2014 IEEE Workshop on Microelectronics and Electron Devices (WMED) : 18 April 2014, Boise State University, Boise, ID (Englisch)
- Neue Suche nach: Institute of Electrical and Electronics Engineers
- Weitere Informationen zu Institute of Electrical and Electronics Engineers:
- http://d-nb.info/gnd/1692-5
- Neue Suche nach: IEEE Electron Devices Society, Boise Chapter
- Weitere Informationen zu IEEE Electron Devices Society, Boise Chapter:
- http://d-nb.info/gnd/6041534-4
- Neue Suche nach: Institute of Electrical and Electronics Engineers
- Weitere Informationen zu Institute of Electrical and Electronics Engineers:
- http://d-nb.info/gnd/1692-5
- Neue Suche nach: IEEE Electron Devices Society, Boise Chapter
- Weitere Informationen zu IEEE Electron Devices Society, Boise Chapter:
- http://d-nb.info/gnd/6041534-4
2014
- Konferenzband / Elektronische Ressource
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Titel:2014 IEEE Workshop on Microelectronics and Electron Devices (WMED) : 18 April 2014, Boise State University, Boise, ID
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Beteiligte:
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Kongress:IEEE Workshop on Microelectronics and Electron Devices ; 12 ; 2014 ; Boise, Idaho
WMED ; 12 ; 2014 ; Boise, Idaho -
Verlag:
- Neue Suche nach: IEEE
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Erscheinungsort:Piscataway, NJ
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Erscheinungsdatum:2014
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Format / Umfang:Online-Ressource
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Anmerkungen:Ill., graph. Darst.
Literaturangaben -
ISBN:
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Medientyp:Konferenzband
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Format:Elektronische Ressource
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Sprache:Englisch
- Neue Suche nach: 53.55
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
BKL: 53.55 Mikroelektronik -
Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Title page| 2014
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Contributed papers| 2014
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Invited tutorial: The classical/emerging reliability considerations of semiconductor devicesAlam, Muhammad A. et al. | 2014
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Dark current in standard CMOS pinned photodiodes for Time-of-Flight sensorsIllade-Quinteiro, J. / Brea, Victor M. / Lopez, P. / Blanco-Filgueira, B. / Cabello, D. / Domenech-Asensi, G. et al. | 2014
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Organizing committee| 2014
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Technical program| 2014
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Invited talk: The perfect memory stormKeeth, Brent et al. | 2014
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Plenary talk: Ubiquitous mobile computing — Growth driver for the semiconductor industry: Technology trends, challenges and opportunitiesYeap, Geoffrey et al. | 2014
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Microelectronics wirebond pull and shear test simulations using finite element methodHunter, Stevan / Hill, Levi W. et al. | 2014
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Keynote: Bionanoscience for innovative global healthcare research & technology (BIGHEART)Lee, Luke P. et al. | 2014
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Copyright page| 2014
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Welcome| 2014
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List of author| 2014
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Advance call for papers| 2014
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Low-current sensing circuit and topology for portable gamma radiation sensorAilavajhala, M. S. / Latif, M. R. / Mitkova, M. et al. | 2014
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Scanning frequency comb microscopy (SFCM) shows promise for sub-10 nm dopant profilingHagmann, Mark J. / Andrei, Petru et al. | 2014
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Invited talk: CMOS device scaling — Past, present, and futureTaur, Yuan et al. | 2014
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LDD implant process optimization for high voltage NMOS improvementLiu, Lequn Jennifer / Mikhalev, Vladimir / McLean, Nick / Irwin, Mike / Smith, Mike / Brumfield, Kyle / Evans, Mike / Qin, Shu / Hu, Y. Jeff / McTeer, Allen et al. | 2014
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Physically flexible high performance single crystal CMOS integrated with printed electronicsChaney, Richard L. / Hackler, Douglas R. / Wilson, Dale G. / Meek, Brian N. et al. | 2014
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Invited tutorial: Noise in amplifiers, mixers and oscillatorsLee, Tom et al. | 2014
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Invited talk: Automata processor and its applications in bioinformaticsAluru, Srinivas et al. | 2014
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Invited talk: 3D chip stackingFarooq, Mukta et al. | 2014
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The effect of Shallow Trench Isolation improvement on program disturb response in 20 nm NAND flash technologyChandrasekaran, Suresh / Venkatesan, Srivatsan / Eagle, Oliver H. / Iyengar, Vikram V. / Reyes, Art B. / Gowda, Srivardhan S. et al. | 2014
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List of paper| 2014
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Thermal budget impact on HKMG Al2O3 and La gate stacks for advanced DRAM periphery transistorsRitzenthaler, R. / Schram, T. / Spessot, A. / Caillat, C. / Na, H.-J. / Lee, S.-G. / Son, Y. / Noh, K. B. / Aoulaiche, M. / Arimura, H. et al. | 2014
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Invited talk: Early estimation of on-chip clock jitter accumulation — A brief tutorialHollis, Timothy M. et al. | 2014
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Ion beam effect on Ge-Se chalcogenide glass films: Non-volatile memory array formation, structural changes and device performanceLatif, M. R. / Nichol, T. L. / Mitkova, M. / Tenne, D. A. / Csarnovics, I. / Kokenyesi, S. / Csik, A. et al. | 2014
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Optimized process simulation of USJ for HKMG DRAM periphery transistorsSpessot, A. / Caillat, C. / Ritzenthaler, R. / Schram, T. / Fazan, P. et al. | 2014