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CoNiCr films, 2-3 microinches thick, have been prepared by dc magnetron sputtering on aluminum alloy based Ni-P substrates. This study is a comparison of recording and magnetic properties of two types of substrates: polished and circumferentially texturized. Measurements made include recording parameters (RMS signal, modulation noise, signal to noise, track average amplitude, overwrite, and bit shift), magnetic parameters from hysteresis loops as obtained by VSM, and film thickness by x-ray fluorescence. Surface profiles were obtained by a stylus profilometer. We report that the texturized disks have a 12 % average improvement in signal to noise and approximately 1-ns improvement in bit shift compared to the polished-substrate disks. An anisotropy in the magnetic parameters was observed and related to substrate texture and asymmetry in the sputtering process. Typical differences in coercivity between radial and circumferential directons are on the order of 100 Oe for a 1000-Oe disk.