test Bed: Recent Advances in Small-Volume AnalysisScheick, L.Z. et al. | 2005
- 2307
-
Space weather forecasting at the new Athens center: the recent extreme events of January 2005Mavromichalaki, H. / Gerontidou, M. / Mariatos, G. / Plainaki, C. / Papaioannou, A. / Sarlanis, C. / Souvatzoglou, G. / Belov, A. / Eroshenko, E. / Yanke, V. et al. | 2005
- 2307
-
SESSION C - SPACE RADIATION ENVIRONMENTS AND EFFECTS - Space Weather Forecasting at the New Athens Center: The Recent Extreme Events of January 2005Mavromichalaki, H. et al. | 2005
- 2313
-
Parameterization of neutron-induced SER in bulk SRAMs from reverse Monte Carlo SimulationsWrobel, F. / Iacconi, P. et al. | 2005
- 2313
-
SESSION D - TERRESTRIAL AND ATMOSPHERIC RADIATION ENVIRONMENTS AND EFFECTS - Parameterization of Neutron-Induced SER in Bulk SRAMs From Reverse Monte Carlo SimulationsWrobel, F. et al. | 2005
- 2319
-
SESSION D - TERRESTRIAL AND ATMOSPHERIC RADIATION ENVIRONMENTS AND EFFECTS - Neutron and Proton-Induced Single Event Upsets in Advanced Commercial Fully Depleted SOI SRAMsBaggio, J. et al. | 2005
- 2319
-
Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMsBaggio, J. / Ferlet-Cavrois, V. / Lambert, D. / Paillet, P. / Wrobel, F. / Hirose, K. / Saito, H. / Blackmore, E.W. et al. | 2005
- 2326
-
Measurements of the atmospheric radiation environment from CREAM and comparisons with models for quiet time and solar particle eventsDyer, C. / Lei, F. / Hands, A. / Clucas, S. / Jones, B. et al. | 2005
- 2326
-
SESSION D - TERRESTRIAL AND ATMOSPHERIC RADIATION ENVIRONMENTS AND EFFECTS - Measurements of the Atmospheric Radiation Environment From CREAM and Comparisons With Models for Quiet Time and Solar Particle EventsDyer, C. et al. | 2005
- 2332
-
SESSION D - TERRESTRIAL AND ATMOSPHERIC RADIATION ENVIRONMENTS AND EFFECTS - Neutron-Induced SEU in SRAMs: Simulations With n-Si and n-O InteractionsLambert, D. et al. | 2005
- 2332
-
Neutron-induced SEU in SRAMs: Simulations with n-Si and n-O interactionsLambert, D. / Baggio, J. / Hubert, G. / Ferlet-Cavrois, V. / Flament, O. / Saigne, F. / Wrobel, F. / Duarte, H. / Boch, J. / Sagnes, B. et al. | 2005
- 2340
-
A conformal coating for shielding against naturally occurring thermal neutronsSpratt, J.P. / Aghara, S. / Fu, B. / Lichtenhan, J.D. / Leadon, R. et al. | 2005
- 2340
-
SESSION D - TERRESTRIAL AND ATMOSPHERIC RADIATION ENVIRONMENTS AND EFFECTS - A Conformal Coating for Shielding Against Naturally Occurring Thermal NeutronsSpratt, J.P. et al. | 2005
- 2345
-
Total ionizing dose effects on deca-nanometer fully depleted SOI devicesPaillet, P. / Gaillardin, M. / Ferlet-Cavrois, V. / Torres, A. / Faynot, O. / Jahan, C. / Tosti, L. / Cristoloveanu, S. et al. | 2005
- 2345
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Total Ionizing Dose Effects on Deca-Nanometer Fully Depleted SOI DevicesPaillet, P. et al. | 2005
- 2353
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Proton Radiation Effects in Vertical SiGe HBTs Fabricated on CMOS-Compatible SOIChen, T. et al. | 2005
- 2353
-
Proton radiation effects in vertical SiGe HBTs fabricated on CMOS-compatible SOITianbing Chen, / Sutton, A.K. / Bellini, M. / Haugerud, B.M. / Comeau, J.P. / Qingqing Liang, / Cressler, J.D. / Jin Cai, / Ning, T.H. / Marshall, P.W. et al. | 2005
- 2358
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - A Comparison of Gamma and Proton Radiation Effects in 200 GHz SiGe HBTsSutton, A.K. et al. | 2005
- 2358
-
A comparison of gamma and proton radiation effects in 200 GHz SiGe HBTsSutton, A.K. / Haugerud, B.M. / Prakash, A.P.G. / Bongim Jun, / Cressler, J.D. / Marshall, C.J. / Marshall, P.W. / Ladbury, R. / Guarin, F. / Joseph, A.J. et al. | 2005
- 2366
-
Effects of heavy ion exposure on nanocrystal nonvolatile memoryOldham, T.R. / Suhail, M. / Kuhn, P. / Prinz, E. / Kim, H.S. / LaBel, K.A. et al. | 2005
- 2366
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Effects of Heavy Ion Exposure on Nanocrystal Nonvolatile MemoryOldham, T.R. et al. | 2005
- 2372
-
Effect of different total ionizing dose sources on charge loss from programmed floating gate cellsCellere, G. / Paccagnella, A. / Visconti, A. / Bonanomi, M. / Candelori, A. / Lora, S. et al. | 2005
- 2372
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Effect of Different Total Ionizing Dose Sources on Charge Loss From Programmed Floating Gate CellsCellere, G. et al. | 2005
- 2378
-
Radiation-induced off-state leakage current in commercial power MOSFETsFelix, J.A. / Shaneyfelt, M.R. / Dodd, P.E. / Draper, B.L. / Schwank, J.R. / Dalton, S.M. et al. | 2005
- 2378
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Radiation-Induced Off-State Leakage Current in Commercial Power MOSFETsFelix, J.A. et al. | 2005
- 2387
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Arsenic Ion Implant Energy Effects on CMOS Gate Oxide HardnessDraper, B.L. et al. | 2005
- 2387
-
Arsenic ion implant energy effects on CMOS gate oxide hardnessDraper, B.L. / Shaneyfelt, M.R. / Young, R.W. / Headley, T.J. / Dondero, R. et al. | 2005
- 2392
-
Effect of high-temperature electron irradiation in thin gate oxide FD-SOI n-MOSFETsHayama, K. / Takakura, K. / Ohyama, H. / Rafi, J.M. / Simoen, E. / Mercha, A. / Claeys, C. et al. | 2005
- 2392
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Effect of High-Temperature Electron Irradiation in Thin Gate Oxide FD-SOI n-MOSFETsHayama, K. et al. | 2005
- 2398
-
Total dose radiation response of CMOS compatible SOI MESFETsSpann, J. / Kushner, V. / Thornton, T.J. / Jinman Yang, / Balijepalli, A. / Barnaby, H.J. / Xiao Jie Chen, / Alexander, D. / Kemp, W.T. / Sampson, S.J. et al. | 2005
- 2398
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Total Dose Radiation Response of CMOS Compatible SOI MESFETsSpann, J. et al. | 2005
- 2403
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - The Effects of Proton Irradiation on the Operating Voltage Constraints of SiGe HBTsGrens, C.M. et al. | 2005
- 2403
-
The effects of proton irradiation on the operating voltage constraints of SiGe HBTsGrens, C.M. / Haugerud, B.M. / Sutton, A.K. / Tianbing Chen, / Cressler, J.D. / Marshall, P.W. / Marshall, C.J. / Joseph, A.J. et al. | 2005
- 2408
-
Displacement damage effects on the forward bias characteristics of SiC Schottky barrier power diodesHarris, R.D. / Frasca, A.J. / Patton, M.O. et al. | 2005
- 2408
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Displacement Damage Effects on the Forward Bias Characteristics of SiC Schottky Barrier Power DiodesHarris, R.D. et al. | 2005
- 2413
-
Radiation-induced edge effects in deep submicron CMOS transistorsFaccio, F. / Cervelli, G. et al. | 2005
- 2413
-
SESSION E - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Radiation-Induced Edge Effects in Deep Submicron CMOS TransistorsFaccio, F. et al. | 2005
- 2421
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Single-Event Upset in Flip-Chip SRAM Induced by Through-Wafer, Two-Photon AbsorptionMcMorrow, D. et al. | 2005
- 2421
-
Single-event upset in flip-chip SRAM induced by through-wafer, two-photon absorptionMcMorrow, D. / Lotshaw, W.T. / Melinger, J.S. / Buchner, S. / Davis, J.D. / Lawrence, R.K. / Bowman, J.H. / Brown, R.D. / Carlton, D. / Pena, J. et al. | 2005
- 2426
-
Effects of technology scaling on the SET sensitivity of RF CMOS Voltage-controlled oscillatorsBoulghassoul, Y. / Massengill, L.W. / Sternberg, A.L. / Bhuva, B.L. et al. | 2005
- 2426
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Effects of Technology Scaling on the SET Sensitivity of RF CMOS Voltage-Controlled OscillatorsBoulghassoul, Y. et al. | 2005
- 2433
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Investigation of Multi-Bit Upsets in a 150 nm Technology SRAM DeviceRadaelli, D. et al. | 2005
- 2433
-
Investigation of multi-bit upsets in a 150 nm technology SRAM deviceRadaelli, D. / Puchner, H. / Skip Wong, / Daniel, S. et al. | 2005
- 2438
-
SEU-induced persistent error propagation in FPGAsMorgan, K. / Caffrey, M. / Graham, P. / Johnson, E. / Pratt, B. / Wirthlin, M. et al. | 2005
- 2438
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - SEU-Induced Persistent Error Propagation in FPGAsMorgan, K. et al. | 2005
- 2446
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Autonomous Bit Error Rate Testing at Multi-Gbit-s Rates Implemented in a 5AM SiGe Circuit for Radiation Effects Self Test (CREST)Marshall, P. et al. | 2005
- 2446
-
Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)Marshall, P. / Carts, M. / Currie, S. / Reed, R. / Randall, B. / Fritz, K. / Kennedy, K. / Berg, M. / Krithivasan, R. / Siedleck, C. et al. | 2005
- 2455
-
Radiation-induced multi-bit upsets in SRAM-based FPGAsQuinn, H. / Graham, P. / Krone, J. / Caffrey, M. / Rezgui, S. et al. | 2005
- 2455
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Radiation-Induced Multi-Bit Upsets in SRAM-Based FPGAsQuinn, H. et al. | 2005
- 2462
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - SEU Sensitivity of Virtex Configuration LogicAlderighi, M. et al. | 2005
- 2462
-
SEU sensitivity of virtex configuration logicAlderighi, M. / Candelori, A. / Casini, F. / D'Angelo, S. / Mancini, M. / Paccagnella, A. / Pastore, S. / Sechi, G.R. et al. | 2005
- 2468
-
Complex upset mitigation applied to a Re-configurable embedded processorRezgui, S. / Swift, G. / Somervill, K. / George, J. / Carmichael, C. / Allen, G. et al. | 2005
- 2468
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Complex Upset Mitigation Applied to a Re-Configurable Embedded ProcessorRezgui, S. et al. | 2005
- 2475
-
Catastrophic latchup in a CMOS operational amplifierIrom, F. / Miyahira, T.F. et al. | 2005
- 2475
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Catastrophic Latchup in a CMOS Operational AmplifierIrom, F. et al. | 2005
- 2481
-
Asymmetric SEU in SOI SRAMsMcMarr, P.J. / Nelson, M.E. / Liu, S.T. / Nelson, D. / Delikat, K.J. / Gouker, P. / Tyrrell, B. / Hughes, H. et al. | 2005
- 2481
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Asymmetric SEU in SOI SRAMsMcMarr, P.J. et al. | 2005
- 2487
-
Laser Simulation of single event effects in pulse width ModulatorsChugg, A.M. / Jones, R. / Moutrie, M.J. / Duncan, P.H. / Sorensen, R.H. / Mattsson, S. / Larsson, S. / Fitzgerald, R. / O'Shea, T. et al. | 2005
- 2487
-
SESSION F - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Laser Simulation of Single Event Effects in Pulse Width ModulatorsChugg, A.M. et al. | 2005
- 2495
-
A new total-dose-induced parasitic effect in enclosed-geometry transistorsNowlin, R.N. / McEndree, S.R. / Wilson, A.L. / Alexander, D.R. et al. | 2005
- 2495
-
SESSION G - HARDNESS BY DESIGN - A New Total-Dose-Induced Parasitic Effect in Enclosed-Geometry TransistorsNowlin, R.N. et al. | 2005
- 2503
-
Reducing radiation-hardened DigitalCircuit power consumptionMcIver, J.K. / Clark, L.T. et al. | 2005
- 2503
-
SESSION G - HARDNESS BY DESIGN - Reducing Radiation Hardened Digital Circuit Power ConsumptionMcIver III, J.K. et al. | 2005
- 2510
-
HBD using cascode-Voltage switch logic gates for SET tolerant digital designsCasey, M.C. / Bhuva, B.L. / Black, J.D. / Massengill, L.W. et al. | 2005
- 2510
-
SESSION G - HARDNESS BY DESIGN - HBD Using Cascode-Voltage Switch Logic Gates for SET Tolerant Digital DesignsCasey, M.C. et al. | 2005
- 2516
-
Single-event mitigation in combinational logic using targeted data path hardeningSrinivasan, V. / Sternberg, A.L. / Duncan, A.R. / Robinson, W.H. / Bhuva, B.L. / Massengill, L.W. et al. | 2005
- 2516
-
SESSION G - HARDNESS BY DESIGN - Single-Event Mitigation in Combinational Logic Using Targeted Data Path HardeningSrinivasan, V. et al. | 2005
- 2524
-
Hardness-by-Design Approach for 0.15 mum Fully Depleted CMOS/SOI Digital Logic Devices With Enhanced SEU/SET ImmunityMakihara, A. / Midorikawa, M. / Yamaguchi, T. / Iide, Y. / Yokose, T. / Tsuchiya, Y. / Arimitsu, T. / Asai, H. / Shindou, H. / Kuboyama, S. et al. | 2005
- 2524
-
Hardness-by-design approach for 0.15 /spl mu/m fully depleted CMOS/SOI digital logic devices with enhanced SEU/SET immunityMakihara, A. / Midorikawa, M. / Yamaguchi, T. / Iide, Y. / Yokose, T. / Tsuchiya, Y. / Arimitsu, T. / Asai, H. / Shindou, H. / Kuboyama, S. et al. | 2005
- 2524
-
SESSION G - HARDNESS BY DESIGN - Hardness-by-Design Approach for 0.15 mm Fully Depleted CMOS-SOI Digital Logic Devices With Enhanced SEU-SET ImmunityMakihara, A. et al. | 2005
- 2531
-
RHBD techniques for mitigating effects of single-event hits using guard-gatesBalasubramanian, A. / Bhuva, B.L. / Black, J.D. / Massengill, L.W. et al. | 2005
- 2531
-
SESSION G - HARDNESS BY DESIGN - RHBD Techniques for Mitigating Effects of Single-Event Hits Using Guard-GatesBalasubramanian, A. et al. | 2005
- 2536
-
HBD layout isolation techniques for multiple node charge collection mitigationBlack, J.D. / Sternberg, A.L. / Alles, M.L. / Witulski, A.F. / Bhuva, B.L. / Massengill, L.W. / Benedetto, J.M. / Baze, M.P. / Wert, J.L. / Hubert, M.G. et al. | 2005
- 2536
-
SESSION G - HARDNESS BY DESIGN - HBD Layout Isolation Techniques for Multiple Node Charge Collection MitigationBlack, J.D. et al. | 2005
- 2542
-
Accurate SPICE models for CMOS analog radiation-hardness-by-designChampion, C.L. / La Rue, G.S. et al. | 2005
- 2542
-
SESSION G - HARDNESS BY DESIGN - Accurate SPICE Models for CMOS Analog Radiation-Hardness-by-DesignChampion, C.L. et al. | 2005
- 2550
-
SEU performance of TAG based flip-flopsShuler, R.L. / Kouba, C. / O'Neill, P.M. et al. | 2005
- 2550
-
SESSION G - HARDNESS BY DESIGN - SEU Performance of TAG Based Flip-FlopsShuler, R.L. et al. | 2005
- 2554
-
Semiconductor materials and detectors for future very high luminosity collidersCandelori, A. et al. | 2005
- 2554
-
SESSION H - DOSIMETRY AND FACILITIES - Semiconductor Materials and Detectors for Future Very High Luminosity CollidersCandelori, A. et al. | 2005
- 2562
-
Edge-on face-to-face MOSFET for synchrotron microbeam dosimetry: MC modelingRosenfeld, A.B. / Siegbahn, E.A. / Brauer-Krish, E. / Holmes-Siedle, A. / Lerch, M.L.F. / Bravin, A. / Cornelius, I.M. / Takacs, G.J. / Painuly, N. / Nettelback, H. et al. | 2005
- 2562
-
SESSION H - DOSIMETRY AND FACILITIES - Edge-on Face-to-Face MOSFET for Synchrotron Microbeam Dosimetry: MC ModelingRosenfeld, A.B. et al. | 2005
- 2570
-
SESSION H - DOSIMETRY AND FACILITIES - The Role of Fixed and Switching Traps in Long-Term Fading of Implanted and Unimplanted Gate Oxide RADFETs.Haran, A. et al. | 2005
- 2570
-
The role of fixed and switching traps in long-term fading of implanted and unimplanted gate oxide RADFETsHaran, A. / Jaksic, A. et al. | 2005
- 2578
-
Online dosimetry based on optically stimulated luminescence materialsVaille, J.-R. / Ravotti, F. / Garcia, P. / Glaser, M. / Matias, S. / Idri, K. / Boch, J. / Lorfevre, E. / McNulty, P.J. / Saigne, F. et al. | 2005
- 2578
-
SESSION H - DOSIMETRY AND FACILITIES - Online Dosimetry Based on Optically Stimulated Luminescence MaterialsVaillé, J.-R. et al. | 2005
- 2583
-
Response of lead metaniobate acoustic emission sensors to gamma irradiationHolbert, K.E. / Sankaranarayanan, S. / McCready, S.S. et al. | 2005
- 2583
-
SESSION H - DOSIMETRY AND FACILITIES - Response of Lead Metaniobate Acoustic Emission Sensors to Gamma IrradiationHolbert, K.E. et al. | 2005
- 2591
-
SESSION H - DOSIMETRY AND FACILITIES - Microdosimetry Simulations of Solar Protons Within a SpacecraftWroe, A.J. et al. | 2005
- 2591
-
Microdosimetry simulations of solar protons within a spacecraftWroe, A.J. / Cornelius, I.M. / Rosenfeld, A.B. / Pisacane, V.L. / Ziegler, J.F. / Nelson, M.E. / Cucinotta, F. / Zaider, M. / Dicello, J.F. et al. | 2005
- 2597
-
Improvements in resolution and dynamic range for FGMOS dosimetryMcNulty, P.J. / Poole, K.F. / Crisler, M. / Reneau, J. / Cellere, G. / Paccagnella, A. / Stroebel, D. / Fennell, M. / Perez, R. / Randall, M. et al. | 2005
- 2597
-
SESSION H - DOSIMETRY AND FACILITIES - Improvements in Resolution and Dynamic Range for FGMOS DosimetryMcNulty, P.J. et al. | 2005
- 2602
-
Dose-rate sensitivity of modern nMOSFETsWitczak, S.C. / Lacoe, R.C. / Osborn, J.V. / Hutson, J.M. / Moss, S.C. et al. | 2005
- 2602
-
SESSION I - HARDNESS ASSURANCE - Dose-Rate Sensitivity of Modern nMOSFETsWitczak, S.C. et al. | 2005
- 2609
-
SESSION I - HARDNESS ASSURANCE - Evaluating TM1019.6 ELDRS Screening Methods Using Gated Lateral PNP TransistorsNowlin, R.N. et al. | 2005
- 2609
-
Evaluating TM1019.6 ELDRS screening methods using gated lateral PNP transistorsNowlin, R.N. / Pease, R.L. / Platteter, D.G. / Dunham, G.W. / Seiler, J.E. et al. | 2005
- 2616
-
SESSION I - HARDNESS ASSURANCE - Estimation of Low-Dose-Rate Degradation on Bipolar Linear Integrated Circuits Using Switching ExperimentsBoch, J. et al. | 2005
- 2616
-
Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experimentsBoch, J. / Saigne, F. / Schrimpf, R.D. / Vaille, J.-R. / Dusseau, L. / Ducret, S. / Bernard, M. / Lorfevre, E. / Chatry, C. et al. | 2005
- 2622
-
Effects of particle energy on proton-induced single-event latchupSchwank, J.R. / Shaneyfelt, M.R. / Baggio, J. / Dodd, P.E. / Felix, J.A. / Ferlet-Cavrois, V. / Paillet, P. / Lambert, D. / Sexton, F.W. / Hash, G.L. et al. | 2005
- 2622
-
SESSION I - HARDNESS ASSURANCE - Effects of Particle Energy on Proton-Induced Single-Event LatchupSchwank, J.R. et al. | 2005
- 2630
-
Statistical methods for large flight lots and ultra-high reliability applicationsLadbury, R. / Gorelick, J.L. et al. | 2005
- 2630
-
SESSION I - HARDNESS ASSURANCE - Statistical Methods for Large Flight Lots and Ultra-High Reliability ApplicationsLadbury, R. et al. | 2005
- 2638
-
Local and pseudo SELs observed in digital LSIs and their implication to SEL test methodShindou, H. / Kuboyama, S. / Hirao, T. / Matsuda, S. et al. | 2005
- 2638
-
SESSION I - HARDNESS ASSURANCE - Local and Pseudo SEL's Observed in Digital LSI's and Their Implication to SEL Test MethodShindou, H. et al. | 2005
- 2642
-
SESSION I - HARDNESS ASSURANCE - The Effects of Aging on MOS Irradiation and Annealing ResponseRodgers, M.P. et al. | 2005
- 2642
-
The effects of aging on MOS irradiation and annealing responseRodgers, M.P. / Fleetwood, D.M. / Schrimpf, R.D. / Batyrev, I.G. / Wang, S. / Pantelides, S.T. et al. | 2005
- 2649
-
Hardness assurance methods for radiation degradation of optocouplersJohnston, A.H. / Miyahira, T.F. et al. | 2005
- 2649
-
SESSION J - PHOTONICS - Hardness Assurance Methods for Radiation Degradation of OptocouplersJohnston, A.H. et al. | 2005
- 2657
-
Transient radiation effects in ultra-low noise HgCdTe IR detector arrays for space-based astronomyPickel, J.C. / Reed, R.A. / Ladbury, R. / Marshall, P.W. / Jordan, T.M. / Gee, G. / Fodness, B. / McKelvey, M. / McMurray, R. / Kim Ennico, et al. | 2005
- 2657
-
SESSION J - PHOTONICS - Transient Radiation Effects in Ultra-Low Noise HgCdTe IR Detector Arrays for Space-Based AstronomyPickel, J.C. et al. | 2005
- 2664
-
Radiation effects on astrometric CCDs at low operating temperaturesHopkinson, G.R. / Short, A. / Vetel, C. / Zayer, I. / Holland, A.D. et al. | 2005
- 2664
-
SESSION J - PHOTONICS - Radiation Effects on Astrometric CCDs at Low Operating TemperaturesHopkinson, G. et al. | 2005
- 2672
-
Hot Pixel Annealing Behavior in CCDs Irradiated at -84^oCMarshall, C. J. / Marshall, P. W. / Waczynski, A. / Polidan, E. J. / Johnson, S. D. / Kimble, R. A. / Reed, R. A. / Delo, G. / Schlossberg, D. / Russell, A. M. et al. | 2005
- 2672
-
Hot pixel annealing behavior in CCDs irradiated at -84 degrees CMarshall, C.J. / Marshall, P.W. / Waczynski, A. / Polidan, E.J. / Johnson, S.D. / Kimble, R.A. / Reed, R.A. / Delo, G. / Schlossberg, D. / Russell, A.M. et al. | 2005
- 2672
-
Hot pixel annealing behavior in CCDs irradiated at -84/spl deg/CMarshall, C.J. / Marshall, P.W. / Waczynski, A. / Polidan, E.J. / Johnson, S.D. / Kimble, R.A. / Reed, R.A. / Delo, G. / Schlossberg, D. / Russell, A.M. et al. | 2005
- 2672
-
SESSION J - PHOTONICS - Hot Pixel Annealing Behavior in CCDs Irradiated at -84(degree)CMarshall, C.J. et al. | 2005
- 2678
-
Displacement damage correlation of proton and silicon ion radiation in GaAsWarner, J.H. / Messenger, S.R. / Walters, R.J. / Summers, G.P. et al. | 2005
- 2678
-
SESSION J - PHOTONICS - Displacement Damage Correlation of Proton and Silicon Ion Radiation in GaAsWarner, J.H. et al. | 2005
- 2683
-
SESSION J - PHOTONICS - Radiation-Induced Effects in a New Class of Optical Waveguides: The Air-Guiding Photonic Crystal FibersGirard, S. et al. | 2005
- 2683
-
Radiation-induced effects in a new class of optical waveguides: the air-guiding photonic crystal fibersGirard, S. / Baggio, J. / Leray, J.-L. et al. | 2005
- 2689
-
Radiation-tolerant Raman distributed temperature monitoring system for large nuclear infrastructuresFernandez, A.F. / Rodeghiero, P. / Brichard, B. / Berghmans, F. / Hartog, A.H. / Hughes, P. / Williams, K. / Leach, A.P. et al. | 2005
- 2689
-
SESSION J - PHOTONICS - Radiation-Tolerant Raman Distributed Temperature Monitoring System for Large Nuclear InfrastructuresFernandez, A.Fernandez et al. | 2005
- 2695
-
Proton damage effects in high performance P-channel CCDsSpratt, J.P. / Conger, C. / Bredthauer, R. / Byers, W. / Groulx, R. / Leadon, R. / Clark, H. et al. | 2005
- 2695
-
SESSION J - PHOTONICS - Proton Damage Effects in High Performance P-Channel CCDsSpratt, J.P. et al. | 2005
- 2703
-
CORRECTION - Correction to "Measurement of the Flux and Energy Spectrum of Cosmic-Ray Induced Neutrons on the Ground"Gordon, M.S. et al. | 2005
- 2703
-
Correction to “Measurement of the Flux and Energy Spectrum of Cosmic-Ray Induced Neutrons on the Ground”Gordon, M.S. / Goldhagen, P. / Rodbell, K.P. / Zabel, T.H. / Tang, H.H.K. / Clem, J.M. / Bailey, P. et al. | 2005
- 2704
-
Conference Author Index| 2005
- 2704
-
2005 NSREC Conference Author Index| 2005
- 2707
-
Have you visited lately? www.ieee.org| 2005
- 2708
-
Order Form for Reprints| 2005
- 2713
-
ANALOG AND DIGITAL CIRCUITS - Fast CMOS Binary Front End for Silicon Strip Detectors at LHC ExperimentsKaplon, J. et al. | 2005
- 2713
-
Fast CMOS binary front end for silicon strip detectors at LHC experimentsKaplon, J. / Dabrowski, W. et al. | 2005
- 2721
-
Realization of serial powering of ATLAS pixel modulesStockmanns, T. / Fischer, P. / Hugging, F. / Peric, I. / Runolfsson, O. / Duc Bao Ta, / Wermes, N. et al. | 2005
- 2721
-
ANALOG AND DIGITAL CIRCUITS - Realization of Serial Powering of ATLAS Pixel ModulesStockmanns, T. et al. | 2005
- 2726
-
ANALOG AND DIGITAL CIRCUITS - The DIALOG Chip in the Front-End Electronics of the LHCb Muon DetectorCadeddu, S. et al. | 2005
- 2726
-
The DIALOG chip in the front-end electronics of the LHCb muon detectorCadeddu, S. / Deplano, C. / Lai, A. et al. | 2005
- 2733
-
Survey of noise performances and scaling effects in deep submicrometer CMOS devices from different foundriesRe, V. / Manghisoni, M. / Ratti, L. / Speziali, V. / Traversi, G. et al. | 2005
- 2733
-
ANALOG AND DIGITAL CIRCUITS - Survey of Noise Performances and Scaling Effects in Deep Submicrometer CMOS Devices From Different FoundriesRe, V. et al. | 2005
- 2741
-
ANALOG AND DIGITAL CIRCUITS - Parallel Hardware Implementation of RADAR Electronics Equipment for a LASER Inspection SystemNeri, C. et al. | 2005
- 2741
-
Parallel hardware implementation of RADAR electronics equipment for a LASER inspection systemNeri, C. / Baccarelli, G. / Bertazzoni, S. / Pollastrone, F. / Salmeri, M. et al. | 2005
- 2749
-
Design and performance of the soft gamma-ray detector for the NeXT missionTajima, H. / Kamae, T. / Madejski, G. / Mitani, T. / Nakazawa, K. / Tanaka, T. / Takahashi, T. / Watanabe, S. / Fukazawa, Y. / Ikagawa, T. et al. | 2005
- 2749
-
ASTROPHYSICS AND SPACE INSTRUMENTATION - Design and Performance of the Soft Gamma-Ray Detector for the NeXT MissionTajima, H. et al. | 2005
- 2758
-
ASTROPHYSICS AND SPACE INSTRUMENTATION - Preflight Calibration and Performance of the Astro-E2-HXD-II Wide-Band All-Sky MonitorOhno, M. et al. | 2005
- 2758
-
Preflight calibration and performance of the astro-E2/HXD-II wide-band all-sky monitorOhno, M. / Fukazawa, Y. / Yamaoka, K. / Kokubun, M. / Terada, Y. / Kotoku, J. / Okada, Y. / Soojing Hong, / Mori, M. / Tsutsui, A. et al. | 2005
- 2765
-
ASTROPHYSICS AND SPACE INSTRUMENTATION - Development of the HXD-II Wide-Band All-Sky Monitor Onboard Astro-E2Yamaoka, K. et al. | 2005
- 2765
-
Development of the HXD-II wide-band all-sky monitor onboard Astro-E2Yamaoka, K. / Ohno, M. / Terada, Y. / Hong, S. / Kotoku, J. / Okada, Y. / Tsutsui, A. / Endo, Y. / Abe, K. / Fukazawa, Y. et al. | 2005
- 2773
-
UHE cosmic ray detection with the Pierre Auger observatoryKleifges, M. / Gemmeke, H. et al. | 2005
- 2773
-
ASTROPHYSICS AND SPACE INSTRUMENTATION - UHE Cosmic Ray Detection With the Pierre Auger ObservatoryKleifges, M. et al. | 2005
- 2778
-
The ECLAIRs micro-satellite for multi-wavelength studies of gamma-ray burst prompt emissionSchanne, S. / Atteia, J.-L. / Barret, D. / Basa, S. / Boer, M. / Cordier, B. / Daigne, F. / Ealet, A. / Goldoni, P. / Klotz, A. et al. | 2005
- 2778
-
ASTROPHYSICS AND SPACE INSTRUMENTATION - The ECLAIR'S Micro-Satellite for Multi-Wavelength Studies of Gamma-Ray Burst Prompt EmissionSchanne, S. et al. | 2005
- 2786
-
The alpha magnetic spectrometer on the International Space StationBorgia, B. et al. | 2005
- 2786
-
ASTROPHYSICS AND SPACE INSTRUMENTATION - The Alpha Magnetic Spectrometer on the International Space StationBorgia, B. et al. | 2005
- 2793
-
ASTROPHYSICS AND SPACE INSTRUMENTATION - Performance of a Chamber for Studying the Liquid Xenon Response to g-Rays and Nuclear RecoilsNeves, F. et al. | 2005
- 2793
-
Performance of a Chamber for Studying the Liquid Xenon Response to gamma-Rays and Nuclear RecoilsNeves, F. / Chepel, V. / Solovov, V. / Pereira, A. / Lopes, M. I. / da Cunha, J. P. / Mendes, P. / Lindote, A. / Silva, C. P. / Marques, R. F. et al. | 2005
- 2793
-
Performance of a chamber for studying the liquid xenon response to /spl gamma/-rays and nuclear recoilsNeves, F. / Chepel, V. / Solovov, V. / Pereira, A. / Lopes, M.I. / da Cunha, J.P. / Mendes, P. / Lindote, A. / Silva, C.P. / Marques, R.F. et al. | 2005
- 2801
-
ASTROPHYSICS AND SPACE INSTRUMENTATION - The Data Acquisition System of the Stockholm Educational Air Shower ArrayHofverberg, P. et al. | 2005
- 2801
-
The data acquisition system of the Stockholm educational air shower arrayHofverberg, P. / Johansson, H. / Pearce, M. / Rydstrom, S. / Wikstrom, C. et al. | 2005
- 2810
-
The effects of positron binding and annihilation mechanisms in biomolecules on PET resolutionPichl, L. / Tachikawa, M. / Buenker, R.J. / Kimura, M. / Rost, J.-M. et al. | 2005
- 2810
-
BIOLOGICAL MEDICAL IMAGING - The Effects of Positron Binding and Annihilation Mechanisms in Biomolecules on PET ResolutionPichl, L. et al. | 2005
- 2818
-
COMPUTING AND SOFTWARE - Developments of Mathematical Software Libraries for the LHC ExperimentsHatlo, M. et al. | 2005
- 2818
-
Developments of mathematical software libraries for the LHC experimentsHatlo, M. / James, F. / Mato, P. / Moneta, L. / Winkler, M. / Zsenei, A. et al. | 2005
- 2823
-
The LCG PI project: using interfaces for physics data analysisPfeiffer, A. / Moneta, L. / Innocente, V. / Lee, H.C. / Ueng, W.L. et al. | 2005
- 2823
-
COMPUTING AND SOFTWARE - The LCG PI Project: Using Interfaces for Physics Data AnalysisPfeiffer, A. et al. | 2005
- 2827
-
POOL development status and production experienceChytracek, R. / Dullmann, D. / Frank, M. / Girone, M. / Govi, G. / Moscicki, J.T. / Papadopoulos, I. / Schmuecker, H. / Karr, K. / Malon, D. et al. | 2005
- 2827
-
COMPUTING AND SOFTWARE - POOL Development Status and Production ExperienceChytracek, R. et al. | 2005
- 2832
-
Simulation of antiproton-nuclear annihilation at restKossov, M. et al. | 2005
- 2832
-
COMPUTING AND SOFTWARE - Simulation of Antiproton-Nuclear Annihilation at RestKossov, M. et al. | 2005
- 2836
-
DATA ACQUISITION SYSTEMS - The CMS Tracker Readout Front End DriverFoudas, C. et al. | 2005
- 2836
-
The CMS tracker readout front end driverFoudas, C. / Bainbridge, R. / Ballard, D. / Church, I. / Corrin, E. / Coughlan, J.A. / Day, C.P. / Freeman, E.J. / Fulcher, J. / Gannon, W.J.F. et al. | 2005
- 2841
-
Improving MWPC delay line readout by waveform analysisLopez-Robles, J.M. / Alfaro, R. / Belmont-Moreno, E. / Grabski, V. / Martinez-Davalos, A. / Menchaca-Rocha, A. et al. | 2005
- 2841
-
DATA ACQUISITION SYSTEMS - Improving MWPC Delay Line Readout by Waveform AnalysisLopez-Robles, J.M. et al. | 2005
- 2846
-
Design, deployment and functional tests of the online event filter for the ATLAS experiment at LHCArmstrong, S. / dos Anjos, A. / Baines, J.T.M. / Bee, C.P. / Biglietti, M. / Bogaerts, J.A. / Boisvert, V. / Bosman, M. / Caron, B. / Casado, P. et al. | 2005
- 2846
-
DATA ACQUISITION SYSTEMS - Design, Deployment and Functional Tests of the Online Event Filter for the ATLAS Experiment at LHCMeessen, C. et al. | 2005
- 2853
-
DATA ACQUISITION SYSTEMS - Very High Dynamic Range and High Sampling Rate VME Digitizing Boards for Physics ExperimentsBreton, D. et al. | 2005
- 2853
-
Very high dynamic range and high sampling rate VME digitizing boards for physics experimentsBreton, D. / Delagnes, E. / Houry, M. et al. | 2005
- 2861
-
A PCI interface with four 2-gbit/s serial optical linksIwanski, W. / Haas, S. / Joos, M. et al. | 2005
- 2861
-
DATA ACQUISITION SYSTEMS - A PCI Interface With Four 2-Gbit-s Serial Optical LinksIwanski, W. et al. | 2005
- 2866
-
A common data acquisition system for high-intensity beam experimentsIgarashi, Y. / Fujii, H. / Higuchi, T. / Ikeno, M. / Inoue, E. / Murakami, T. / Nagasaka, Y. / Nakao, M. / Nakayoshi, K. / Saitoh, M. et al. | 2005
- 2866
-
DATA ACQUISITION SYSTEMS - A Common Data Acquisition System for High-Intensity Beam ExperimentsIgarashi, Y. et al. | 2005
- 2872
-
GAS DETECTORS - Studies of Etching Effects on Triple-GEM Detectors Operated With CF4-Based Gas MixturesAlfonsi, M. et al. | 2005
- 2872
-
Studies of Etching Effects on Triple-GEM Detectors Operated With CF~4-Based Gas MixturesAlfonsi, M. / Baccaro, S. / Bencivenni, G. / Bonivento, W. / Cardini, A. / de Simone, P. / Murtas, F. / Pinci, D. / Lener, M. P. / Raspino, D. et al. | 2005
- 2872
-
Studies of etching effects on triple-GEM detectors operated with CF/sub 4/-based gas mixturesAlfonsi, M. / Baccaro, S. / Bencivenni, G. / Bonivento, W. / Cardini, A. / de Simone, P. / Murtas, F. / Pinci, D. / Lener, M.P. / Raspino, D. et al. | 2005
- 2879
-
GAS DETECTORS - Thermal Influences of the Front-End Electronics on the Alice TPC Readout ChamberPopescu, S. et al. | 2005
- 2879
-
Thermal influences of the front-end electronics on the alice TPC readout chamberPopescu, S. / Frankenfeld, U. / Schmidt, H.R. et al. | 2005
- 2889
-
GAS DETECTORS - Calculation of Drift Velocities and Diffusion Coefficients of Xe+ Ions in Gaseous XenonBarata, J.A.S. et al. | 2005
- 2889
-
Calculation of Drift Velocities and Diffusion Coefficients of Xe^+ Ions in Gaseous XenonBarata, J. A. S. / Conde, C. A. N. et al. | 2005
- 2889
-
Calculation of drift velocities and diffusion coefficients of Xe/sup +/ ions in gaseous xenonBarata, J.A.S. / Conde, C.A.N. et al. | 2005
- 2895
-
Optical time projection chamber for imaging of two-proton decay of /sup 45/Fe nucleusCwiok, M. / Dominik, W. / Janas, Z. / Korgul, A. / Miernik, K. / Pfutzner, M. / Sawicka, M. / Wasilewski, A. et al. | 2005
- 2895
-
Optical Time Projection Chamber for Imaging of Two-Proton Decay of ^4^5Fe NucleusCwiok, M. / Dominik, W. / Janas, Z. / Korgul, A. / Miernik, K. / Pfutzner, M. / Sawicka, M. / Wasilewski, A. et al. | 2005
- 2895
-
GAS DETECTORS - Optical Time Projection Chamber for Imaging of Two-Proton Decay of 45Fe NucleusCwiok, M. et al. | 2005
- 2900
-
GAS DETECTORS - Study of Various Anode Pad Readout Geometries in a GEM-TPCKaminski, J. et al. | 2005
- 2900
-
Study of various anode pad readout geometries in a GEM-TPCKaminski, J. / Kappler, S. / Ledermann, B. / Muller, T. / Ronan, M. et al. | 2005
- 2907
-
Properties of a Neutron Detector Based on Ionization Chamber With ^6Li ConvertersEngels, R. / Clemens, U. / Kemmerling, G. / Schelten, J. et al. | 2005
- 2907
-
Properties of a neutron detector based on ionization chamber with /sup 6/Li convertersEngels, R. / Clemens, U. / Kemmerling, G. / Schelten, J. et al. | 2005
- 2911
-
Acceptance tests and criteria of the ATLAS transition radiation trackerCwetanski, P. / Akesson, T. / Anghinolfi, F. / Arik, E. / Baker, O.K. / Banas, E. / Baron, S. / Benjamin, D. / Bertelsen, H. / Bondarenko, V. et al. | 2005
- 2917
-
Using a multilayer printed circuit board as position sensing electrode in a triple-GEM detectorMarinho, P.R.B. / Barbosa, A.F. / Guedes, G.P. et al. | 2005
- 2923
-
Fast neutron spectrometer composed of PSPCs and Si(Li)-SSDs with excellent energy resolution and detection efficiencyMatsumoto, T. / Harano, H. / Uritani, A. / Kudo, K. et al. | 2005
- 2927
-
Operational characteristics of a GEM-MSGC system for X-ray detectionMir, J.A. / Derbyshire, G.E. / Stephenson, R. / Rhodes, N.J. / Schooneveld, E.M. / Veloso, J.F.C.A. / Dos Santos, J.M.F. / Spooner, N. / Lawson, T.B. / Lightfoot, P.K. et al. | 2005
- 2932
-
A new coplanar-grid high-pressure xenon gamma-ray spectrometerKiff, S.D. / Zhong He, / Tepper, G.C. et al. | 2005
- 2940
-
Ionization yields for heavy ions in gases as a function of energySasaki, S. / Sanami, T. / Saito, K. / Iijima, K. / Tawara, H. / Shibamura, E. / Fukumura, A. et al. | 2005
- 2944
-
TPG, test resultsAbleev, V. / Ambrosino, F. / Apollonio, M. / Bene, P. / Blondel, A. / Catanesi, M.G. / Chiefari, G. / Chimenti, P. / Favaron, P. / Gastaldi, U. et al. | 2005
- 2951
-
Application of Monte Carlo Simulation to ^1^3^4Cs Standardization by Means of 4pibeta - gamma Coincidence SystemTakeda, M. N. / da Silva Dias, M. / Koskinas, M. F. et al. | 2005
- 2951
-
Application of Monte Carlo Simulation to /sup 134/Cs standardization by means of 4/spl pi//spl beta/-/spl gamma/ coincidence systemTakeda, M.N. / Mauro da Silva Dias, / Koskinas, M.F. et al. | 2005
- 2956
-
Aging in the large CDF axial drift chamberAllspach, D. / Ambrose, D. / Binkley, M. / Bromberg, C. / Burkett, K. / Kephart, R. / Madrak, R. / Miao, T. / Mukherjee, A. / Roser, R. et al. | 2005
- 2963
-
Tests of OPERA RPC detectorsBergnoli, A. / Borsato, E. / Brugnera, R. / Buccheri, E. / Candela, A. / Carrara, E. / Ciesielski, R. / Corradi, G. / D'Incecco, M. / Corso, F.D. et al. | 2005
- 2971
-
Aging studies on atlas muon spectrometer drift tubesAdorisio, C. / Cirilli, M. / Di Girolamo, A. / Antonio Di Domenico, / Palestini, S. / Valente, P. / Zimmermann, S. et al. | 2005
- 2977
-
The STACEE ground-based gamma-ray detectorGingrich, D.M. / Boone, L.M. / Bramel, D. / Carson, J. / Covault, C.E. / Fortin, P. / Hanna, D.S. / Hinton, J.A. / Jarvis, A. / Kildea, J. et al. | 2005
- 2986
-
Characterization, calibration and performances of the TPC of the HARP experiment at the CERN PSRadicioni, E. et al. | 2005
- 2992
-
Design, construction, and initial performance of SciBar detector in K2K experimentYamamoto, S. / Andringa, S. / Aoki, S. / Choi, S. / Dore, U. / Espinal, X. / Gomez-Cadenas, J.J. / Gran, R. / Hasegawa, M. / Hayashi, K. et al. | 2005
- 2998
-
Test and calibration of large drift tube chambers with cosmic raysBiebel, O. / Christiansen, T. / Dubbert, J. / Elmsheuser, J. / Fiedler, F. / Hertenberger, R. / Kortner, O. / Nunnemann, T. / Rauscher, F. / Schaile, D. et al. | 2005
- 3005
-
The measurement of sub-Brownian lever deflectionsHammig, M.D. / Wehe, D.K. / Nees, J.A. et al. | 2005
- 3012
-
A Real Time, Isotope Identifying Gamma Spectrometer for Monitoring of PedestrainsSchrenk, M. / Arlt, R. / Beck, P. / Boeck, H. / Koenig, F. / Leitha, T. et al. | 2005
- 3012
-
A real time, isotope identifying gamma spectrometer for monitoring of pedestriansSchrenk, M. / Arlt, R. / Beck, P. / Boeck, H. / Koenig, F. / Leitha, T. et al. | 2005
- 3020
-
Point source detection and characterization for vehicle radiation portal monitorsRunkle, R.C. / Mercier, T.M. / Anderson, K.K. / Carlson, D.K. et al. | 2005
- 3026
-
A smart software sensor for feedwater flow measurement monitoringMan Gyun Na, / Yoon Joon Lee, / In Joon Hwang, et al. | 2005
- 3035
-
Remote alpha imaging in nuclear installations: new results and prospectsLamadie, F. / Delmas, F. / Mahe, C. / Girones, P. / Le Goaller, C. / Costes, J.R. et al. | 2005
- 3040
-
Test of scintillator readout with single photon avalanche photodiodesFinocchiaro, P. / Campisi, A. / Corso, D. / Cosentino, L. / Fallica, G. / Lombardo, S. / Mazzillo, M. / Musumeci, F. / Piazza, A. / Privitera, G. et al. | 2005
- 3047
-
The LANL prototype Compton gamma-ray imager: design and image reconstruction techniquesHoover, A.S. / Kippen, R.M. / Sullivan, J.P. / Rawool-Sullivan, M.W. / Baird, W. / Sorensen, E.B. et al. | 2005
- 3054
-
Gamma-ray induced photoconductivity in pyrex, quartz, and vycorUsman, S. / Shoaib, L. / Anno, J.N. et al. | 2005
- 3059
-
Comparison of gamma radiation performance of a range of CMOS a/D converters under biased conditionsAgarwal, V. / Birkar, S.D. et al. | 2005
- 3068
-
Radiation defects manipulation by ultrasound in ionic crystalsOstrovskii, I. / Ostrovskaya, N. / Korotchenkov, O. / Reidy, J. et al. | 2005
- 3074
-
Drift mobility and mobility-lifetime products in CdTe:Cl grown by the travelling heater methodSellin, P.J. / Davies, A.W. / Lohstroh, A. / Ozsan, M.E. / Parkin, J. et al. | 2005
- 3079
-
Optical monitoring of partial vapor pressures in CdTe and CdZnTe systems: a new tool for material technology developmentZappettini, A. / Bissoli, F. et al. | 2005
- 3085
-
Recovery of radiation damage in CdTe detectorsFraboni, B. / Cavallini, A. / Auricchio, N. / Dusi, W. / Zanarini, M. / Siffert, P. et al. | 2005
- 3091
-
Characterization of a CZT focal plane small prototype for hard X-ray telescopeDel Sordo, S. / Abbene, L. / Zora, M. / Agnetta, G. / Biondo, B. / Mangano, A. / Russo, F. / Caroli, E. / Auricchio, N. / Donati, A. et al. | 2005
- 3096
-
Simulation and experimental results on monolithic CdZnTe gamma-ray detectorsd'Aillon, E.G. / Gentet, M.C. / Montemont, G. / Rustique, J. / Verger, L. et al. | 2005
- 3103
-
Feasibility of HgBrI as photoconductor for direct X-ray imagingFornaro, L. / Espinosa, H. / Cuna, A. / Aguiar, I. / Noguera, A. / Perez, M. et al. | 2005
- 3107
-
Low dark current (00l) mercuric iodide thick films for X-ray direct and digital imagersFornaro, L. / Cuna, A. / Noguera, A. / Aguiar, I. / Perez, M. / Mussio, L. / Gancharov, A. et al. | 2005
- 3111
-
Spectral gamma detectors for hand-held radioisotope identification devices (RIDs) for nuclear security applicationsSwoboda, M. / Arlt, R. / Gostilo, V. / Lupilov, A. / Majorov, M. / Moszynski, M. / Syntfeld, A. et al. | 2005
- 3119
-
The ISGRI CdTe gamma camera in-flight performanceLebrun, F. et al. | 2005
- 3119
-
RTSD -- SPACE APPLICATIONS The ISGRI CdTe Gamma Camera In-Flight PerformanceLebrun, F. et al. | 2005
- 3124
-
CdWO/sub 4/ crystal in gamma-ray spectrometryMoszynski, M. / Balcerzyk, M. / Kapusta, M. / Syntfeld, A. / Wolski, D. / Pausch, G. / Stein, J. / Schotanus, P. et al. | 2005
- 3124
-
SCINTILLATION DETECTORS - CdWO4 Crystal in Gamma-Ray SpectrometryMoszynski, M. et al. | 2005
- 3124
-
CdWO~4 Crystal in Gamma-Ray SpectrometryMoszynski, M. / Balcerzyk, M. / Kapusta, M. / Syntfeld, A. / Wolski, D. / Pausch, G. / Stein, J. / Schotanus, P. et al. | 2005
- 3129
-
SCINTILLATION DETECTORS - Luminescence and Scintillation Properties of Gd2O2S : Tb,Ce CeramicsGorokhova, E.I. et al. | 2005
- 3129
-
Luminescence and Scintillation Properties of Gd~2O~2S: Tb,Ce CeramicsGorokhova, E. I. / Demidenko, V. A. / Mikhrin, S. B. / Rodnyi, P. A. / van Eijk, C. W. E. et al. | 2005
- 3129
-
Luminescence and scintillation properties of Gd/sub 2/O/sub 2/S:Tb,Ce ceramicsGorokhova, E.I. / Demidenko, V.A. / Mikhrin, S.B. / Rodnyi, P.A. / van Eijk, C.W.E. et al. | 2005
- 3133
-
Large size LYSO crystals for future high energy physics experimentsJianming Chen, / Liyuan Zhang, / Ren-Yuan Zhu, et al. | 2005
- 3133
-
SCINTILLATION DETECTORS - Large Size LYSO Crystals for Future High Energy Physics ExperimentsChen, J. et al. | 2005
- 3141
-
Analysis of the response of capture-gated organic scintillatorsPozzi, S.A. / Oberer, R.B. / Neal, J.S. et al. | 2005
- 3141
-
SCINTILLATION DETECTORS - Analysis of the Response of Capture-Gated Organic ScintillatorsPozzi, S.A. et al. | 2005
- 3147
-
Improvement of photon collection uniformity from an NE213 scintillator using a light guideHarano, H. / Matsumoto, T. / Shibata, Y. / Ito, Y. / Uritani, A. / Kudo, K. et al. | 2005
- 3147
-
SCINTILLATION DETECTORS - Improvement of Photon Collection Uniformity From an NE213 Scintillator Using a Light GuideHarano, H. et al. | 2005