Extraction of bonding strain data in diode lasers from polarization-resolved photoluminescence measurements (Englisch)
- Neue Suche nach: Fritz, M.A.
- Neue Suche nach: Cassidy, D.T.
- Neue Suche nach: Fritz, M.A.
- Neue Suche nach: Cassidy, D.T.
In:
Microelectronics Reliability
;
44
, 5
;
787-796
;
2004
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Extraction of bonding strain data in diode lasers from polarization-resolved photoluminescence measurements
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Beteiligte:Fritz, M.A. ( Autor:in ) / Cassidy, D.T. ( Autor:in )
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Erschienen in:Microelectronics Reliability ; 44, 5 ; 787-796
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Verlag:
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Erscheinungsdatum:2004
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Format / Umfang:10 Seiten, 16 Quellen
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 44, Ausgabe 5
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