Surface/interface and stress effects in electronic material nanostructures : Symposium [on "Surface/Interface and Stress Effects in Electronic Material Nanostructures"] held November 27 - December 1, 1995, Boston, Massachusetts, U.S.A. ; [held as part of the 1995 MRS Fall Meeting] (Englisch)
- Neue Suche nach: Symposium on Surface, Interface and Stress Effects in Electronic Material Nanostructures
- Weitere Informationen zu Symposium on Surface, Interface and Stress Effects in Electronic Material Nanostructures:
- http://d-nb.info/gnd/3033554-1
- Neue Suche nach: Materials Research Society
- Weitere Informationen zu Materials Research Society:
- http://d-nb.info/gnd/212912-7
- Neue Suche nach: Prokes, S. M.
- Neue Suche nach: Cammarata, R. C.
- Weitere Informationen zu Cammarata, R. C.:
- http://d-nb.info/gnd/142468975
- Neue Suche nach: Wang, K. L.
- Neue Suche nach: Christou, A.
- Neue Suche nach: Symposium on Surface, Interface and Stress Effects in Electronic Material Nanostructures
- Weitere Informationen zu Symposium on Surface, Interface and Stress Effects in Electronic Material Nanostructures:
- http://d-nb.info/gnd/3033554-1
- Neue Suche nach: Materials Research Society
- Weitere Informationen zu Materials Research Society:
- http://d-nb.info/gnd/212912-7
1996
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ISBN:
- Konferenzband / Print
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Titel:Surface/interface and stress effects in electronic material nanostructures : Symposium [on "Surface/Interface and Stress Effects in Electronic Material Nanostructures"] held November 27 - December 1, 1995, Boston, Massachusetts, U.S.A. ; [held as part of the 1995 MRS Fall Meeting]
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Beteiligte:
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Kongress:Symposium on Surface/Interface and Stress Effects in Electronic Material Nanostructures ; 1995 ; Boston, Mass.
MRS Fall Meeting ; 1995 ; Boston, Mass. -
Erschienen in:
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Verlag:
- Neue Suche nach: Materials Research Soc.
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Erscheinungsort:Pittsburgh, Pa.
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Erscheinungsdatum:1996
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Format / Umfang:XIII, 546 S.
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Anmerkungen:Ill., graph. Darst.
Literaturangaben -
ISBN:
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Medientyp:Konferenzband
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 537.622 / 537.6/22
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Schlagwörter:
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Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 3
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Effects of Strain on the Electronic and Vibrational Properties of Semiconductors and Semiconductor MicrostructuresPollak, F. H. / Materials Research Society et al. | 1996
- 31
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Desorption and Segregation of Indium and its Dependence on Surface As-CoverageEkenstedt, M. J. / Yamaguchi, H. / Horikoshi, Y. / Materials Research Society et al. | 1996
- 37
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Thermal Stability of GaAs/InGaP and InGaP/(In)GaAs InterfacesHyuga, F. / Nittono, T. / Watanabe, K. / Furuta, T. / Materials Research Society et al. | 1996
- 43
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Uniaxial Stress Applied to p-type GaAs/AlGaAs Heterostructures: Influence on Heavy Hole SubbandsHansen, O. P. / Olsen, J. S. / Kraak, W. / Saffian, B. / Materials Research Society et al. | 1996
- 49
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Reduction of Lateral Dimension on InGaAs/GaAs Multilayers on Non-(111)V-Grooved GaAs(100) Substrate by Chemical Beam EpitaxyKim, S.-B. / Ro, J.-R. / Park, S.-J. / Lee, E.-H. / Materials Research Society et al. | 1996
- 55
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Facet Evolution and Selective Growth of GaAs/AlGaAs Lateral Structure Grown by Growth-Interrupted Chemical Beam Epitaxy Using Unprecracked MonoethylarsineRo, J.-R. / Kim, S.-B. / Park, S.-J. / Lee, J. / Materials Research Society et al. | 1996
- 61
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High Quality AlGaAs Regrowth on Oxide-Free Al~xGa~1~-~xAs (x=0.26) by Metalorganic Chemical Vapor DepositionLee, K.-J. / Huang, Z. C. / Chen, J. C. / Materials Research Society et al. | 1996
- 67
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RHEED Intensity Observation of AlAs and GaAs by In Situ Etching Using Arsenic TribromideKaneko, T. / Saeger, T. / Eberl, K. / Materials Research Society et al. | 1996
- 73
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Kinetic Studies of Nanoscale Crystallization in Electronic MaterialsHayzelden, C. / Batstone, J. L. / Materials Research Society et al. | 1996
- 87
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Growth and Characterization of Pseudomorphic Ge~1~-~yC~y and Si~1~-~yC~y Alloy Layers on Si SubstratesBrunner, K. / Eberl, K. / Winter, W. / Materials Research Society et al. | 1996
- 93
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Ab-Initio Calculations of C~xSi~1~-~x~-~yGe~y Compounds for Silicon-Based Heterojunction DevicesBerding, M. A. / Sher, A. / Van Schilfgaarde, M. / Materials Research Society et al. | 1996
- 99
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Damage, Strain and Quantum Confinement Issues in Dry Etched Semiconductor NanostructuresTang, Y. S. / Sotomayor Torres, C. M. / Materials Research Society et al. | 1996
- 109
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Strain Measurement in Two-Dimensional Nanoscale Si Gratings by High Resolution X-ray DiffractionTanaka, S. / Umbach, C. C. / Shen, Q. / Blakely, J. M. / Materials Research Society et al. | 1996
- 115
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Fabrication of Novel III-N and III-V Modulator Structures by ECR Plasma EtchingPearton, S. J. / Abernathy, C. R. / MacKenzie, J. D. / Mileham, J. R. / Materials Research Society et al. | 1996
- 121
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Stress Distributions in Free Standing Quantum Well Dots and WiresGippius, N. A. / Tikhodeev, S. G. / Steffen, R. / Koch, T. / Materials Research Society et al. | 1996
- 127
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Stark Effects on Band Gap and Surface Phonons of Semiconductor Quantum Dots in Dielectric HostsMu, R. / Ueda, A. / Tung, Y.-S. / Henderson, D. O. / Materials Research Society et al. | 1996
- 133
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Three-Dimensional Epitaxy: Thermodynamic Stability Range of Coherent Germanium Nanocrystallites in Silicon HostBalasubramanian, S. / Ceder, G. / Kolenbrander, K. D. / Materials Research Society et al. | 1996
- 141
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Localization Phenomena Photoluminescence, and Raman Scattering in nc-Si and nc-Si/a-SiO~2 CompositesVeprek, S. / Wirschem, T. / Rueckschloss, M. / Ossadnik, C. / Materials Research Society et al. | 1996
- 153
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Oxygen Related Defect Center Red Room Temperature Photoluminescence in As Made and Oxidized Porous SiliconProkes, S. M. / Carlos, W. E. / Materials Research Society et al. | 1996
- 159
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SiO~x Related Photoluminescence Excitation in Porous SiliconTorchinskaya, T. V. / Korsunskaya, N. E. / Dzumaev, B. R. / Sheinkman, M. K. / Materials Research Society et al. | 1996
- 167
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Photovoltaic and Electroluminescent Properties of Stain-Etched Porous Silicon Based HeterojunctionsDimova-Malinovska, D. / Tzolov, M. / Kamenova, M. / Tzenov, N. / Materials Research Society et al. | 1996
- 173
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Microstructural Investigation of Porous Silicon Depth Profile by Direct Surface Force MicroscopyChang, D. C. / Baranauskas, V. / Doi, I. / Prohaska, T. / Materials Research Society et al. | 1996
- 179
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Femtosecond Nonlinear Transmission Study of Free-Standing Porous Silicon FilmsKlimov, V. / McBranch, D. / Karavanskii, V. / Materials Research Society et al. | 1996
- 185
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Effect of gamma-Irradiation on Photoluminescence of Porous SiliconAstrova, E. V. / Emtsev, V. V. / Lebedev, A. A. / Poloskin, D. S. / Materials Research Society et al. | 1996
- 193
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Formation of Intensive Photoluminescence in Porous SiliconMakara, V. A. / Boltovets, M. S. / Vakulenko, O. V. / Datsenko, O. I. / Materials Research Society et al. | 1996
- 197
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Restoration of Porous Silicon Luminescence in Water VapourBrodin, M. S. / Bykov, V. N. / Dan'ko, D. B. / Fedorovich, R. D. / Materials Research Society et al. | 1996
- 203
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Linear Polarization of Porous Si PhotoluminescenceGippius, N. A. / Tikhodeev, S. G. / Efros, A. L. / Rosen, M. / Materials Research Society et al. | 1996
- 209
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Towards a Microscopic Interpretation of the Dielectric Function of Porous SiliconRossow, U. / Frotscher, U. / Aspnes, D. E. / Richter, W. / Materials Research Society et al. | 1996
- 215
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Photoluminescence Properties of Er-Doped Porous SiliconHoemmerich, U. / Wu, X. / Namavar, F. / Cremins-Costa, A. M. / Materials Research Society et al. | 1996
- 223
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Phase Transformation of Germanium Ultrafine Particles at High TemperatureNozaki, S. / Sato, S. / Ono, H. / Morisaki, H. / Materials Research Society et al. | 1996
- 229
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Visible Luminescence from Surface-Oxidized Silicon Nanostructures: Three Region ModelKanemitsu, Y. / Materials Research Society et al. | 1996
- 235
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Possibility of Self-Trapped Excitons in Silicon NanocrystallitesAllan, G. / Delerue, C. / Lannoo, M. / Materials Research Society et al. | 1996
- 241
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Substrate Surface Dependence of the Microstructure of c-Si,Ge:H Deposited by Reactive Magnetron Sputtering (RMS)Cho, S. M. / Christensen, K. / Wolfe, D. / Ying, H. / Materials Research Society et al. | 1996
- 247
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On the Origin of Visible Luminescence from SiO~2 Films Containing Ge NanocrystalsMin, K. S. / Shcheglov, K. V. / Yang, C. M. / Camata, R. P. / Materials Research Society et al. | 1996
- 253
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Electrical Characteristics and Temperature Effects of Electroluminescing Silicon NanocrystalsForsythe, E. W. / Whittaker, E. A. / Morton, D. / Khan, B. A. / Materials Research Society et al. | 1996
- 259
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Synthesis of Size-Classified Silicon NanocrystalsCamata, R. P. / Atwater, H. A. / Vahala, K. J. / Flagan, R. C. / Materials Research Society et al. | 1996
- 265
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Room Temperature Emission from Erbium Nanoparticles Embedded in a Silicon MatrixThilderkvist, A. / Michel, J. / Ngiam, S.-T. / Kimerling, L. C. / Materials Research Society et al. | 1996
- 271
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Carrier Transport in Silicon Nanocrystallite-Based Multilayer Electroluminescent DevicesBurr, T. A. / Kolenbrander, K. D. / Materials Research Society et al. | 1996
- 277
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Control of Silicon Nanocrystallite Luminescence Behavior through Surface TreatmentsSeraphin, A. A. / Ngiam, S.-T. / Kolenbrander, K. D. / Materials Research Society et al. | 1996
- 283
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Investigation of Local Structures around Luminescent Centers in Doped Nanocrystal PhosphorsSoo, Y. L. / Huang, S. W. / Ming, Z. H. / Kao, Y. H. / Materials Research Society et al. | 1996
- 289
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Nonlinear Optical Properties of CuS Nanocrystals with Modified SurfaceYumashev, K. V. / Mikhailov, V. P. / Malyarevich, A. M. / Prokoshin, P. V. / Materials Research Society et al. | 1996
- 295
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ZnS/Si/ZnS Quantum Well Structures for Visible Light EmissionBretschneider, E. / Davydov, A. / McCreary, C. / Wang, L. / Materials Research Society et al. | 1996
- 301
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Persistent Spectral Hole-Burning of CuCl Semiconductor Quantum DotsOkamoto, S. / Masumoto, Y. / Materials Research Society et al. | 1996
- 309
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Continuum Elastic Strain Effects at Semiconductor InterfacesPearsall, T. P. / Materials Research Society et al. | 1996
- 321
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Incorporation of Nitrogen Atoms at Si/SiO~2 Interfaces of Field Effect Transistors (FETs) to Improve Device ReliabilityLucovsky, G. / Lee, D. R. / Jing, Z. / Whitten, J. L. / Materials Research Society et al. | 1996
- 327
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Theoretical Modelling of the Surface Oxidation of a Silicon Carbide Nanopowder, Based on the v(SiH) Frequency EvolutionBaraton, M.-I. / Besnainou, S. / Materials Research Society et al. | 1996
- 333
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Characterization of MOS Structures with Ultra-Thin Tunneling OxynitrideFujioka, H. / Wann, C. / Park, D. / Hu, C. / Materials Research Society et al. | 1996
- 339
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Interfacial Defect Control for Infrared Conversion Widening of Silicon Single-Crystal Solar CellsKuznicki, Z. T. / Materials Research Society et al. | 1996
- 345
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Stress Effects in 2D Arsenic Diffusion in SiliconRao, V. / Zagozdzon-Wosik, W. / Materials Research Society et al. | 1996
- 351
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Surface Effects in Silicon Doping with Boron during Proximity Rapid Thermal DiffusionMone, S. / Zagozdzon-Wosik, W. / Rastogi, M. / Materials Research Society et al. | 1996
- 359
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Structural Characterization of Reactive Ion Etched Semiconductor Nanostructures Using X-ray Reciprocal Space MappingBauer, G. / Darhuber, A. A. / Holy, V. / Materials Research Society et al. | 1996
- 371
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Study of Periodic Surface Nanostructures Using Coherent Grating X-ray Diffraction (CGXD)Shen, Q. / Materials Research Society et al. | 1996
- 381
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Real Time Measurement of Epilayer Strain Using a Simplified Wafer Curvature TechniqueFloro, J. A. / Chason, E. / Lee, S. R. / Materials Research Society et al. | 1996
- 387
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Optical and Structural Characterization of Arsenide/Phosphide Interfaces Formed by Flow Modulation EpitaxyEmerson, D. T. / Smart, J. A. / Whittingham, K. L. / Chumbes, E. M. / Materials Research Society et al. | 1996
- 393
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Determining Thin Film Density by Energy-Dispersive X-ray Reflectivity: Application to a Spin-on-Glass DielectricWallace, W. E. / Wu, W. L. / Materials Research Society et al. | 1996
- 399
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Combine Spectroscopic Ellipsometry and Grazing X-ray Reflectance for Fine Characterization of Complex Epitaxial StructuresBoher, P. / Stehle, J. L. / Materials Research Society et al. | 1996
- 407
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A New Technique for Depth Profiling on a Nanometer ScaleSchwenke, H. / Knoth, J. / Guenther, R. / Wiener, G. / Materials Research Society et al. | 1996
- 415
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The Uniformity of Surface Passivation After (NH~4)~2S Treatment Studied by Near-Field Scanning Optical MicroscopyLiu, J. / Kuech, T. F. / Materials Research Society et al. | 1996
- 421
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A New Method for the Electronic and Chemical Passivation of GaAs Surfaces Using CS~2Lee, J.-H. / Xu, Y. / Burrows, V. A. / McMillan, P. F. / Materials Research Society et al. | 1996
- 429
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Cathodoluminescence Study of Diffusion Length and Surface Recombination Velocity in III-V Multiple Quantum Well StructuresChao, L.-L. / Freiler, M. B. / Levy, M. / Lin, J.-L. / Materials Research Society et al. | 1996
- 435
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Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in SemiconductorsVanhellemont, J. / Janssens, K. G. F. / Frabboni, S. / Smeys, P. / Materials Research Society et al. | 1996
- 447
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Analysis of Localized Small Defect in ULSIsFukumoto, K. / Maeda, H. / Mashiko, Y. / Sekine, M. / Materials Research Society et al. | 1996
- 453
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Ge-Related Interfacial Defects in SiGe Alloy StructuresMacfariane, P. J. / Zvanut, M. E. / Carlos, W. E. / Twigg, M. E. / Materials Research Society et al. | 1996
- 459
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Dislocation Formation in Trench-Based Dynamic Random Access Memory (DRAM) ChipsHo, H. / Hammerl, E. / Stengl, R. / Benedict, J. / Materials Research Society et al. | 1996
- 467
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Determination of Bulk Mismatch Values in Heterostructures by TEM/CBEDArmigliato, A. / Balboni, R. / Frabboni, S. / Materials Research Society et al. | 1996
- 475
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Stress Evolution in Ultra Thin Sputtered FilmsSu, Q. / Cammarata, R. C. / Wuttig, M. / Materials Research Society et al. | 1996
- 485
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Use of Advantageous Impurity Effects in MetallizationMurarka, S. P. / Materials Research Society et al. | 1996
- 497
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Interface Stresses in Nanostructured Multilayered MaterialsCammarata, R. C. / Sieradzki, K. / Materials Research Society et al. | 1996
- 501
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Measurement of Young's Modulus and Poisson's Ratio of Free-Standing Ag/Cu Multilayered Thin FilmsHuang, H. / Spaepen, F. / Materials Research Society et al. | 1996
- 507
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Nanocrystallization Studies in Co and Fe-Rich Amorphous AlloysAburto, S. / Jimenez, M. / Gomez, R. / Marquina, V. / Materials Research Society et al. | 1996
- 513
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Characterization of the Interface between Metal Contacts and Epilayers of Doped Silicon CarbideGeorge, M. A. / Larkin, D. J. / Petit, J. / Burger, A. / Materials Research Society et al. | 1996
- 519
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Magnetic Properties of Nanoscale Iron Particles Photodeposited in GlassSunil, D. / Gafney, H. D. / Tsang, C. / Rafailovich, M. H. / Materials Research Society et al. | 1996
- 523
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Crystalline Structure and Morphology of the Phases in MgO, TiO~2 and ZrO~2 Prepare by the Sol-gel TechniqueBokhimi, J. L. / Boldu, E. / Mu�oz, O. / Novaro, T. / Materials Research Society et al. | 1996
- 529
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Gold Nanocomposites Prepared by Reactive SputteringMaya, L. / Paranthaman, M. / Thundat, T. / Allen, W. R. / Materials Research Society et al. | 1996
- 535
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Thermal and Mechanical Characteristics of Polyimide Based CeramersMcDaniel, P. R. / StClair, T. L. / Materials Research Society et al. | 1996