3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography (Englisch)
- Neue Suche nach: Egaas, Brian
- Neue Suche nach: Egaas, Brian
- Neue Suche nach: Diercks, David R
- Neue Suche nach: Gorman, Brian
- Neue Suche nach: Al-Jassim, Mowafak
- Neue Suche nach: Stokes, Adam
In:
Acta materialia
;
102
; 32-37
;
2016
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography
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Beteiligte:
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Erschienen in:Acta materialia ; 102 ; 32-37
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Verlag:
- Neue Suche nach: Elsevier Science
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Erscheinungsort:Kidlington
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Erscheinungsdatum:2016
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
BKL: 51.00 Werkstoffkunde: Allgemeines -
Datenquelle:
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3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomographyStokes, Adam / Al-Jassim, Mowafak / Diercks, David R. / Egaas, Brian / Gorman, Brian et al. | 2015
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