Study of the amorphization of ion-irradiated yttrium iron garnet by high-resolution diffraction techniques (Englisch)
- Neue Suche nach: Costantini, J.M.
- Neue Suche nach: Costantini, J.M.
- Neue Suche nach: Brisard, F.
- Neue Suche nach: Autissier, L.
- Neue Suche nach: Caput, M.
- Neue Suche nach: Ravel, F.
In:
Journal of physics / D
;
26
, 4
; 57-61
;
1993
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Study of the amorphization of ion-irradiated yttrium iron garnet by high-resolution diffraction techniques
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Beteiligte:
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Erschienen in:Journal of physics / D ; 26, 4 ; 57-61
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Verlag:
- Neue Suche nach: IOP Publ.
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Erscheinungsort:Bristol
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Erscheinungsdatum:1993
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 26, Ausgabe 4
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- 1
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The early days of high-resolution x-ray topographyLang, A.R. et al. | 1993
- 9
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Present status of the topography and high-resolution diffraction beamline at the ESRFBaruchel, J. et al. | 1993
- 15
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Image enhancement of x-ray topographs by Fourier filteringEpelboin, Y. et al. | 1993
- 19
-
Detectors for synchrotron x-ray topographyKoch, A. et al. | 1993
- 22
-
Analysis of (n, -n) and (n, -n, n) x-ray rocking curves of processed siliconServidori, M. et al. | 1993
- 29
-
Possibilities of x-ray interference diffractometry for the reconstruction of two-dimensional lattice deformation profiles in crystalsAristov, V.V. et al. | 1993
- 32
-
A novel Guinier diffractometer with automated adjustment and settingsIhringer, J. et al. | 1993
- 35
-
Combining four-crystal seven-reflection and three-crystal five-reflection diffractometry for the characterization of ZnSe layers grown on GaAs by MOVPEKoppensteiner, E. / Ryan, T.W. / Heuken, M. / Söllner, J. et al. | 1993
- 35
-
Combining four-crystal seven-reflection and three-crystal five-reflection diffractrometry for the characterization of ZnSe layers grown on GaAs by MOVPEKoppensteiner, E. et al. | 1993
- 41
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X-ray focusing by the zone plate in Laue geometrySnigirev, A.A. et al. | 1993
- 45
-
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- 50
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- 53
-
Towards a rigorous treatment of the wave-fiela propagation according to the statistical theory of dynamical diffractionChukhovskii, F.N. et al. | 1993
- 57
-
Study of the amorphization of ion-irradiated yttrium iron garnet by high-resolution diffraction techniquesCostantini, J.M. et al. | 1993
- 62
-
X-ray topographic study of defects in annealed siliconGronkowski, J. et al. | 1993
- 65
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X-ray topography studies of the defect depth profile in processed silicon wafersHalfpenny, P.J. et al. | 1993
- 69
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- 73
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- 76
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- 82
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- 86
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- 92
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- 98
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- 102
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- 107
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- 115
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- 120
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- 126
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- 131
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- 137
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- 142
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Characterization of quantum wells by x-ray diffractionFewster, P.F. et al. | 1993
- 146
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X-ray diffractometry of small defects in layered systemsHoly, V. et al. | 1993
- 151
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X-ray scattering from multiple-layer structures forming Bragg-case interferometersTanner, B.K. et al. | 1993
- 156
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Investigation of Si-Ge heterostructures by x-ray reflectometryBaribeau, J.-M. et al. | 1993
- 161
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X-ray scattering and topography studies of Hg1 xMnxTe epitaxial filmsHallam, T.D. et al. | 1993
- 167
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Structural characterization of GaAs-GaP superlatticesMazuelas, A. et al. | 1993
- 173
-
Characterization of III-V heteroepitaxial layers by x-ray diffractionPacherova, O. et al. | 1993
- 177
-
Simulation of x-ray diffraction curves from ion-implanted wafers and relaxed II-VI superlatticesPesek, A. et al. | 1993
- 181
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X-ray diffraction determination of a semiconductor epilayer unit cell oriented and distorted arbitrarilyUsher, B.F. et al. | 1993
- 188
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Determination of strain in epitaxial semiconductor layers by high-resolution x-ray diffractionSluis, P.van der et al. | 1993
- 192
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Multisite occupancy in alkali-silicon(111) interface studied with xswCastrucci, P. et al. | 1993
- 197
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Theoretical investigations of secondary emission yield and standing waves in curved crystals under dynamical Bragg diffraction of x-rays (Taupin problem)Vartanyantz, I.A. et al. | 1993
- 202
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X-ray total external reflection fluorescence study of LB films on solid substrateZheludeva, S.I. et al. | 1993
- 206
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X-ray standing waves in LSM for characterization of ultra-thin filmsZheludeva, S.I. et al. | 1993
- 507
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A comparison of Monte Carlo simulations of electron scattering and X-ray production in solidsDing Ze-Jun / Wu Ziqin et al. | 1993
- 517
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Anisotropic impedance boundary condition for a cylindrical conductor coated with a bi-isotropic mediumDajun Cheng / Weigan Lin / Yushen Zhao et al. | 1993
- 522
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The relativistic fifth-order geometrical aberrations of a combined focusing-deflection systemYu Li / Shuangqi Kuang / Zhiqiang Feng / Tingyu Liu et al. | 1993
- 539
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Chemical effects of 100 keV primary electrons in an e-beam sustained carbon dioxide laser dischargeD V Willetts / M R Harris et al. | 1993
- 546
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Numerical investigation of CW CO2 laser with a fast turbulent flowM G Baeva / P A Atanasov et al. | 1993
- 552
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Numerical modelling of fast-flow CO2 lasers. I. The modelR Rudolph / A Harendt / P Bisin / H Gundel et al. | 1993
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Determination of gadolinium thermal conductivity using experimentally measured values of thermal diffusivityC Meis / A K Froment / D Moulinier et al. | 1993
- 563
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- 585
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Emission spectroscopy of the plasma in the cathode region of N2-H2 abnormal glow discharges for steel surface nitridingK Rusnak / J Vicek et al. | 1993
- 590
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An improved analysis of the thermophoretic force on a small particle suspended in a rarefied plasmaXi Chen / Xin Tao et al. | 1993
- 590
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An improved analysis of the thermophoretic force on a small particle suspended in a rarefield plasmaChen, X. / Tao, X. et al. | 1993
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Simulations of side-wall profiles in reactive ion etchingP W May / D Field / D F Klemperer et al. | 1993
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Experimental confirmation of positive-streamer-like mechanism for negative corona current pulse riseM Cernak / T Hosokawa / I Odrobina et al. | 1993
- 619
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Fractal characteristics of electrical discharges: experiments and simulationN Femia / L Niemeyer / V Tucci et al. | 1993
- 628
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Corona triode current-voltage characteristics: on effects possibly caused by the electronic componentG F Leal Ferreira / D L Chinaglia / J A Giacometti / O N Oliveira Jr et al. | 1993
- 634
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A one-dimensional theory for the electrode sheaths of electric arcsR Morrow / J J Lowke et al. | 1993
- 643
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A method to decrease the normal current density at the cathode of a glow dischargeV Nemchinsky et al. | 1993
- 647
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Experimental and theoretical study of the CF4 DC glow discharge positive columnV N Volynets / A V Lukyanova / A T Rakhimov / D I Slovetsky / N V Suetin et al. | 1993
- 647
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Experimental and theoretical study of the CF4 DC 910W discharge positive columnVolynets, V.N. et al. | 1993
- 657
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Effect of a non-ideal state equation on the steady state critical flow characteristics in ablative capillariesD Zoler / S Cuperman / J Ashkenazy / M Caner / Z Kaplan et al. | 1993
- 667
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Green function calculation of effective elastic constants of textured polycrystalline materialsT Dutta / T K Ballabh / T R Middya et al. | 1993
- 676
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Electrical conduction in calcium yttrium titanium cobalt oxide Ca~1~-~xY~xTi~1~-~xCo~xO~3 (X 0.15)Parkash, O. / Tewari, H. S. / Tare, V. B. / Kumar, D. et al. | 1993
- 676
-
Electrical conduction in calcium yttrium titanium cobalt oxide Ca1-xYxTi1-xCoxO3 (xO Parkash / H S Tewari / V B Tare / D Kumar et al. | 1993
- 676
-
Electrical conduction in calcium yttrium titanium cobalt oxide Ca1 XYXT1-XCoxo3 (x< 0.15)Parkash, O. et al. | 1993
- 680
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Conductive polymer films by reticulate doping with mixed valence polyiodides: comparison of three methods of preparationA Tracz / J K Jeszkat / M Kryszewski / H Strzelecka / M Veber / C Jallabert et al. | 1993
- 686
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Out of plane axial reorganization and phase change in Langmuir-Blodgett films of a mesomorphic side chain polymerM Vandevyver / P Keller / M Rouillay / J -P Bourgoin / A Barraud et al. | 1993
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Thermally stimulated discharge of electron-beam- and corona-charged polyprolene filmsYang, G.M. et al. | 1993
- 690
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Thermally stimulated discharge of electron-beam-and corona-charged polypropylene filmsG M Yang et al. | 1993
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On the peak shape method for the determination of activation energy in TSL and TSCR K Gartia / S Joychandra Singh / T S Chandra Singh / P S Mazumdar et al. | 1993
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Field emission of electrons from glass tips with internal conducting coatsM S Mousa / D B Hibbert et al. | 1993
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CdSxTe1-x films: preparation and propertiesR Pal / J Dutta / S Chaudhuri / A K Pal et al. | 1993
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Material transport in high-pressure diode sputteringE K Hollmann / A G Zaitsev et al. | 1993
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- 717
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Narrow angle emission from a lithium liquid metal ion sourceE Hesse / F K Naehring et al. | 1993
- A41
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X-ray focusing by the zone plate in Laue geomerySnigirev, A.A. / Suvorov, A.Y. et al. | 1993
-
White beam synchrotron topography and gamma-ray diffractometry characterization of the crystalline quality of single-grain superalloys: influence of the solidification conditionsBellet, D. / Bastie, P. / Baruchel, J. et al. | 1993
-
In situ observations by synchrotron white beam x-ray topography of the planar, cellular and dendritic growths of a binary alloyGrange, G. / Jourdan, C. / Gastaldi, J. et al. | 1993
-
X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growthBarnett, S. J. / Whitehouse, C. R. / Keir, A. M. / Clark, G. F. et al. | 1993
-
Multisite occupancy in alkali/silicon(111) interface studies with xswCastrucci, P. / Lagomarsino, S. / Scarinci, F. / Giannini, C. et al. | 1993
-
Towards a rigorous treatment of the wave-field propagation according to the statistical theory of dynamical diffractionChukhovskii, F. N. / Guigay, J. P. et al. | 1993
-
X-ray topographic contrast on dislocations with gb = OGemperlova, J. / Polcarova, M. / Bradler, J. et al. | 1993
-
Synchrotron topography of phase transition in perovskite-like crystalsDudley, M. / Yao, G.-D. et al. | 1993