A Built-in Method to Repair SoC RAMs in Parallel (Englisch)
- Neue Suche nach: Tseng, T. W.
- Neue Suche nach: Li, J. F.
- Neue Suche nach: Hou, C. S.
- Neue Suche nach: Tseng, T. W.
- Neue Suche nach: Li, J. F.
- Neue Suche nach: Hou, C. S.
In:
IEEE DESIGN AND TEST OF COMPUTERS
;
27
, 6
;
46-57
;
2010
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:A Built-in Method to Repair SoC RAMs in Parallel
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Beteiligte:
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Erschienen in:IEEE DESIGN AND TEST OF COMPUTERS ; 27, 6 ; 46-57
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Verlag:
- Neue Suche nach: IEEE INSTITUTE OF ELECTRICAL AND ELECTRONICS
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Erscheinungsdatum:01.01.2010
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Format / Umfang:12 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 621.395
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 621.395 -
Datenquelle:
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