Subpicometer length measurement using heterodyne laser interferometry and all-digital rf phase meters (Englisch)
- Neue Suche nach: Hsu, M.T.L.
- Neue Suche nach: Littler, I.C.M.
- Neue Suche nach: Shaddock, D.A.
- Neue Suche nach: Herrmann, J.
- Neue Suche nach: Warrington, R.B.
- Neue Suche nach: Gray, M.B.
- Neue Suche nach: Hsu, M.T.L.
- Neue Suche nach: Littler, I.C.M.
- Neue Suche nach: Shaddock, D.A.
- Neue Suche nach: Herrmann, J.
- Neue Suche nach: Warrington, R.B.
- Neue Suche nach: Gray, M.B.
In:
OPTICS LETTERS
;
35
, 24
;
4202
;
2010
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Subpicometer length measurement using heterodyne laser interferometry and all-digital rf phase meters
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Beteiligte:Hsu, M.T.L. ( Autor:in ) / Littler, I.C.M. ( Autor:in ) / Shaddock, D.A. ( Autor:in ) / Herrmann, J. ( Autor:in ) / Warrington, R.B. ( Autor:in ) / Gray, M.B. ( Autor:in )
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Erschienen in:OPTICS LETTERS ; 35, 24 ; 4202
-
Verlag:
- Neue Suche nach: OPTICAL SOCIETY OF AMERICA
-
Erscheinungsdatum:01.01.2010
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Format / Umfang:4202 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
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Sprache:Englisch
- Neue Suche nach: 535
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 535 -
Datenquelle:
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