Reprint of ''Optical properties-microstructure-texture relationships of dried apple slices: Spatially resolved diffuse reflectance spectroscopy as a novel technique for analysis and process control'' (Englisch)
- Neue Suche nach: Nguyen Do Trong, N.
- Neue Suche nach: Rizzolo, A.
- Neue Suche nach: Herremans, E.
- Neue Suche nach: Vanoli, M.
- Neue Suche nach: Cortellino, G.
- Neue Suche nach: Erkinbaev, C.
- Neue Suche nach: Tsuta, M.
- Neue Suche nach: Spinelli, L.
- Neue Suche nach: Contini, D.
- Neue Suche nach: Torricelli, A.
- Neue Suche nach: Verboven, P.
- Neue Suche nach: De Baerdemaeker, J.
- Neue Suche nach: Nicolai, B.
- Neue Suche nach: Saeys, W.
- Neue Suche nach: Nguyen Do Trong, N.
- Neue Suche nach: Rizzolo, A.
- Neue Suche nach: Herremans, E.
- Neue Suche nach: Vanoli, M.
- Neue Suche nach: Cortellino, G.
- Neue Suche nach: Erkinbaev, C.
- Neue Suche nach: Tsuta, M.
- Neue Suche nach: Spinelli, L.
- Neue Suche nach: Contini, D.
- Neue Suche nach: Torricelli, A.
- Neue Suche nach: Verboven, P.
- Neue Suche nach: De Baerdemaeker, J.
- Neue Suche nach: Nicolai, B.
- Neue Suche nach: Saeys, W.
- Neue Suche nach: Nicholai, B.
- Neue Suche nach: Piazza, L.
In:
Food Microstructure
;
145-153
;
2014
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Reprint of ''Optical properties-microstructure-texture relationships of dried apple slices: Spatially resolved diffuse reflectance spectroscopy as a novel technique for analysis and process control''
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Beteiligte:Nguyen Do Trong, N. ( Autor:in ) / Rizzolo, A. ( Autor:in ) / Herremans, E. ( Autor:in ) / Vanoli, M. ( Autor:in ) / Cortellino, G. ( Autor:in ) / Erkinbaev, C. ( Autor:in ) / Tsuta, M. ( Autor:in ) / Spinelli, L. ( Autor:in ) / Contini, D. ( Autor:in ) / Torricelli, A. ( Autor:in )
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Erschienen in:Food Microstructure ; 145-153INNOVATIVE FOOD SCIENCE AND EMERGING TECHNOLOGIES ; 24 ; 145-153
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Verlag:
- Neue Suche nach: Elsevier Science B.V., Amsterdam.
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Erscheinungsdatum:01.01.2014
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Format / Umfang:9 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 664
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 664 -
Datenquelle:
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- IFC
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Editorial Board| 2014