Comprehensive Investigation of Statistical Effects in Nitride Memories—Part I: Physics-Based Modeling (Englisch)
- Neue Suche nach: Mauri, A.
- Neue Suche nach: Monzio Compagnoni, C.
- Neue Suche nach: Amoroso, S. M.
- Neue Suche nach: Maconi, A.
- Neue Suche nach: Ghetti, A.
- Neue Suche nach: Spinelli, A. S.
- Neue Suche nach: Lacaita, A. L.
- Neue Suche nach: Mauri, A.
- Neue Suche nach: Monzio Compagnoni, C.
- Neue Suche nach: Amoroso, S. M.
- Neue Suche nach: Maconi, A.
- Neue Suche nach: Ghetti, A.
- Neue Suche nach: Spinelli, A. S.
- Neue Suche nach: Lacaita, A. L.
In:
IEEE TRANSACTIONS ON ELECTRON DEVICES
;
57
, 9
;
2116-2123
;
2010
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Comprehensive Investigation of Statistical Effects in Nitride Memories—Part I: Physics-Based Modeling
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Beteiligte:Mauri, A. ( Autor:in ) / Monzio Compagnoni, C. ( Autor:in ) / Amoroso, S. M. ( Autor:in ) / Maconi, A. ( Autor:in ) / Ghetti, A. ( Autor:in ) / Spinelli, A. S. ( Autor:in ) / Lacaita, A. L. ( Autor:in )
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Erschienen in:IEEE TRANSACTIONS ON ELECTRON DEVICES ; 57, 9 ; 2116-2123
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Verlag:
- Neue Suche nach: IEEE INSTITUTE OF ELECTRICAL AND ELECTRONICS
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Erscheinungsdatum:01.01.2010
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Format / Umfang:8 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
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Sprache:Englisch
- Neue Suche nach: 621.3 / 621
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
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Datenquelle:
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