Low-energy electron diffraction study of atomic structure of Sc-O-W(100) surface acting as Schottky emitter at high temperatures (Englisch)
- Neue Suche nach: Iida, S.
- Neue Suche nach: Iida, S.
- Neue Suche nach: Tsujita, T.
- Neue Suche nach: Nagatomi, T.
- Neue Suche nach: Takai, Y.
In:
Surface and interface analysis
;
35
, 1
; 7-10
;
2003
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Low-energy electron diffraction study of atomic structure of Sc-O-W(100) surface acting as Schottky emitter at high temperatures
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Beteiligte:
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Erschienen in:Surface and interface analysis ; 35, 1 ; 7-10
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Verlag:
- Neue Suche nach: Wiley
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Erscheinungsort:Chichester [u.a.]
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Erscheinungsdatum:2003
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00 / 33.68 / 33.68 / 51.00
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 020/3485
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Schlagwörter:
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Klassifikation:
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Datenquelle:
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- 1
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PrefaceOshima, Chuhei / Koshikawa, Takanori et al. | 2003
- 2
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Direct observation of growth motion of elements by ultrahigh vacuum scanning electron microscopy combined with total reflection angle x‐ray spectroscopyYamanaka, Toshiro / Shimomura, Naoharu / Ino, Shozo et al. | 2003
- 7
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Low‐energy electron diffraction study of atomic structure of Sc–O/W(100) surface acting as Schottky emitter at high temperaturesIida, S. / Tsujita, T. / Nagatomi, T. / Takai, Y. et al. | 2003
- 11
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- 15
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- 19
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- 24
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- 29
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- 36
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- 40
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- 45
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- 51
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- 55
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- 80
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- 104
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