A Unified Framework for Event Summarization and Rare Event Detection from Multiple Views (Englisch)
- Neue Suche nach: Kwon, J.
- Neue Suche nach: Lee, K. M.
- Neue Suche nach: Kwon, J.
- Neue Suche nach: Lee, K. M.
In:
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE
;
37
, 9
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1737-1750
;
2015
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:A Unified Framework for Event Summarization and Rare Event Detection from Multiple Views
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Beteiligte:Kwon, J. ( Autor:in ) / Lee, K. M. ( Autor:in )
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Erschienen in:IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE ; 37, 9 ; 1737-1750
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Verlag:
- Neue Suche nach: IEEE INSTITUTE OF ELECTRICAL AND ELECTRONICS
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Erscheinungsdatum:01.01.2015
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Format / Umfang:14 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 006.3
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 006.3 -
Datenquelle:
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Table of Contents| 2015
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IEEE Transactions on Pattern Analysis and Machine Intelligence Editorial Board| 2015
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IEEE Transactions on Pattern Analysis and Machine Intelligence Information for Authors| 2015
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IEEE Computer Society| 2015