17th IEEE Latin-American Test Symposium - LATS 2016 (Englisch)
- Neue Suche nach: lATS
- Neue Suche nach: Institute of Electrical and Electronics Engineers
- Weitere Informationen zu Institute of Electrical and Electronics Engineers:
- http://d-nb.info/gnd/1692-5
- Neue Suche nach: lATS
- Neue Suche nach: Institute of Electrical and Electronics Engineers
- Weitere Informationen zu Institute of Electrical and Electronics Engineers:
- http://d-nb.info/gnd/1692-5
2016
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ISBN:
- Konferenzband / Elektronische Ressource
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Titel:17th IEEE Latin-American Test Symposium - LATS 2016
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Beteiligte:lATS ( Autor:in ) / Institute of Electrical and Electronics Engineers ( Herausgebendes Organ )
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Kongress:IEEE Latin-American Test Symposium ; 17 ; 2016 ; Foz do Iguaçu
LATS ; 17 ; 2016 ; Foz do Iguaçu -
Verlag:
- Neue Suche nach: IEEE
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Erscheinungsort:[Piscataway, NJ]
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Erscheinungsdatum:2016
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Format / Umfang:1 Online-Ressource
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Anmerkungen:Illustrationen
Literaturangaben
"LATS2016, 17th IEEE Latin-American Test Symposium, Foz do Iguaçu, Brazil, 6th-9th April 2016" - Symposium-Programm -
ISBN:
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Medientyp:Konferenzband
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Format:Elektronische Ressource
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Sprache:Englisch
- Neue Suche nach: 53.15 / 53.55
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Copyright| 2016
- 1
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Technical program| 2016
- 1
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The hype, myths, and realities of testing 2.5D/3D integrated circuitsChakrabarty, Krishnendu et al. | 2016
- 1
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Known unknowns — Knowledge in the presence of unknownsBecker, Bernd et al. | 2016
- 1
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Welcome message| 2016
- 2
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Accessing on-chip instruments through the life-time of systemsLarsson, Erik / Zadegan, Farrokh Ghani et al. | 2016
- 6
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Transforming nanodevices into nanosystems: The N3XT 1,000XMitra, Subhasish et al. | 2016
- 7
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Spin transfer torque memories for on-chip caches: Prospects and perspectivesJaiswal, Akhilesh / Roy, Kaushik et al. | 2016
- 8
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Proposal of a functional safety methodology applied to fault tolerance in FPGA applicationsFlesch, Bruna F. / Brand, Bianca / de Figueiredo, Rodrigo Marques / Prade, Lucio Rene / Rosa da Silva, Marcio et al. | 2016
- 14
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Analysis of the effects of soft errors on compression algorithms through fault injection inside program variablesAvramenko, S. / Reorda, M. Sonza / Violante, M. / Fey, G. et al. | 2016
- 20
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A comprehensive approach to fault tolerance: Device, circuit, and system techniquesStamenkovic, Z. / Petrovic, V. et al. | 2016
- 21
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Auxiliary IP blocks for early dependability analysis of small processor based systemsBarboza, J. / Basualdo, J. / Acle, J. Perez et al. | 2016
- 27
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Dependability evaluation of COTS microprocessors via on-chip debugging facilitiesIsaza-Gonzalez, Jose / Serrano-Cases, Alejandro / Restrepo-Calle, Felipe / Cuenca-Asensi, Sergio / Martinez-Alvarez, Antonio et al. | 2016
- 33
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A comprehensive software-based self-test and self-repair method for statically scheduled superscalar processorsScholzel, Mario / Koal, Tobias / Muller, Sebastian / Scharoba, Stefan / Roder, Stephanie / Vierhaus, Heinrich T. et al. | 2016
- 39
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A probabilistic model for stuck-on faults in combinational logic gatesSchivittz, Rafael B. / Franco, Denis T. / Meinhardt, Cristina / Butzen, Paulo F. et al. | 2016
- 45
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Fault model qualification by assertion miningDanese, Alessandra / Mocci, Jacopo / Pravadelli, Graziano et al. | 2016
- 51
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A control path aware metric for grading functional test vectorsGent, Kelson / Hsiao, Michael S. et al. | 2016
- 57
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On the consolidation of mixed criticalities applications on multicore architecturesEsposito, Stefano / Avramenko, Sehriy / Violante, Massimo et al. | 2016
- 63
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Using traffic monitoring to tolerate multiple faults in 3D NoCsKologeski, Anelise / Zanuz, Henrique Colao / Kastensmidt, Fernanda et al. | 2016
- 69
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On-line fault classification and handling in IEEE1687 based fault management system for complex SoCsShibin, Konstantin / Devadze, Sergei / Jutman, Artur et al. | 2016
- 75
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Gate-level modelling of NBTI-induced delays under process variationsCopetti, Thiago / Medeiros, Guilherme / Poehls, Leticia Bolzani / Vargas, Fabian / Kostin, Sergei / Jenihhin, Maksim / Raik, Jaan / Ubar, Raimund et al. | 2016
- 81
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A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltageForero, Freddy / Gomez, Andres / Champac, Victor et al. | 2016
- 87
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Analyzing NBTI impact on SRAMs with resistive-open defectsMartins, M. Tulio / Medeiros, G. / Copetti, T. / Vargas, F. / Poehls, L. Bolzani et al. | 2016
- 93
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Evaluating the effects of single event upsets in soft-core GPGPUsNedel, Werner / Kastensmidt, Fernanda Lima / Azambuja, Jose Rodrigo et al. | 2016
- 99
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Hybrid soft error mitigation techniques for COTS processor-based systemsChielle, Eduardo / Du, Boyang / Kastensmidt, Fernanda L. / Cuenca-Asensi, Sergio / Sterpone, Luca / Reorda, Matteo Sonza et al. | 2016
- 105
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Attacking the smart grid using public informationKonstantinou, Charalambos / Sazos, Marios / Maniatakos, Michail et al. | 2016
- 111
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Radiation effects in low power and ultra low power voltage referencesFusco, Daniel / Balen, Tiago R. et al. | 2016
- 117
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Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET modelPetrosyants, Konstantin O. / Sambursky, Lev M. / Kharitonov, Igor A. / Lvov, Boris G. et al. | 2016
- 123
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Performance evaluation of radiation hardened analog circuits based on Enclosed Layout geometryCardoso, Guilherme S. / Balen, Tiago R. et al. | 2016
- 129
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Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defectKarel, Amit / Comte, Mariane / Galliere, Jean-Marc / Azais, Florence / Renovell, Michel et al. | 2016
- 135
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On-silicon validation of a benchmark generation methodology for effectively evaluating combinational cell library designDe Carvalho, M. / Altieri, M. / Puricelli, L. / Butzen, P. / Ribas, R. P. / Fabris, E. et al. | 2016
- 141
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A methodology for early functional verification of embedded software combining virtual platforms and bounded model checkingPaludo, Rogerio / Lettnin, Djones et al. | 2016
- 147
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Soft error analysis in embedded software developed with & without operating systemCasagrande, Luiz Gustavo / Kastensmidt, Fernanda Lima et al. | 2016
- 153
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A HW-dependent software model for cross-layer fault analysis in embedded systemsBartsch, Christian / Rodel, Nico / Villarraga, Carlos / Stoffel, Dominik / Kunz, Wolfgang et al. | 2016
- 159
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A SystemC-based platform for assertion-based verification and mutation analysis in systems biologyCoati, Daniele / Distefano, Rosario / Bombieri, Nicola / Fummi, Franco / Mirenda, Michela / Laudanna, Carlo / Giugno, Rosalba et al. | 2016
- 165
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Infrastructure for formal and dynamic verification of peripheral programming modelEncinas, Walter Soto / Romulo da Silva Araujo, Francisco / Abrahim, Harney et al. | 2016
- 171
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System-level diagnosis for WSN: A heuristicde Oliveira Barros, Mauricio / Weber, Andrea et al. | 2016
- 177
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On automatic software-based self-test program generation based on high-level decision diagramsJasnetski, Artjom / Ubar, Raimund / Tsertov, Anton et al. | 2016
- 178
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A deep analysis of SEU consequences in the internal memory of LEON3 processorKchaou, Afef / El Hadj Youssef, W. / Tourki, Rached / Bouesse, Fraidy / Ramos, Pablo / Velazco, Raoul et al. | 2016
- 179
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Soft error analysis at sequential and parallel applications in ARM Cortex-A9 dual-coreRodrigues, Gennaro Severino / Kastensmidt, Fernanda Lima et al. | 2016
- 180
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Reliability analysis of majority voters under permanent faultsLiebl, Eduardo / Meinhardt, Cristina / Butzen, Paulo F. et al. | 2016
- 181
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Single Trojan injection model generation and detectionBhamidipati, Harini / Saab, Daniel / Abraham, Jacob A. et al. | 2016
- 182
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Checksum based error detection in linearized representations of non linear control systemsBanerjee, Suvadeep / Chatterjee, Abhijit / Abraham, Jacob A. et al. | 2016
- 183
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Dependable on-chip infrastructure for dependable MPSOCsKochte, Michael A. / Wunderlich, Hans-Joachim et al. | 2016
- 189
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A layered approach for fault tolerant NoC-based MPSoCs — Special session: Dependable MPSoCsWachter, Eduardo / Barreto, Francisco / Fochi, Vinicuis / Amory, Alexandre M. / Moraes, Fernando G. et al. | 2016
- 195
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Three-Independent-Gate Transistors: Opportunities in digital, analog and RF applicationsGaillardon, Pierre-Emmanuel / Magni, Romain / Amaru, Luca / Hasan, Mehdi / Walker, Ross / Rodriguez, Berardi Sensale / Christmann, Jean-Frederic / Beigne, Edith et al. | 2016