High temperature X-ray diffraction studies of the crystallization process of thin amorphous films with the chemical composition $ CrSi_{2.57} $ (Englisch)
- Neue Suche nach: Pitschke, W.
- Neue Suche nach: Koch, M.
- Neue Suche nach: Heinrich, A.
- Neue Suche nach: Schumann, J.
- Neue Suche nach: Pitschke, W.
- Neue Suche nach: Koch, M.
- Neue Suche nach: Heinrich, A.
- Neue Suche nach: Schumann, J.
In:
Fresenius' Journal of Analytical Chemistry
;
349
, 1-3
; 246-247
;
1994
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:High temperature X-ray diffraction studies of the crystallization process of thin amorphous films with the chemical composition $ CrSi_{2.57} $
-
Beteiligte:Pitschke, W. ( Autor:in ) / Koch, M. ( Autor:in ) / Heinrich, A. ( Autor:in ) / Schumann, J. ( Autor:in )
-
Erschienen in:Fresenius' Journal of Analytical Chemistry ; 349, 1-3 ; 246-247
-
Verlag:
- Neue Suche nach: Springer-Verlag
- Neue Suche nach: Springer
-
Erscheinungsort:Berlin
-
Erscheinungsdatum:1994
-
ISSN:
-
ZDBID:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 42.03 / 35.23 / 35.71
- Weitere Informationen zu Basisklassifikation
-
Schlagwörter:
-
Klassifikation:
-
Datenquelle:
Inhaltsverzeichnis – Band 349, Ausgabe 1-3
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
-
Working party on analytical chemistry (WPAC)Kellner, Robert / te Nijenhuis, Bauke et al. | 1994
- 2
-
Seventh international conference on the analysis of solidsMarx, Günther / Heyner, Ralf et al. | 1994
- 4
-
Micro and two-dimensional NIR FT Raman spectroscopySchrader, B. et al. | 1994
- 11
-
Interfacial phenomena in the oxidation and high temperature corrosion of metals and alloysGrabke, H. J. et al. | 1994
- 20
-
The use of plasma atomic spectrometric methods for the analysis of ceramic powdersBroekaert, J. A. C. / Lathen, C. / Brandt, R. / Pilger, C. / Pollmann, D. / Tschöpel, P. / Tölg, G. et al. | 1994
- 26
-
Mössbauer spectroscopy and structural analysis of solidsZemčik, Tomáš et al. | 1994
- 26
-
Moessbauer spectroscopy and structural analysis of solidsZemcik, T. et al. | 1994
- 32
-
Sliding spark spectroscopy — a new excitation source for generating atomic emission spectra for analysisGolloch, Alfred / Seidel, Timur et al. | 1994
- 36
-
Characterization of metallic and ceramic high-temperature materials for energy systemsNickel, H. / Wetzig, K. et al. | 1994
- 49
-
Structure and chemistry of interfacesRühle, M. et al. | 1994
- 58
-
Polymer films on metals investigated by optical second harmonic generationBuck, M. / Dressler, Ch. / Grunze, M. / Schaich, T. / Schrepp, W. / Segal, D. / Träger, F. et al. | 1994
- 63
-
Electron holography for analysis of atomic structuresLichte, H. et al. | 1994
- 64
-
Reactions at solid state surfaces and thin films by means of in situ electron microscopyWetzig, Klaus et al. | 1994
- 71
-
Metal/zirconia catalysts for the synthesis of methanol: characterization by vibrational spectroscopyWokaun, A. / Weigel, J. / Kilo, M. / Baiker, A. et al. | 1994
- 76
-
Raman spectroscopic studies on the structure of materials, specially of glasses, ceramics, films and fibresReich, Peter / Witke, Klaus / Brzezinka, Klaus-Werner et al. | 1994
- 84
-
Thermal analysis and microstructure of solids and solid state reactionsMeyer, K. / Schultze, D. et al. | 1994
- 91
-
X-Ray diffraction at high temperaturesMattern, N. / Pitschke, W. / Danzig, A. / Doyle, S. et al. | 1994
- 97
-
Structural investigations under high pressure conditionsTkacz, M. / Baranowski, B. et al. | 1994
- 102
-
Three-dimensional field ion mass spectrometryLeisch, M. et al. | 1994
- 107
-
Optical switching of azobenzene sidechain molecules observed by surface plasmon spectroscopyKnobloch, Harald / Orendi, Horst / Büchel, Michael / Sawodny, Michael / Schmidt, Albert / Knoll, Wolfgang et al. | 1994
- 112
-
Solid-state NMR as an analytical technique offering spatially resolved chemical informationNeue, G. / Skibbe, U. / Dybowski, C. et al. | 1994
- 117
-
Analysis of solid state reactions at film-substrate interfaces by electron microscopyHesse, D. et al. | 1994
- 122
-
Analytical transmission electron microscopy in the nanometer-regionRöder, A. / Bauer, H.-D. et al. | 1994
- 131
-
Laser solid sampling for a solid-state-detector ICP emission spectrometerNölte, Joachim / Moenke-Blankenburg, Lieselotte / Schumann, Thomas et al. | 1994
- 136
-
In-situ HEED structure analysis of $ AlN_{x} $ films grown by the simultaneous use of a radical beam source and ICB techniquevon Richthofen, A. / Neuschütz, D. et al. | 1994
- 136
-
In-situ HEED structure analysis of AINx films grown by the simultaneous use of a radical beam source and ICB techniqueRichthofen, A.von et al. | 1994
- 140
-
Quantification of SIMS depth profiles of ODS-superalloys by using cluster ion formation from reactive primary ionsOswald, S. / Quadakkers, W. J. et al. | 1994
- 141
-
AES Characterization of passive layers on gasoxinitrided steel surfaces after a corrosive attack in a NaCl solutionFriedrich, S. et al. | 1994
- 143
-
Investigation of carbonaceous insulating films by electron beam X-ray microanalysisBaumann, W. / Weise, K. / Marx, G. et al. | 1994
- 144
-
Angle-resolved X-ray fluorescence spectrometry using synchrotron radiation at ELSASchmitt, W. et al. | 1994
- 145
-
Studies on secondary synthesis and characterisation of boron-modified ZSM-5 zeolitesMeier, Brit / Reschetilowski, Wladimir et al. | 1994
- 147
-
Analysis of guest molecules in clathrasilsSterzel, W. et al. | 1994
- 148
-
SEM and EDXS analysis of the reaction products of compounds $ A_{x} $$ M_{6} $$ X_{8} $ (A = Tl, K; M = V, Ti; X = S, Se) with $ I_{2} $/$ CH_{3} $CN and $ H_{2} $OKoy, J. / Bensch, W. et al. | 1994
- 148
-
SEM and EDXS analysis of the reaction products of compounds A~xM~8X~6 (A = Tl, K; M = V, Ti; X = S, Se) with I~2/CH~3CN and H~2OKoy, J. / Bensch, W. et al. | 1994
- 148
-
SEM and EDXS analysis of the reaction products of compounds A X)M6X8 (AKoy, J. et al. | 1994
- 150
-
Microanalytical and metallographic characterization of interactions between YBaCuO superconductors and various substratesBächer, I. et al. | 1994
- 152
-
Investigation of mixed oxides $ Cu_{x} $$ Zn_{1−x} $$ Nb_{2} $$ O_{6} $Norwig, J. / Weitzel, H. / Fueß, H. et al. | 1994
- 153
-
Investigations of the carbide phase and the matrix of non-ledeburitic high-speed steel with Ti and Nb by atomic absorption spectrometry and energy dispersive X-ray spectroscopy methodsRichter, J. et al. | 1994
- 155
-
Diffraction studies on the size dependence of the t-->m transformation of zirconiaOestreich, Ch et al. | 1994
- 157
-
Characterization of iron-silicon thin films by means of electron diffraction and X-ray spectroscopyThomas, J. et al. | 1994
- 160
-
Structural investigations on pyrolysed polycarbosilanesMartin, H.-P. / Irmer, G. / Schuster, G. / Müller, E. et al. | 1994
- 162
-
Structural investigations of silicon-rich CVD-SiCNeuhäuser, J. et al. | 1994
- 163
-
Time and temperature resolved X-ray diffraction for studies of solid state reactions and phase transitionsJuez-Lorenzo, M. / Kolarik, V. / Herrmann, M. / Engel, W. / Eisenreich, N. et al. | 1994
- 165
-
Measurement of residual stresses in heat treated steelsWeise, A. / Lippmann, S. / Fritsche, G. et al. | 1994
- 167
-
Raman spectroscopy of carbon fibresMeyer, N. / Marx, G. / Brzezinka, K. W. et al. | 1994
- 168
-
Decreasing the detection limits to ppq levels for high purity silicon analysis by instrumental neutron activation analysis with kilogram sampling weightLin, Xilei et al. | 1994
- 170
-
Investigation of gas-solid reactions by means of thermal analysis/mass spectrometryJaenicke-Rößler, K. / Leitner, G. / Müller, F. et al. | 1994
- 172
-
Analysis of building stone decay by computer assisted IR spectroscopyHippe, Z.S. et al. | 1994
- 173
-
Reliability of impurity diffusion measurements using the sandwich technique and electron-probe-microanalysisBergner, D. et al. | 1994
- 173
-
Reliability of impurity diffusion measurements using the sandwich techniques and electron-probe-microanalysisBergner, D. / Richter, K. et al. | 1994
- 174
-
Direct solid sample analysis of SiC-powders by DC glow discharge and DC-ARC emission spectroscopyFlorián, K. et al. | 1994
- 176
-
Contribution to the characterization of reference materials for thin-film analysis in solar-energy and semiconductor technologiesGarten, R.P.H. et al. | 1994
- 177
-
On the chemical durability of a metal-metalloid glass from the alloy (Fe,Cr)80(P,C,Si)20 in hardened Portland cement investigated by FT-IRRS, ESCA, and SEM-EDXBorn, D. et al. | 1994
- 179
-
Investigations of the microchemistry of interlayers in fibre-matrix compositesSchneider, R. et al. | 1994
- 181
-
Characterization of BN-films deposited onto carbon fibres by a continuous CVD-processHinke, S. / Stöckel, S. / Marx, G. et al. | 1994
- 182
-
A simple method for local resolved electrochemical surface characterisationMüller, W.-D. / Ibendorf, K. et al. | 1994
- 184
-
SIMS-characterization of ultra shallow boron-profiles after BF+-2- and B+-low-energy-implantation in siliconKretzer, O. et al. | 1994
- 186
-
Maximum entropy deconvolution of secondary ion mass spectra with a measured responseRitter, M. et al. | 1994
- 190
-
In-situ investigation of surface reactions on alkali halides by atomic force microscopyProhaska, T. et al. | 1994
- 194
-
Model calculations of interface segregation in dilute systemsEisl, M. M. / Reichl, B. M. / Böhmig, S. D. / Störi, H. et al. | 1994
- 196
-
Investigation of the segregation on a Fe-3.5at% Si bicrystal with AES and SAMReichl, B. M. / Eisl, M. M. / Böhmig, S. D. / Biedermann, A. / Störi, H. et al. | 1994
- 197
-
Automatic matching of SAM, SIMS and EPMA imagesBöhmig, S. D. / Reich, B. M. / Störi, H. / Hutter, H. et al. | 1994
- 199
-
Surface segregation of Pt10Ni90(110): experimental and theoretical resultsWeigand, P. et al. | 1994
- 201
-
Chemical analysis of PtXNi1-x alloy single crystal surfaces by scanning tunnelling microscopyBiedermann, A. et al. | 1994
- 201
-
Chemical analysis of Pt~xNi~1~-~x alloy single crystal surfaces by scanning tunneling microscopyBiedermann, A. / Schmid, M. / Varga, P. et al. | 1994
- 203
-
Calibration of depth profiles of microparticles measured with plasma-based secondary neutral mass spectrometryGoschnick, J. / Schuricht, J. / Ache, H. J. et al. | 1994
- 205
-
Depth-resolved speciation of nitrogen compounds in environmental solidsBentz, J. W. G. / Fichtner, M. / Goschnick, J. / Ache, H.-J. et al. | 1994
- 207
-
Measurement of isotope ratios in solids by glow discharge mass spectrometryEcker, K. H. / Pritzkow, W. et al. | 1994
- 208
-
Calibration standards for composition-depth profiles of non-stoichiometric titanium nitride coatingsStock, H.-R. et al. | 1994
- 209
-
Depth profiling of frictional brass coated steel samples by glow discharge mass spectrometryBehn, U. / Gerbig, F. A. / Albrecht, H. et al. | 1994
- 210
-
Effects of a controlled N2 and O2 addition to Ar on the analytical parameters of the GD-OESFischer, W. et al. | 1994
- 214
-
Description of sputter removal during auger depth profiling of rough oxide layersBaunack, S. / Barchmann, R. / Winkler, R. et al. | 1994
- 215
-
Analytics of hard amorphous silicon containing PECVD-coatingsHeyner, R. et al. | 1994
- 216
-
Characterization of oxide scales on coatings for gas turbine blades by infrared reflection-absorption spectroscopyScherübl, T. et al. | 1994
- 219
-
Chemical modification of silica surfacesReuter, A. et al. | 1994
- 221
-
TOF-SIMS and FT-IR investigations of surface modified silicon wafers — porous siliconDietrich, R. / Grobe, J. / Meyer, K. / Hagenhoff, B. / Benninghoven, A. et al. | 1994
- 223
-
Investigation of the insertion of water in hydrated layers of silicate electrode glassesHerzog, K. / Scholz, K. / Thomas, B. et al. | 1994
- 224
-
Surface Scanning Micro Raman SpectroscopyLankers, M. et al. | 1994
- 225
-
Solid state analysis in mechanochemistry by high resolution 27)Al solid state NMR spectroscopyStorek, W. et al. | 1994
- 227
-
Determination of Debye temperatures of supported ion particles by Moessbauer spectroscopyMohr, C. / Bieber, S. / Nagorny, K. et al. | 1994
- 227
-
Determination of Debye temperatures of supported ion particles by Mössbauer spectroscopyMohr, C. et al. | 1994
- 228
-
Thiocyanate bond mode determination on solid manganese(II) mixed ligand coordination compoundsBöhland, H. / König, G. / Berg, I. / Umbreit, H. et al. | 1994
- 230
-
XAS and XRD studies of rhenium-oxygen compoundsWltschek, G. / Fröba, M. / Fuess, H. / Metz, W. et al. | 1994
- 231
-
Neutron and X-ray investigations on the oxygen bonding in $ YBa_{2} $$ Cu_{3} $$ O_{7-x} $ combined with physico-chemical methodsGroße, M. / Schuster, G. / Teske, K. / Anwand, W. / Henkel, K. et al. | 1994
- 233
-
ARXPS-analysis and morphology of sputtered nanocrystalline TiC-SiC coatingsHornetz, B. et al. | 1994
- 235
-
Investigation of the rubber-metal bonding system by means of analytical electron microscopy and comparison with results of technical tear strength measurementsKretzschmar, T. et al. | 1994
- 237
-
Complex solid state physical investigations of metal layers on plasticsMann, D. et al. | 1994
- 238
-
TEM-cross section investigations of plasma polymer silver composite filmsGrünewald, W. et al. | 1994
- 239
-
Cross-section TEM for examinations of selective tungsten CVD for via hole fillingGrünewald, W. / Schulz, S. E. et al. | 1994
- 241
-
Investigations of thin hydrogenated amorphous carbon films using electron energy loss spectroscopy (EELS)Falke, U. et al. | 1994
- 242
-
Electron probe microanalysis of chemical gradients in gas pressure sintered silicon nitrideBischoff, E. / Neidhardt, U. / Schubert, H. et al. | 1994
- 243
-
The microstructure of high-strength mortars and concretesRübner, K. et al. | 1994
- 245
-
Determination of the optimum $ Eu^{3+} $-concentration in $ LaAlO_{3} $:Euphosphors by X-ray diffraction and fluorescence measurementsKlimke, J. / Wulff, H. et al. | 1994
- 246
-
High temperature X-ray diffraction studies of the crystallization process of thin amorphous films with the chemical composition CrSi2.57Pitschke, W. et al. | 1994
- 247
-
On the crystal structure of heterogeneous catalysts at reaction-conditions: “in-situ” X-ray powder diffractionHerzog, B. / Ilkenhans, T. / Schlögl, R. et al. | 1994
- 249
-
TEM investigations on PECVD-titanium carbide layersArnold, Birgit / Endler, Ingolf et al. | 1994
- 251
-
Decomposition applying elemental fluorine for the analysis of element traces in fine ceramicsRichts, U. / Garten, R. P. H. / Jacob, E. / Tölg, G. et al. | 1994
- 253
-
Reactive diffusion in Pd/Ni/CuSn6 layer systems at 500°CLorenz, M. / Bergner, D. / Baum, H. et al. | 1994
- 253
-
Reactive diffusion in Pd-Ni-CuSn6 layer systems at 500(degree)CLorenz, M. et al. | 1994
- 254
-
UV and IR derivative spectroscopy of novolac layersReinhardt, M. et al. | 1994
- 256
-
Investigations of the thermal degradation of polymer metal precursors for high temperature superconducting ceramicsLampe, I.v. et al. | 1994
- 256
-
Investigation of the thermal degradation of polymer metal precursors for high temperature superconducting ceramicsLampe, V. I. / Waesche, M. / Krueger, R.-P. / Lorkowski, H.-J. et al. | 1994
- 257
-
Classification of electrode glasses including structural parametersScholz, K. et al. | 1994