Electrical Overstress/Electrostatic Discharge Symposium proceedings, 2001 : Portland, Oregon, September 11-13, 2001 (Englisch)
- Neue Suche nach: Electrical Overstress/Electrostatic Discharge Symposium
- Neue Suche nach: ESD Association
- Neue Suche nach: Institute of Electrical and Electronics Engineers
- Neue Suche nach: IEEE Electron Devices Society
- Neue Suche nach: Electrical Overstress/Electrostatic Discharge Symposium
- Neue Suche nach: ESD Association
- Neue Suche nach: Institute of Electrical and Electronics Engineers
- Neue Suche nach: IEEE Electron Devices Society
2001
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ISBN:
- Konferenzband / Elektronische Ressource
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Titel:Electrical Overstress/Electrostatic Discharge Symposium proceedings, 2001 : Portland, Oregon, September 11-13, 2001
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Weitere Titelangaben:23rd EOS/ESD Symposium proceedings
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01 -
Beteiligte:
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Kongress:Electrical Overstress/Electrostatic Discharge Symposium ; 23rd
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Verlag:
- Neue Suche nach: ESD Association
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Erscheinungsort:Rome, N.Y
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Erscheinungsdatum:2001
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Format / Umfang:1 Online-Ressource
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Anmerkungen:illustrations
"Ordering no. EOS-23
Includes bibliographical references
Title from PDF cover (IEEE Xplore, viewed on Dec. 17, 2009) -
ISBN:
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Medientyp:Konferenzband
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width-scalingMergens, Markus P. J. / Verhaege, Koen G. / Russ, Christian C. / Armer, John / Jozwiak, Phillip C. / Kolluri, Girija / Avery, Leslie R. et al. | 2001
- 12
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5-V tolerant fail-safe ESD solutions for 0.18µm logic CMOS processKunz, Keith / Duvvury, Charvaka / Shichijo, Hisashi et al. | 2001
- 22
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GGSCRs: GGNMOS Triggered silicon controlled rectifiers for ESD protection in deep sub-micron CMOS processesRuss, Christian C. / Mergens, Markus P. J. / Verhaege, Koen G. / Armer, John / Jozwiak, Phillip C. / Kolluri, Girija / Avery, Leslie R. et al. | 2001
- 32
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ESD protection design for mixed-voltage I/O buffer by using stacked-NMOS triggered SCR deviceKer, Ming-Dou / Chuang, Chien-Hui / Jiang, Hsin-Chin et al. | 2001
- 44
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An analysis of ESD packaging systems through thermoformingAllen, Jason et al. | 2001
- 50
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Performance of fiber based ESD protective packagingPaasi, J. / Vuorinen, R. / Maijala, P. / Palmen, H. / Salminen, V. et al. | 2001
- 55
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New ESD control material based on special carbonNishihata, Naomitsu et al. | 2001
- 61
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Analysis and improved compact modeling of the breakdown behavior of sub-0.25 micron ESD protection ggNMOS devicesVassilev, V. / Lorenzini, M. / Groeseneken, G. / Steyaert, M. / Maes, H. et al. | 2001
- 70
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Modeling substrate diodes under ultra high ESD injection conditionsBoselli, Gianluca / Ramaswamy, Sridhar / Amerasekera, Ajith / Mouthaan, Ton / Kuper, Fred et al. | 2001
- 81
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Modular, portable, and easily simulated ESD protection networks for advanced CMOS technologiesTorres, Cynthia A. / Miller, James W. / Stockinger, Michael / Akers, Matthew D. / Khazhinsky, Michael G. / Weldon, James C. et al. | 2001
- 95
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Automatic layout based verification of electrostatic discharge pathsNgan, Paul / Gramacy, Robert / Wong, Ching-Kwok / Oliver, Dan / Smedes, Theo et al. | 2001
- 101
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Experimental analysis and electro-thermal simulation of low- and high-voltage ESD protection bipolar devices in a Silicon-On-Insulator Bipolar-CMOS-DMOS technologyDepetro, R. / Mignoli, F. / Andreini, A. / Contiero, C. / Meneghesso, G. / Zanoni, E. et al. | 2001
- 109
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Human Body Model test of a Low Voltage Threshold SCR device: Simulation and comparison with the Transmission Line Pulse testGuilhaume, A. / Chante, J.P. / Galy, P. / Foucher, B. / Bardy, S. / Blanc, F. et al. | 2001
- 119
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Controlling ESD damage of ICs at various steps of back-end processMarley, John / Tan, David / Kraz, Vladimir et al. | 2001
- 124
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An effective ESD protection system in the Back end (BE) semiconductor manufacturing facilityYan, K-P / Gaertner, Reinhold / Lim, Seng et al. | 2001
- 132
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Preparing a microelectronics assembly and test area for more sensitive productLesniewski, Tom / Hartooni, Shoubert / Kaully, Eyal et al. | 2001
- 140
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Anodized Aluminum alloys, insulator or not?Bellmore, Donn G. et al. | 2001
- 148
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DC Transient Monitoring and analysis to prevent EOS in burn-in systemsJaimsomporn, Yong / Phunyapinuant, Surapol / Tan, Wayne et al. | 2001
- 152
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Measurement of electrostatic generation in semiconductor processing fluids as a result of pumping through insulative pumps and tubingNewberg, Carl et al. | 2001
- 159
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Field-induced charging and FIM ESD tests on GMR heads in Hard Disk AssemblyYap, Ber-Chin / Turangan, Julius et al. | 2001
- 166
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A study of shunt ESD protection for GMR recording headsWallash, Al et al. | 2001
- 171
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Field emission noise caused by capacitance coupling ESD in AMR/GMR headsOhtsu, Takayoshi / Yoshida, Hitoshi / Hatanaka, Noriaki et al. | 2001
- 174
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A study of GMR read sensor induced by soft ESD using Magnetoresistive Sensitivity Mapping (MSM)Hung, Silas T. / Wong, C.Y. / Osborn, Mark / Kagaoan, Joel / Zhang, L.Z. / Bordeos, Randy et al. | 2001
- 181
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Using PSPICE to study transient propagation in GMR circuitsHimle, Jenny et al. | 2001
- 186
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Effect of low-level ESD on the lifetime of GMR headsTsu, I-Fei / Davis, Marshall / Chang, Clifton et al. | 2001
- 190
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Development of substrate-pumped nMOS protection for a 0.13∝m technologySalling, Craig / Hu, Jerry / Wu, Jeff / Duvvury, Charvaka / Cline, Roger / Pok, Rith et al. | 2001
- 203
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Evaluation of diode-based and NMOS/Lnpn-based ESD protection strategies in a triple gate oxide thickness 0.13 µm CMOS logic technologyGauthier, Robert / Stadler, Wolfgang / Esmark, Kai / Riess, Philipp / Salman, Akram / Muhammad, Mujahid / Putnam, Chris et al. | 2001
- 214
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Study of trigger instabilities in smart power technology ESD protection devices using a laser interferometric thermal mapping techniquePogany, Dionyz / Furbock, Christoph / Litzenberger, Martin / Groos, Gerhard / Esmark, Kai / Kamvar, Parviz / Gossner, Harald / Stecher, Matthias / Gornik, Erich et al. | 2001
- 226
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Using thin emitters to control BVce0 effects in punch-through diodes for ESD protectionvan Dalen, R. / Hurkx, G.A.M. / in 't Zandt, M.A.A. / Hijzen, E.A. / Weijs, P.J.W. / den Dekker, A. et al. | 2001
- 236
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Human Body Model, Machine Model, and Charge Device Model ESD testing of surface micromachined microelectromechanical systems (MEMS)Walraven, Jeremy A. / Soden, Jerry M. / Cole, Edward I. / Tanner, Danelle M. / Anderson, Richard E. et al. | 2001
- 247
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Electrostatic Discharge and electrical overstress on GaN/InGaN Light Emitting DiodesMeneghesso, G. / Chini, A. / Maschietto, A. / Zanoni, E. / Malberti, P. / Ciappa, M. et al. | 2001
- 253
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Recent innovations of inherently conducting polymers for optimal (106–109 OHM/SQ) ESD protection materialsDahman, Sam J. et al. | 2001
- 260
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The purity, wetting, and electrical properties of static-dissipative surfactant coatings versus inherently-dissipative polymer alloysBucha, R.M. / Acevedo, M. et al. | 2001
- 265
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A study of the variables of electrodes used in the measurement of table and floor materials and how they affect the test resultsBerndt, Hartmut et al. | 2001
- 270
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Electronic part damage by antistat vaporKolyer, J. M. / Passchier, A. A. / Peterson, W. G. et al. | 2001
- 279
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A study of the electrical properties of polymeric materials used for gloves and finger cotsNewberg, Carl / Baumgartner, Ben / Chase, Gene / Casselman, William / Hartkopf, Arleigh / Jarrett, Tim / Metz, William J. / Rodrigo, Richard D. / Turangan, Julius / Vaughn, Julie et al. | 2001
- 286
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Contact transfer of anions from hands as a function of the use of hand lotionsWelker, Roger W. / Schulman, Mark et al. | 2001
- 290
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Transmission line pulse (TLP) testing of GMR recording headsWallash, Al et al. | 2001
- 294
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A study of GMR breakdown damage in cleaningDeng, Fei / Teng, ZhaoYu / Li, William / Tao, Rock et al. | 2001
- 298
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Voltage raised in Al2O3 gap of GMR head in the deshunting processSiritaratiwat, A. / Suwannata, N. / Pinnoi, J. / Pupaichitkul, C. et al. | 2001
- 304
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Wafer charging evaluation method of ion milling in GMR head manufacturing using antenna test element groupKakuta, Shigeru / Taniguchi, Hitoshi / Kondo, Akira / Ikeda, Hidehiro / Furusawa, Kenji / Todoroki, Satoru et al. | 2001
- 309
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ESD audit limits and actual damage thresholds: a theoretical analysisPerry, Bert et al. | 2001
- 316
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GMR heads as ESD detectors - a direct assessment of subtle ESDLuo, J. Sam / Yeh, Chin-Yu / Sanayei, Ali et al. | 2001
- 320
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The future of RF technology for established wireless markets and emerging wireless applicationsPehlke, David R. et al. | 2001
- 324
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Silicon Germanium heterojunction bipolar transistor ESD power clamps and the Johnson LimitVoldman, Steven H. / Botula, Alan / Hui, David T. / Juliano, Patrick A. et al. | 2001
- 335
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Diode network used as ESD protection in RF applicationsVelghe, R. M. D. A. / de Vreede, P. W. H. / Woerlee, P. H. et al. | 2001
- 344
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ESD protection design for CMOS RF integrated circuitsKer, Ming-Dou / Chen, Tung-Yang / Chang, Chyh-Yih et al. | 2001
- 353
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Analysis and optimization of distributed ESD protection circuits for high-speed mixed-signal and RF applicationsIto, Choshu / Banerjee, Kaustav / Dutton, Robert W. et al. | 2001
- 362
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Influence of process and device design on ESD sensitivity of a Silicon Germanium heterojunction bipolar transistorVoldman, Steven H. / Lanzerotti, Louis D. / Johnson, Robb A. et al. | 2001
- 371
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Broadband measurement of ESD risetimes to distinguish between different discharge mechanismsBonisch, Sven / Pommerenke, David / Kalkner, Wilfried et al. | 2001
- 383
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The EMI/ESD environment of large server installationsSmith, Douglas C. / Hogsett, Mark et al. | 2001
- 388
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Comparison of solutions to minimize voltages induced by ESD events on adjacent microstripsHarris, Jay et al. | 2001
- 396
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Improving the balanced coaxial differential probe for high-voltage pulse measurementsMaloney, Timothy J. / Cho, Dae-Hyung / Poon, Steven S. / Lisenker, Boris et al. | 2001
- 406
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Development of an experimental platform to study the effect of speed of approach on the electrostatic discharge (ESD) eventGreason, William D. / Kucerovsky, Zdenek / Zaharia, Cezar et al. | 2001
- 413
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Electromagnetic field generated by transient electrostatic discharges (ESD) from person charged with low electrostatic voltageHuang, Jiusheng / Deng, Qibin / Liu, Fang / Chen, Zhengxin / Liu, Peizhu et al. | 2001
- 417
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ESD evaluation by TLP method on advanced semiconductor devicesKato, Katsuhiro / Fukuda, Yasuhiro et al. | 2001
- 421
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The application of Transmission Line Pulse testing for the ESD analysis of integrated circuitsSmedes, T. / Velghe, R.M.D.A. / Ruth, R.S. / Huitsing, A.J. et al. | 2001
- 430
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Characterization of a 0.16mm CMOS Technology using SEMATECH ESD Benchmarking structuresAshton, R.A. / Smooha, Y. et al. | 2001
- 440
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Integration of TLP analysis for ESD troubleshootingTing, Li-Moum / Duvvury, Charvaka / Trevino, Oscar / Schichl, Joe / Diep, Tom et al. | 2001
- 448
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Correlation considerations: Real HBM to TLP and HBM testersBarth, Jon / Richner, John et al. | 2001
- 456
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Contributions to standardization of Transmission Line Pulse testing methodologyKeppens, B. / De Heyn, V. / Iyer, M. Natarajan / Groeseneken, G. et al. | 2001
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Cover| 2001
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[Title page]| 2001
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Copyright| 2001
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Table of Cotents| 2001