Analysis of the pore structure of the MCM-41 materials (Englisch)
- Neue Suche nach: Wloch, J.
- Neue Suche nach: Rozwadowski, M.
- Neue Suche nach: Lezanska, M.
- Neue Suche nach: Erdmann, K.
- Neue Suche nach: Wloch, J.
- Neue Suche nach: Rozwadowski, M.
- Neue Suche nach: Lezanska, M.
- Neue Suche nach: Erdmann, K.
In:
Applied Surface Science
;
191
, 1-4
;
368-374
;
2002
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Analysis of the pore structure of the MCM-41 materials
-
Beteiligte:Wloch, J. ( Autor:in ) / Rozwadowski, M. ( Autor:in ) / Lezanska, M. ( Autor:in ) / Erdmann, K. ( Autor:in )
-
Erschienen in:Applied Surface Science ; 191, 1-4 ; 368-374
-
Verlag:
-
Erscheinungsdatum:2002
-
Format / Umfang:7 Seiten, 16 Quellen
-
ISSN:
-
Coden:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
-
Schlagwörter:
-
Datenquelle:
Inhaltsverzeichnis – Band 191, Ausgabe 1-4
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
-
Influence of lattice misfit on diffusion coefficients in thin films polycrystalline Pd-Ag and Pd-Au systemsVasilyev, A. D. / Bekrenev, A. N. et al. | 2002
- 5
-
Photoluminescence excitation spectroscopy obtained for spark-processed SiChang, S. S. et al. | 2002
- 11
-
The role of ambient ageing on porous silicon photoluminescence: evidence of phonon contributionElhouichet, H. / Oueslati, M. et al. | 2002
- 20
-
Anomalous field emission from Al2O3 coated Si tipsZhirnov, V. V. / Alimova, A. N. / Hren, J. J. et al. | 2002
- 26
-
Surface chemistry of water atomised aluminium alloy powdersKrajnikov, A. V. / Gastel, M. / Ortner, H. M. / Likutin, V. V. et al. | 2002
- 44
-
Interaction of Sc and O on WShih, A. / Yater, J. E. / Hor, C. / Abrams, R. et al. | 2002
- 52
-
Electron transmission studies of diamond filmsYater, J. E. / Shih, A. / Butler, J. E. / Pehrsson, P. E. et al. | 2002
- 61
-
Planar waveguides in BiB3O6 and Nd:YVO4 crystals by ion implantationChen, F. / Wang, X. L. / Wang, K. M. / Lu, Q. M. / Teng, B. / Shen, D. Y. et al. | 2002
- 67
-
Corrosion study at Cu-Al interface in microelectronics packagingTan, C. W. / Daud, A. R. / Yarmo, M. A. et al. | 2002
- 74
-
Evaluation of the wettability of metal surfaces by micro-pure water by means of atomic force microscopyWang, R. / Cong, L. / Kido, M. et al. | 2002
- 85
-
Optical properties and structural changes of thermally co-evaporated CuInSe filmsMoharram, A. H. / Al-Mekkawy, I. M. / Salem, A. et al. | 2002
- 94
-
A comparison of fractal dimensions determined from atomic force microscopy and impedance spectroscopy of anodic oxides on Zr-2.5NbMcRae, G. A. / Maguire, M. A. / Jeffrey, C. A. / Guzonas, D. A. / Brown, C. A. et al. | 2002
- 106
-
Characterising the quality of chemical tin coatings on copper by electrochemical current noise methodHuttunen-Saarivirta, E. / Tiainen, T. et al. | 2002
- 118
-
Scaling behavior of (0 0 1) and (1 1 1) Cu surfacesLukaszew, R. A. / Clarke, R. et al. | 2002
- 123
-
Multifractal spectra of atomic force microscope images of amorphous electroless Ni-Cu-P alloyYu, H. S. / Sun, X. / Luo, S. F. / Wang, Y. R. / Wu, Z. Q. et al. | 2002
- 128
-
An X-ray photoelectron spectroscopic study of electrochemically deposited Fe-P thin films on copper substrateAravinda, C. L. / Bera, P. / Jayaram, V. / Mayanna, S. M. et al. | 2002
- 138
-
Structural, optical and electrical properties of In2Se3 thin films formed by annealing chemically deposited Se and vacuum evaporated In stack layersBindu, K. / Sudha Kartha, C. / Vijayakumar, K. P. / Abe, T. / Kashiwaba, Y. et al. | 2002
- 148
-
AFM surface imaging of thermally oxidized hydrogenated crystalline siliconSzekeres, A. / Lytvyn, P. / Alexandrova, S. et al. | 2002
- 153
-
Surface analysis of thermionic dispenser cathodesCortenraad, R. / Denier van der Gon, A. W. / Brongersma, H. H. / Gartner, G. / Manenschijn, A. et al. | 2002
- 166
-
Thermodynamic characterization of a regenerated activated carbon surfaceGonzalez-Martin, M. L. / Gonzalez-Garcia, C. M. / Gonzalez, J. F. / Ramiro, A. / Sabio, E. / Bruque, J. M. / Encinar, J. M. et al. | 2002
- 171
-
High-vacuum electron-beam co-evaporation of Si nanocrystals embedded in Al2O3 matrixWan, Q. / Zhang, N. L. / Xie, X. Y. / Wang, T. H. / Lin, C. L. et al. | 2002
- 176
-
Valence reduction process from sol-gel V2O5 to VO2 thin filmsNingyi, Y. / Jinhua, L. / Chenglu, L. et al. | 2002
- 181
-
Annealing and doping effects on structure and optical properties of sol-gel derived ZrO2 thin filmsLiu, W. C. / Wu, D. / Li, A. D. / Ling, H. Q. / Tang, Y. F. / Ming, N. B. et al. | 2002
- 188
-
The effects of the time-dependent and exposure time to air on Au/n-GaAs schottky barrier diodesOzdemir, A. F. / Kkce, A. / Turut, A. et al. | 2002
- 196
-
Growth and characterisation of InAs/InGaAs quantum dots like structure on GaAs/Si substrate by AP-MOCVDThilakan, P. / Kazi, Z. I. / Egawa, T. et al. | 2002
- 205
-
Organizing nanoclusters on functionalized surfacesBardotti, L. / Prevel, B. / Jensen, P. / Treilleux, M. / Melinon, P. / Perez, A. / Gierak, J. / Faini, G. / Mailly, D. et al. | 2002
- 211
-
A photoemission study: the influence of heating process and Au buffer layers on the Fe/GaAs(1 0 0) structureZhang, T. / Spangenberg, M. / Takahashi, N. / Shen, T. H. / Greig, D. / Matthew, J. A. / Seddon, E. A. et al. | 2002
- 218
-
Transport properties in iron-passivated porous siliconZhu, D. / Chen, Q. / Zhang, Y. et al. | 2002
- 223
-
Optimization of the chemical vapor deposition process for carbon nanotubes fabricationGrujicic, M. / Cao, G. / Gersten, B. et al. | 2002
- 240
-
The combining analysis of height and phase images in tapping-mode atomic force microscopy: a new route for the characterization of thiol-coated gold nanoparticle film on solid substrateJiang, P. / Xie, S. s. / Pang, S. j. / Gao, H. j. et al. | 2002
- 247
-
Molecular interaction of ozone with silicon nanocrystallites: a new method to excite visible luminescenceKuznetsov, S. N. / Saren, A. A. / Pikulev, V. B. / Gardin, Y. E. / Gurtov, V. A. et al. | 2002
- 254
-
Investigation of surface composition of electrodeposited black chrome coatings by X-ray photoelectron spectroscopyAnandan, C. / William Grips, V. K. / Rajam, K. S. / Jayaram, V. / Bera, P. et al. | 2002
- 261
-
Atomic and electronic structures of barium oxide on Si(0 0 1) studied by metastable impact electron spectroscopy (MIES) and coaxial impact collision ion scattering spectroscopy (CAICISS)Ikeuchi, T. / Souda, R. / Yamamoto, S. et al. | 2002
- 266
-
Electron beam induced oxidation of Al-Mg alloy surfacesPalasantzas, G. / van Agterveld, D. T. / De Hosson, J. T. et al. | 2002
- 273
-
Influence of substrate dc bias on chemical bonding, adhesion and roughness of carbon nitride filmsLi, J. / Zheng, W. T. / Jin, Z. / Lu, X. / Gu, G. / Mei, X. / Dong, C. et al. | 2002
- 280
-
Properties of Ag doped ZnTe thin films by an ion exchange processAqili, A. K. / Maqsood, A. / Ali, Z. et al. | 2002
- 286
-
Structural and energetic heterogeneities of hybrid carbon-mineral adsorbentsGun`ko, V. M. / Leboda, R. / Turov, V. V. / Charmas, B. / Skubiszewska-Zieba, J. et al. | 2002
- 300
-
The characterisation of non-evaporable getters by Auger electron spectroscopy: analytical potential and artefactsProdromides, A. E. / Scheuerlein, C. / Taborelli, M. et al. | 2002
- 313
-
Thickness dependence of properties of SnO2:Sb films deposited on flexible substratesMa, H. L. / Hao, X. T. / Ma, J. / Yang, Y. G. / Huang, J. / Zhang, D. H. / Xu, X. G. et al. | 2002
- 319
-
Light assisted formation of porous silicon investigated by X-ray diffraction and reflectivityChamard, V. / Setzu, S. / Romestain, R. et al. | 2002
- 328
-
Ultrafast intense laser "explosion" of hardwoodTheberge, F. / Petit, S. / Iwasaki, A. / Kasaai, M. R. / Chin, S. L. et al. | 2002
- 334
-
Feed gas dependence of the surface nanophase on HFCVD grown diamond films studied by surface enhanced Raman spectroscopyRoy, M. / George, V. C. / Dua, A. K. / Raj, P. / Schulze, S. / Tenne, D. A. / Salvan, G. / Zahn, D. R. et al. | 2002
- 338
-
Relief of the internal stress in ternary boron carbonitride thin filmsHe, D. / Cheng, W. / Qin, J. / Yue, J. / Xie, E. / Chen, G. et al. | 2002
- 344
-
Surface diffusion and electron stimulated desorption of chlorine from InP(1 1 0) and GaAs(1 1 0)Jacka, M. / Kale, A. et al. | 2002
- 352
-
Attempt to apply the fractal geometry for characterisation of dealuminated ZSM-5 zeoliteRozwadowski, M. / Kornatowski, J. / W&lz.xl / och, J. / Erdmann, K. / Go&lz.xl / embiewski, R. et al. | 2002
- 362
-
Characterisation of polysilicon gate microstructures for 0.5 mm CMOS devices using transmission electron microscopy and atomic force microscopy imagesAhmad, I. / Omar, A. / Hussain, A. / Mikdad, A. et al. | 2002
- 362
-
Characterisation of polysilicon gate microstructures for 0.5 my m CMOS devices using transmission electron microscopy and atomic force microscopy imagesAhmad, I. / Omar, A. / Hussain, A. / Mikdad, A. et al. | 2002
- 368
-
Analysis of the pore structure of the MCM-41 materialsWloch, J. / Rozwadowski, M. / Lezanska, M. / Erdmann, K. et al. | 2002
- 375
-
Author index| 2002
- 379
-
Subject index| 2002
- v
-
Contents| 2002