XRD and SEM analysis near the diffusion bonding interface of Mg/Al dissimilar materials (Englisch)
- Neue Suche nach: Li, Y.
- Neue Suche nach: Liu, P.
- Neue Suche nach: Wang, J.
- Neue Suche nach: Ma, H.
- Neue Suche nach: Li, Y.
- Neue Suche nach: Liu, P.
- Neue Suche nach: Wang, J.
- Neue Suche nach: Ma, H.
In:
VACUUM -LONDON THEN OXFORD- PERGAMON-
;
82
, 1
;
15-19
;
2007
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:XRD and SEM analysis near the diffusion bonding interface of Mg/Al dissimilar materials
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Beteiligte:
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Erschienen in:VACUUM -LONDON THEN OXFORD- PERGAMON- ; 82, 1 ; 15-19
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Verlag:
- Neue Suche nach: Elsevier Science B.V., Amsterdam.
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Erscheinungsdatum:01.01.2007
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Format / Umfang:5 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 533.12 / 530
- Weitere Informationen zu Dewey Decimal Classification
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Datenquelle:
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Diary| 2007
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