Handbook of nanoscopy / ed. by Gustaaf van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycook ; Vol. 2 (Englisch)
- Neue Suche nach: Van Tendeloo, Gustaaf
- Weitere Informationen zu Van Tendeloo, Gustaaf:
- http://d-nb.info/gnd/1022132946
- Neue Suche nach: Van Dyck, Dirk
- Weitere Informationen zu Van Dyck, Dirk:
- http://d-nb.info/gnd/102467522X
- Neue Suche nach: Pennycook, Stephen J.
- Weitere Informationen zu Pennycook, Stephen J.:
- http://d-nb.info/gnd/1026205689
2012
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ISBN:
- Buch / Print
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Titel:Handbook of nanoscopy / ed. by Gustaaf van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycook ; Vol. 2
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Beteiligte:
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Verlag:
- Neue Suche nach: Wiley-VCH
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Erscheinungsort:Weinheim
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Erscheinungsdatum:2012
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Format / Umfang:XXXII S., S. 673 - 1380
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Anmerkungen:zahlr. Ill. und graph. Darst.
Literaturangaben -
ISBN:
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Medientyp:Buch
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 621.3
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Inhaltsverzeichnis E-Book
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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The Past, the Present, and the Future of NanoscopyVan Tendeloo, Gustaaf / Van Dyck, Dirk et al. | 2012
- 9
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Transmission Electron MicroscopyDe Graef, Marc et al. | 2012
- 45
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Atomic Resolution Electron MicroscopyVan Dyck, Dirk et al. | 2012
- 81
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Ultrahigh‐Resolution Transmission Electron Microscopy at Negative Spherical AberrationUrban, Knut W. / Barthel, Juri / Houben, Lothar / Jia, Chun‐Lin / Lentzen, Markus / Thust, Andreas / Tillmann, Karsten et al. | 2012
- 109
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Z‐Contrast ImagingPennycook, Stephen J. / Lupini, Anrew R. / Borisevich, Albina Y. / Oxley, Mark P. et al. | 2012
- 153
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Electron HolographyLichte, Hannes et al. | 2012
- 221
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Lorentz Microscopy and Electron Holography of Magnetic MaterialsDunin‐Borkowski, Rafal E. / Kasama, Takeshi / Beleggia, Marco / Pozzi, Giulio et al. | 2012
- 253
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Electron TomographyMidgley, Paul Anthony / Bals, Sara et al. | 2012
- 281
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Statistical Parameter Estimation Theory – A Tool for Quantitative Electron MicroscopyVan Aert, Sandra et al. | 2012
- 309
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Dynamic Transmission Electron MicroscopyBrowning, Nigel D. / Campbell, Geoffrey H. / Evans, James E. / LaGrange, Thomas B. / Jungjohann, Katherine L. / Kim, Judy S. / Masiel, Daniel J. / Reed, Bryan W. et al. | 2012
- 345
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Transmission Electron Microscopy as NanolabTichelaar, Frans D. / van Huis, Marijn A. / Zandbergen, Henny W. et al. | 2012
- 375
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Atomic‐Resolution Environmental Transmission Electron MicroscopyGai, Pratibha L. / Boyes, Edward D. et al. | 2012
- 405
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Speckles in Images and Diffraction PatternsTreacy, Michael M. J. et al. | 2012
- 437
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Coherent Electron Diffractive ImagingZuo, J. M. / Huang, Weijie et al. | 2012
- 473
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Sample Preparation Techniques for Transmission Electron MicroscopyÖzdöl, Vasfi Burak / Srot, Vesna / van Aken, Peter A. et al. | 2012
- 499
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Scanning Probe Microscopy – History, Background, and State of the ArtHeiderhoff, Ralf / Balk, Ludwig Josef et al. | 2012
- 539
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Scanning Probe Microscopy – Forces and Currents in the Nanoscale WorldRodriguez, Brian J. / Proksch, Roger / Maksymovych, Peter / Kalinin, Sergei V. et al. | 2012
- 615
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Scanning Beam MethodsJoy, David et al. | 2012
- 645
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Fundamentals of the Focused Ion Beam SystemYao, Nan et al. | 2012
- 673
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Low‐Energy Electron MicroscopyBauer, Ernst et al. | 2012
- 697
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Spin‐Polarized Low‐Energy Electron MicroscopyBauer, Ernst et al. | 2012
- 709
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Imaging Secondary Ion Mass SpectroscopyMoore, Katie L. / Schröder, Markus / Grovenor, Chris R. M. et al. | 2012
- 745
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Soft X‐Ray Imaging and SpectromicroscopyHitchcock, Adam P. et al. | 2012
- 793
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Atom Probe Tomography: Principle and ApplicationsDanoix, Frederic / Vurpillot, François et al. | 2012
- 833
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Signal and Noise Maximum Likelihood Estimation in MRISijbers, Jan et al. | 2012
- 855
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3‐D Surface Reconstruction from Stereo Scanning Electron Microscopy ImagesHuq, Shafik / Koschan, Andreas / Abidi, Mongi et al. | 2012
- 877
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NanoparticlesLópez‐Haro, Miguel / Delgado, Juan José / Hernández‐Garrido, Juan Carlos / López‐Castro, Juan de Dios / Mira, César / Trasobares, Susana / Hungría, Ana Belén / Pérez‐Omil, José Antonio / Calvino, José Juan et al. | 2012
- 961
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Nanowires and NanotubesDing, Yong / Wang, Zhong Lin et al. | 2012
- 995
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Carbon NanoformsBittencourt, Carla / Van Tendeloo, Gustaaf et al. | 2012
- 1071
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Metals and AlloysSchryvers, Dominique et al. | 2012
- 1099
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In situ Transmission Electron Microscopy on MetalsDe Hosson, J. Th. M. et al. | 2012
- 1153
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Semiconductors and Semiconducting DevicesBender, Hugo et al. | 2012
- 1179
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Complex Oxide MaterialsVarela, Maria / Pennycook, Timothy J. / Gazquez, Jaume / Borisevich, Albina Y. / Pantelides, Sokrates T. / Pennycook, Stephen J. et al. | 2012
- 1213
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Application of Transmission Electron Microscopy in the Research of Inorganic Photovoltaic MaterialsYan, Yanfa et al. | 2012
- 1247
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PolymersLoos, Joachim et al. | 2012
- 1273
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Ferroic and Multiferroic MaterialsSalje, Ekhard et al. | 2012
- 1303
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Three‐Dimensional Imaging of Biomaterials with Electron TomographyBárcena, Montserrat / Koning, Roman I. / Koster, Abraham J. et al. | 2012
- 1335
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Small Organic Molecules and Higher HomologsKolb, Ute / Gorelik, Tatiana E. et al. | 2012
- 1381
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Index| 2012
- I
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Front Matter| 2012