Aluminide microchannel arrays for high-temperature microreactors and microscale heat exchangers (Englisch)
- Neue Suche nach: Paul, B.K.
- Neue Suche nach: Kanlayasiri, K.
- Neue Suche nach: Paul, B.K.
- Neue Suche nach: Kanlayasiri, K.
In:
Machines and Processes for Microscale and Meso-scale Fabrication, Metrology and Assembly, ASPE 2003 Winter Topical Meeting, 2003
;
154-159
;
2003
-
ISBN:
- Aufsatz (Konferenz) / Print
-
Titel:Aluminide microchannel arrays for high-temperature microreactors and microscale heat exchangers
-
Weitere Titelangaben:Aluminid-Mikrokanalarrays für Mikrohochtemperaturreaktoren und Mikrowärmetauscher
-
Beteiligte:Paul, B.K. ( Autor:in ) / Kanlayasiri, K. ( Autor:in )
-
Erschienen in:
-
Verlag:
- Neue Suche nach: American Society for Precision Engineering (ASPE)
-
Erscheinungsort:Raleigh
-
Erscheinungsdatum:2003
-
Format / Umfang:6 Seiten, 6 Bilder, 14 Quellen
-
ISBN:
-
Medientyp:Aufsatz (Konferenz)
-
Format:Print
-
Sprache:Englisch
-
Schlagwörter:
-
Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
-
Challenges in Applying Minature Devices in a Number of Domains; Component Fabrication, Metrology, and Assembly Aspectsvan Eijk, J. / Brouwer, D. / Franse, J. / American Society for Precision Engineering et al. | 2003
- 8
-
Cut it out. Shaping the Micrometer (Invited paper)Schaller, T. / Pflegling, W. / Hlavac, M. / American Society for Precision Engineering et al. | 2003
- 8
-
Cut it out. Shaping the micrometerSchaller, T. / Pfleging, W. / Hlavac, M. et al. | 2003
- 14
-
Mesoscale and Microscale Manufacturing Processes: Challenges for Materials, Fabrication, and MetrologyDow, T. / Scattergood, R. / American Society for Precision Engineering et al. | 2003
- 20
-
Introducing Meso-scale Channels on Ceramics by MachiningShin, H. W. / Kok, C. K. / Case, E. / Kwon, P. / American Society for Precision Engineering et al. | 2003
- 26
-
Straightness and Roughness Analysis of Micro-Shaft Machined with Wire Electrode Discharge GrindingMorgan, C. J. / Shreve, S. / Vallance, R. / American Society for Precision Engineering et al. | 2003
- 26
-
Precision of micro shafts machined with wire electro-discharge grindingMorgan, C. / Shreve, S. / Vallance, R.R. et al. | 2003
- 32
-
Mastering and replication of precision micro-structured surfacesMorris, G.M. et al. | 2003
- 32
-
Mastering and Replication of Precision Micro-Structured Surfaces (Invited paper)Morris, G. M. / American Society for Precision Engineering et al. | 2003
- 36
-
Growing Up, Additive Processes in MEMS Fabrication and Packaging (Invited paper)Goetzen, R. / American Society for Precision Engineering et al. | 2003
- 37
-
Material Behavior in Microforming at Elevated TemperaturesEgerer, E. / Engel, U. / American Society for Precision Engineering et al. | 2003
- 37
-
Material behavior in microforming at elevated temperatureEgerer, E. / Engel, U. et al. | 2003
- 43
-
The Reliability of Dynamic Interfaces in LIGA MicrosystemsPrasad, S. / Christenson, T. / Dugger, J. / Michael, J. / Vanacek, C. / American Society for Precision Engineering et al. | 2003
- 48
-
Small Volume Metrology (Invited paper)Smith, S. / Seugling, R. / American Society for Precision Engineering et al. | 2003
- 53
-
Measuring in three dimensions at the mesoscopic levelPeggs, G. / Lewis, A. / Leach, R. et al. | 2003
- 53
-
Measuring in Three Dimensions at the Mesoscopic ScalePeggs, G. / Lewis, A. / Leach, R. / American Society for Precision Engineering et al. | 2003
- 58
-
Uncertainty in Measurements of Micro-patterned Thin Film Thickness Using Nanometrological AFMMisumi, I. / Gonda, S. / American Society for Precision Engineering et al. | 2003
- 58
-
Uncertainty in measurements of micro-patterned thin film thickness using nanometrological AFM - Reliability of parameters for base straight lineMisumi, I. / Gonda, S. / Kurosawa, T. / Azuma, Y. / Fujimoto, T. / Kojima, I. / Sakurai, T. / Ohmi, T. / Takamasu, K. et al. | 2003
- 64
-
Probe Force Calibration Experiments Using the NIST Electrostatic Force BalancePratt, J. / Newell, D. / American Society for Precision Engineering et al. | 2003
- 70
-
Meso-Scale Metrology Tools: A Survey of Relevant Tools and a Discussion of Their Strengths and WeaknessesHibbard, R. / Bono, M. / American Society for Precision Engineering et al. | 2003
- 73
-
Micromachined Interferometer for MEMS MetrologyKim, B. / Razavi, A. / Degertekin, L. / Kurfess, T. / American Society for Precision Engineering et al. | 2003
- 79
-
Design and Fabrication of the Meso-Mill: A Five-axis Milling Machine for Meso-scaled PartsWerkmeister, J. / Slocum, A. / American Society for Precision Engineering et al. | 2003
- 83
-
Advances in Fast Nano-Precision Motion Technologies: Practical Parallel KinematicsJordan, S. / American Society for Precision Engineering et al. | 2003
- 87
-
Interferometric measuring microscopy applied to miniature machines, structures, and surface featuresRoth, J. / Felkel, E. / Groot, P. de et al. | 2003
- 87
-
Optical Metrology (Invited paper)Roth, J. / Felkel, E. / DeGroot, P. / American Society for Precision Engineering et al. | 2003
- 93
-
Analysis of Microstructures with Confocal Laser Scanning MicroscopyUhlmann, E. / Oberschmidt, D. / American Society for Precision Engineering et al. | 2003
- 93
-
3D-analysis of microstructures with confocal laser scanning microscopyUhlmann, E. / Oberschmidt, D. / Kunath-Fandrei, G. et al. | 2003
- 98
-
Silicon Wafer Thickness Variation Using Infrared InterferometrySchmitz, T. / Davies, A. / Evans, C. / American Society for Precision Engineering et al. | 2003
- 98
-
Silicon wafer thickness variation measurements using infrared interferometrySchmitz, T.L. / Davies, A. / Evans, C.J. / Parks, R.E. et al. | 2003
- 104
-
Dynamic MEMS Measurement Using a Strobed Interferometric System with Combined Coherence Sensing and Phase InformationNovak, E. / Wan, D. / Unruh, P. / Schmit, J. / American Society for Precision Engineering et al. | 2003
- 108
-
Micro/meso Robotic Assembly (Invited paper)Stephanou, H. / American Society for Precision Engineering et al. | 2003
- 113
-
PZN Based Nanopositioning SystemsWoody, S. / American Society for Precision Engineering et al. | 2003
- 119
-
Hybrid Micro-Assembly System for Tele-Operated and Automated Micro-ManipulationZaeh, M. / Jacob, D. / Ehrenstrasser, M. / Schilp, J. / American Society for Precision Engineering et al. | 2003
- 125
-
Production of Direct Drive Cylindrical Targets for Inertial Confinement Fusion ExperimentsElliot, N. / Day, R. / American Society for Precision Engineering et al. | 2003
- 131
-
Nondestructive characterization technologies for metrology of micro/mesoscale assembliesMartz, H.E. jun. / Albrecht, G.F. et al. | 2003
- 131
-
Non-destructive Characterization Technologies for Metrology of Micro/mesoscale Devices (Invited paper)Martz, H. / Albrecht, G. / American Society for Precision Engineering et al. | 2003
- 142
-
Laser contouring method for wall thickness metrology on OMEGA shock breakout targetsSebring, R.J. / Bartos, J.J. / Day, R.D. / Edwards, J.M. / Nobile, A. / Rivera, G. / Olson, R.E. et al. | 2003
- 142
-
Laser Contouring Method for Wall Thickness Metrology in OMEGA Shock Breakout TargetsSebring, R. / Bartos, J. / American Society for Precision Engineering et al. | 2003
- 148
-
Manufacturing of microasperities on thrust surfaces using ultraviolet photolithographyKortikar, S.N. / Stephens, L.S. / Hadinata, P.C. / Sirip uram, R.B. et al. | 2003
- 148
-
Manufacturing of Micro-asperities on Thrust Surfaces Using UV PhotolithographyKortikar, S. / Stephens, N. / American Society for Precision Engineering et al. | 2003
- 154
-
Aluminide Microchannel Arrays for High-temperature Microreactors and Microscale Heat ExchangersPaul, B. / Kanlayasiri, K. / American Society for Precision Engineering et al. | 2003