Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) (Englisch)
Freier Zugriff
- Neue Suche nach: Newbury, Dale E.
- Neue Suche nach: Ritchie, Nicholas W. M.
- Neue Suche nach: Newbury, Dale E.
- Neue Suche nach: Ritchie, Nicholas W. M.
In:
Journal of Materials Science
;
50
, 2
;
493-518
;
2014
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)
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Beteiligte:Newbury, Dale E. ( Autor:in ) / Ritchie, Nicholas W. M. ( Autor:in )
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Erschienen in:Journal of Materials Science ; 50, 2 ; 493-518
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Verlag:
- Neue Suche nach: Springer US
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Erscheinungsort:Boston
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Erscheinungsdatum:12.11.2014
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Format / Umfang:26 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 50, Ausgabe 2
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