In situ ERDAstudies of ion drift processes during anodic bonding of alkali-borosilicate glass to metal (Englisch)
- Neue Suche nach: Kreissig, U.
- Neue Suche nach: Kreissig, U.
- Neue Suche nach: Grigull, S.
- Neue Suche nach: Lange, K.
- Neue Suche nach: Nitzsche, P.
- Neue Suche nach: Schmidt, B.
In:
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
;
136
; 674-679
;
1998
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:In situ ERDAstudies of ion drift processes during anodic bonding of alkali-borosilicate glass to metal
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Beteiligte:
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Erschienen in:
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Verlag:
- Neue Suche nach: Elsevier
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Erscheinungsort:Amsterdam [u.a.]
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Erscheinungsdatum:1998
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 535/3450
- Neue Suche nach: 33.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
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Datenquelle:
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- 42
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- 47
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- 55
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- 60
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Range parameters of gold and lead in carbon and carbon in gold at reduced energies of 10-3Friedland, E. et al. | 1998
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Low energy ion backscattering spectrometry of multi-layer targetsKlatt, Ch et al. | 1998
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- 166
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High resolution study of the KX-ray spectra from lowZ elementsKavcic, M. et al. | 1998
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Energy straggling induced errors in heavy-ion PIXEanalysisTadic, T. et al. | 1998
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Interpretation of ion channeling results from epitaxial Pt thin films and Co-Pt multilayersMcIntyre, P.C. et al. | 1998
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Ion beam studies of CdTe films epitaxially grown on Si, GaAs and sapphire substratesAlves, E. et al. | 1998
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Depth profiling sulphur in bulk CdTe and CdTe-CdS thin film heterojunctionsLane, D.W. et al. | 1998
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- 241
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Epitaxial regrowth of C- and N-implanted silicon and -quartzHarbsmeier, F. / Bolse, W. / Da Silva, M. R. / Da Silva, M. F. / Soares, J. C. et al. | 1998
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Observation of surface topography using an RBSmicrobeamSimon, A. et al. | 1998
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Development of a fast multi-parameter data acquisition system for microbeam analysesSakai, T. et al. | 1998
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Channelling and low energy electron induced X-ray spectroscopy on neon implanted beryllium single crystalDeconninck, B. et al. | 1998
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Measurement of laser annealed SiCGe by nuclear microprobe analysisCampbell, M.M. et al. | 1998
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Lattice site determination of Cr in low doped lithium niobate single crystals using PIXE-channelingKling, A. et al. | 1998
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Ion implantation in TiO2: Effect of the charge state on the lattice site occupationMeyer, O. et al. | 1998
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Lattice location of oxygen atoms in UO2 single crystals leached in waterNowicki, L. et al. | 1998
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Analysis of semiconductors by ion channelling: Applications and pitfallsWilliams, J.S. et al. | 1998
- 460
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- 483
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- 488
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Rutherford backscattering analysis of damage in ion implanted GaAs-Al0.44Ga0.56AsWendler, E. et al. | 1998
- 494
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- 499
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- 505
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- 516
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- 521
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- 528
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- 528
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- 533
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Morphological investigation of porous samples by resonant backscattering spectrometryPászti, F. et al. | 1998
- 540
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- 545
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Narrow nuclear resonance position or crosssection shapemeasurements with a highprecision computercontrolled beamenergy scanningsystemAmsel, G. et al. | 1998
- 551
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Study of ion implantation profiles by the PIXEtechniqueMidy, P. et al. | 1998
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Oxygen depth profiling in TiO~x/SiO~2 prepared by sol-gel method using ^1^6O(, )^1^6O resonant backscatteringMiyagawa, Y. / Saitoh, K. / Nakao, S. / Nonami, T. / Kato, K. / Taoda, H. / Miyagawa, S. et al. | 1998
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Oxygen depth profiling in TiOx-SiO2 prepared by sol-gel method using 16O(a,a)16O resonant backscatteringMiyagawa, Y. et al. | 1998
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Annealing behaviour and ranges of implanted ions in III-VandII-VI compound semiconductor materialsVäkeväinen, K. et al. | 1998
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On anomalous concentration depth profiles of atoms implanted intopolymersHnatowicz, V. et al. | 1998
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Elastic recoil detection analysis with heavy ion beamsDavies, J.A. et al. | 1998
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Elastic recoil detection with single atomic layer depth resolution .Dollinger, G. et al. | 1998
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The development of a facility for heavy-ion elastic recoil detection analysis at the Australian National UniversityTimmers, H. et al. | 1998
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Extremely thin silicon DeltaEdetectors for ion beam analysisWhitlow, Harry J. et al. | 1998
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Extremely thin silicon cap deltaE detectors for ion beam analysisWhitlow, H. J. / Winzell, T. / Thungstroem, G. et al. | 1998
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The Berlin time-of-flight ERDAsetupBohne, W. et al. | 1998
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-
A compact cap deltaE-E~r~e~s detector for elastic recoil detection with high sensitivityBergmaier, A. / Dollinger, G. / Frey, C. M. et al. | 1998
- 638
-
A compact DeltaE-Eres detector for elastic recoil detection with high sensitivityBergmaier, A. et al. | 1998
- 644
-
Time-of-flight ERDA of dual implanted metalsDytlewski, N. et al. | 1998
- 649
-
Limitations to depth resolution in high-energy, heavy-ion elastic recoil detection analysisElliman, R.G. et al. | 1998
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Elastic recoil detection using time-of-flight for analysis of TiN-AlSiCu-TiN-Ti contact metallization structuresGujrathi, S.C. et al. | 1998
- 669
-
Complementary scattered and recoiled ion data from ToF-E heavy ion elastic recoil detection analysisJohnston, P.N. et al. | 1998
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In situ ERDAstudies of ion drift processes during anodic bonding of alkali-borosilicate glass to metalKreissig, U. et al. | 1998
- 680
-
Application of ERDAmethod to study hydrogen and helium in Ti, Zr and NbmembranesNagata, S. et al. | 1998
- 685
-
Application of a DeltaE-Etelescope for sensitive ERDAmeasurement of hydrogenSweeney, R.J. et al. | 1998
- 685
-
Application of a cap deltaE-E telescope for sensitive ERDA measurement of hydrogenSweeney, R. J. / Prozesky, V. M. / Churms, C. L. / Padayachee, J. / Springhorn, K. et al. | 1998
- 689
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Ion beam analysis of oxidised a-C:D layers onBe -Acomparison of 4He RBS and 28Si ERDanalysisRoth, J. et al. | 1998
- 695
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A new setup for elastic recoil analysis using ion induced electron emission for particle identificationSteinbauer, E. et al. | 1998
- 701
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Theoretical approximation of energy distribution of elastically recoiled hydrogen atomsSzilágyi, E. et al. | 1998
- 707
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Radiation damage during heavy ion elastic recoil detection analysis of insulating materialsWalker, S.R. et al. | 1998
- 713
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Multiple scattering effects in depth resolution of elastic recoilWielunski, L. S. / Szilagyi, E. / Harding, G. L. et al. | 1998
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Multiple scattering effects in depth resolution of elastic recoil detectionWielunski, Leszek S. et al. | 1998
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Depth-selective defect analysis of Si implanted with As+ under channeling conditions using a variable-energy positron beamHirata, K. et al. | 1998
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Slow positron implantation spectroscopy of high current ion nitrided austenitic stainless steelAnwand, W. et al. | 1998
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Comparative study of kinetic energy spectra and mass distributions of Tan+ ions sputtered from tantalum by atomic and molecular ion bombardmentBelykh, S.F. et al. | 1998
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Combined TOF-MS-RBS analysis of LiF thin films bombarded by MeV nitrogen ionsPereira, J.A.M. et al. | 1998
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Study of iodine migration in zirconia using stable and radioactive ionimplantationChevarier, N. et al. | 1998
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Characterization of TiCN coatings deposited by magnetron sputter-ion plating process: RBSandGDOS complementary analysesFreire Jr, F.L. et al. | 1998
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Measurement of excess energies of ion beams extracted from a microwave ion sourceSakudo, N. et al. | 1998
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A novel analysis system of synchrotron-orbital-radiation-light induced photoemission coupled with ion scattering: SORISKido, Y. et al. | 1998
- 804
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Experimental test of the single adatom exchange model in surfactant-mediated growth of GeonSi(100)Bailes III, A.A. et al. | 1998
- 810
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Cyclotron-based high energy ion channelingvan IJzendoorn, L.J. et al. | 1998
- 816
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Channeling and blocking measurements on quasicrystalsPlachke, D. et al. | 1998
- 822
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Design of the entrance ion optics for SIMSandLEIS in situ monitoring of deposition processesPr°usa, S. et al. | 1998
- 825
-
The use of novel beam scanning techniques to image channeling patterns with a scanning nuclear microprobeSaint, A. et al. | 1998
- 831
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Identification of an unusual source of background signals in energy dispersive PIXEanalysis-A detective storyHietel, B. et al. | 1998
- 837
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Enhanced X-ray yields from insulating samplesJesus, A.P. et al. | 1998
- 841
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Development of the RMIT external beam facility forPIXEMoser, M. et al. | 1998
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Provenance study of rubies from a Parthian statuette by PIXEanalysisCalligaro, T. et al. | 1998
- 851
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PIXE and SEM studies of Tartesic gold artefactsOntalba Salamanca, M.A. et al. | 1998
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Weathering of glass in moist and polluted airCummings, K. et al. | 1998
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Non-destructive evaluation of glass corrosion statesMäder, M. et al. | 1998
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Insight into the usewear mechanism of archaeological flints by implantation of a marker ion and PIXE analysis of experimental toolsChristensen, M. et al. | 1998
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South American precious metals and the European economy: Ascientific adventure in the Discoveries timeGuerra, M.F. et al. | 1998
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PIXE analysis of Salado polychrome ceramics of the American SouthwestGosser, Dennis C. et al. | 1998
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Analysis of Mexican obsidians by IBA techniquesMurillo, G. et al. | 1998
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PIXE analysis of pottery from the recovery of a renaissance wreckZucchiatti, A. et al. | 1998
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Non-destructive analysis and appraisal of paper-like objectsDing, Huansheng et al. | 1998
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Initial inter-laboratory testing of the Rossendorf-Oxford (ROX97) secondary standard for X-ray analysisNeelmeijer, C. et al. | 1998
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IBAanalysis of a possible therapeutic ancient tooth inlayAndrade, E. et al. | 1998
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Amalgam components drift in teeth-toxicity risks: Apreliminary approachCarvalho, M.L. et al. | 1998
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Measurement of trace elements in tree rings using the PIXEmethodAoki, Toru et al. | 1998
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Target and matrix problems in the determination of trace elements in wood material byPIXERomo-Kröger, C.M. et al. | 1998
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PIXE analysis of proteins from a photochemical centerSolis, C. et al. | 1998
- 932
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Quantification byPIXE of metallic sites in proteins separated by electrophoresisStrivay, D. et al. | 1998
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Investigation of the calcium content in joint cartilage: Is it connected with (early arthrotic) changes in cartilage structure?Reinert, T. et al. | 1998
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Air particulate matter characterisation of a rural area in PortugalAlves, L.C. et al. | 1998
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Time resolved aerosol monitoring in the urban centre of SowetoFormenti, P. et al. | 1998