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A comparison of single and multiple pulse damage fluxes for oxygen-free-high-conductivity (OFHC) diamond-turned Cu at 1.06 and 10.6 mum shows opposite trends in spot-size dependence. The single pulse damage threshold decreases or remains constant with increasing spot size in the range of sizes used (50-250 mum), but the multiple pulse threshold increases. However, both appear to have the same value in the limit of large spot size. These data suggest that the two phenomena are the result of different mechanisms. Models consistent with the data are discussed.