On the spontaneous growth of soft metallic whiskers (Englisch)
- Neue Suche nach: Hoffman, E.N.
- Neue Suche nach: Barsoum, M.W.
- Neue Suche nach: Wang, W.
- Neue Suche nach: Doherty, R.D.
- Neue Suche nach: Zavaliangos, A.
- Neue Suche nach: Hoffman, E.N.
- Neue Suche nach: Barsoum, M.W.
- Neue Suche nach: Wang, W.
- Neue Suche nach: Doherty, R.D.
- Neue Suche nach: Zavaliangos, A.
In:
Electrical Contacts, IEEE Holm Conference on Electrical Contacts, 51
;
121-126
;
2005
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ISBN:
- Aufsatz (Konferenz) / Print
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Titel:On the spontaneous growth of soft metallic whiskers
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Beteiligte:Hoffman, E.N. ( Autor:in ) / Barsoum, M.W. ( Autor:in ) / Wang, W. ( Autor:in ) / Doherty, R.D. ( Autor:in ) / Zavaliangos, A. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: IEEE Operations Center
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Erscheinungsort:Piscataway
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Erscheinungsdatum:2005
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Format / Umfang:6 Seiten, 22 Quellen
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ISBN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 0_1
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Proceedings of the Fifty-First IEEE Holm Conference on Electrical Contacts| 2005
- 1
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Contact contamination and arc interactionsWitter, G.J. et al. | 2005
- 10
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Arc discharge and contact reliability in switching and commutating contactsSawa, K. et al. | 2005
- 22
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Contact erosion of Ag/SnO/sub 2//In/sub 2/O/sub 3/ made by internal oxidation and powder metallurgyLeung, C. / Streicher, E. / Fitzgerald, D. / Cook, J. et al. | 2005
- 22
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Contact Erosion of Ag/SnO~2/In~2O~3 Made by Internal Oxidation and Powder MetallurgyLeung, C. / Streicher, E. / Fitzgerald, D. / Cook, J. / Institute of Electrical and Electronics Engineers et al. | 2005
- 28
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Occurrence of SiO~2 on the Contact Surface and Its Dependence on Electrodes in Silicone VaporTamai, T. / Institute of Electrical and Electronics Engineers et al. | 2005
- 28
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Occurrence of SiO/sub 2/ on the contact surface and its dependence on electrodes in silicone vaporTamai, T. et al. | 2005
- 35
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The effect of silver composition and additives on switching characteristics of silver tin oxide type contacts for automotive inductive loadsChen, Z.K. / Witter, G. et al. | 2005
- 42
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Substitution of silver/cadmium oxide in high voltage disconnectorsBernauer, C. / Kuntze, T. / Behrens, V. / Honig, T. et al. | 2005
- 48
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High temperature resistant galvanically deposited gold layers for switching contactsJohler, W. / Weik, G. / Poefel, K. et al. | 2005
- 55
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Asynchronous modular contactor for intelligent motor control applicationsZhou, X. / Zou, L. / Hetzmannseder, E. et al. | 2005
- 63
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Modelling and management of microshocks under high voltage transmission linesGunatilake, A. / Rowland, S.M. / Wang, Z.D. / Allen, N.L. et al. | 2005
- 69
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Effect of short circuit current duration on the welding of closed contacts in vacuumSlade, P.G. / Taylor, E.D. / Haskins, R.E. et al. | 2005
- 75
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Intermittency events in bio-compatible electrical contactsMcBride, J.W. / Maul, C. et al. | 2005
- 82
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The influence of contact interface characteristics on vibration-induced fretting degradationFlowers, G.T. / Fei Xie, / Bozack, M. / Horvath, R. / Rickett, B.I. / Malucci, R.D. et al. | 2005
- 89
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Displacement measurements at the connector contact interface employing a novel thick film sensorLam, L. / McBride, J.W. / Maul, C. / Atkinson, J.K. et al. | 2005
- 97
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Vibration-induced deterioration of tin-coated connectors studied by using a force controlled fretting bench-testHammam, T. / Kassman-Rudolphi, A. / Lundstrom, P. et al. | 2005
- 107
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Lubrication of electrical contactsChudnovsky, B.H. et al. | 2005
- 115
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Inspection of the contaminants at failed connector contactsFeng, C. / Zhang, J.G. / Luo, G. / Halkola, V. et al. | 2005
- 121
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On the spontaneous growth of soft metallic whiskersHoffman, E.N. / Barsoum, M.W. / Wang, W. / Doherty, R.D. / Zavaliangos, A. et al. | 2005
- 127
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The "selective" deposition of particles on electric contact and their effects on contact failureJi Gao Zhang, / Jin Chun Gao, / Cuifeng Feng, et al. | 2005
- 135
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Cathode spot behavior on tungsten-copper contacts in vacuum and the effect on erosionTaylor, E.D. et al. | 2005
- 139
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Time-coordinated nonarcing breaking operation of reed switches for higher currentWakatsuki, N. / Yonezawa, Y. et al. | 2005
- 144
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The influence of load and contact material on the tangential separation force of low current switching contactsNeuhaus, A.R. / Hammerschmid, A. / Felke, T. / Reichart, M. / Rieder, W.F. et al. | 2005
- 151
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An investigation for the method of lifetime prediction of Ag-Ni contacts for electromagnetic contactorKawakami, Y. / Hasegawa, M. / Watanabe, Y. / Sawa, K. et al. | 2005
- 156
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The evolution of arc fault circuit interruptersWafer, J.A. et al. | 2005
- 162
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Performance classification for electrical connections using ASTM B868Aronstein, J. et al. | 2005
- 167
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Conditions for series arcing phenomena in PVC wiringShea, J.J. et al. | 2005
- 176
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Rating power connectors using voltage dropMalucci, R.D. / Ruffino, F.R. et al. | 2005
- 180
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Micro motion at the failed contact interfacesZhanping He, / Liangjun Hu, et al. | 2005
- 186
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Effect of fretting slip amplitude on the friction behaviour of electrical contact materialsGagnon, D. / Braunovic, M. / Masounave, J. et al. | 2005
- 196
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The fretting characteristics of intrinsically conducting polymer contactsLam, L. / McBride, J.W. / Swingler, J. et al. | 2005
- 204
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Application of the finite-element analysis for the calculation of an insulation displacement processJorgens, S. / Taschke, H. et al. | 2005
- 212
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Deflection analysis of spring connectorElmanfalouti, A. / El Abdi, R. / Buisson, M. / Carvou, E. et al. | 2005
- 217
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A model for life time evaluation of closed electrical contactsBraunovic, M. / Izmailov, V.V. / Novoselova, M.V. et al. | 2005
- 224
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A mechanical, electrical, thermal coupled-field simulation of a sphere-plane electrical contactMonnier, A. / Froidurot, B. / Jarrige, C. / Meyer, R. / Teste, P. et al. | 2005
- 232
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Pore corrosion model for gold-plated copper contactsSun, A.C. / Moffat, H.K. / Enos, D.G. / Glauner, C.S. et al. | 2005
- 238
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Electrochemical migration of land grid array sockets under highly accelerated stress conditionsShuang Yang, / Ji Wu, / Pecht, M. et al. | 2005
- 245
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Multi-scale study of the electrical properties of organic layers grafted on gold surfacesNoel, S. / Alamarguy, D. / Lecaude, N. / Schneegans, O. / Tristani, L. et al. | 2005
- 255
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The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contactsDickrell, D.J. / Dugger, M.T. et al. | 2005
- 259
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Micro phenomena in low contact-force probing on aluminumKataoka, K. / Itoh, T. / Suga, T. et al. | 2005
- 265
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Finite element analysis of magnetic structures for micro-electro-mechanical relaysRen Wanbin, / Zhai Guofum, / Wang Qiya, / Li Desheng, et al. | 2005
- 270
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Enhanced interfacial transport using carbon nanotube arraysFisher, T.S. et al. | 2005
- 272
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Contact resistance characteristics of high temperature superconducting bulk. Part IVFujita, H. / Imaizumi, T. / Tomita, M. / Sakai, N. / Murakami, M. / Hirabayashi, I. / Sawa, K. et al. | 2005
- 277
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Synthesis and Characterization of Ti-Si-C Ternary Compounds for Electrical Contact ApplicationsEklund, P. / Emmerlich, J. / Hogberg, H. / Wilhelmsson, O. / Isberg, P. / Persson, P. O. A. / Jansson, U. / Hultman, L. / Institute of Electrical and Electronics Engineers et al. | 2005
- 277
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Synthesis and characterization of Ti-Si-C compounds for electrical contact applicationsEklund, P. / Emmerlich, J. / Hogberg, H. / Persson, P.O.A. / Hultman, L. / Wilhelmsson, O. / Jansson, U. / Isberg, P. et al. | 2005
- 284
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Equivalent constriction resistance measured with the low dc voltage method under the influence of fritting phenomenaTakano, E. et al. | 2005
- 291
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Multi-spot model showing the effects of nano-spot sizesMalucci, R.D. et al. | 2005
- 298
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Development of the lead-free brush material for the high-load starterHonbo, R. / Wakabayashi, H. / Murakami, Y. / Inayoshi, N. / Inukai, K. / Shimoyama, T. / Sawa, K. / Morita, N. et al. | 2005
- 304
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Long-term high resolution wear studies of high current density electrical brushesJensen, M.V.R.S. et al. | 2005
- 312
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Degradation process of a sliding system with Au-plated slip-ring and AgPd brush for power supplySawa, K. / Kakino, S. / Shigemori, T. / Kawakami, Y. / Endo, K. / Ou, G. / Hagino, H. et al. | 2005
- 318
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Characteristics of carbon flat commutator for high-inductance DC motor driving automotive fuel pumpShigemori, T. / Sawa, K. et al. | 2005
- 324
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Influence of surface roughness on contact voltage drop of sliding contactsUeno, T. / Morita, N. et al. | 2005
- 329
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An arc study at high DC current levels in automotive applicationsSallais, S. / Jemaa, N.B. / Carvou, E. / Bourda, C. / Jeannot, D. et al. | 2005
- 335
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Consecutive observations of the relationship between eroded contact surfaces and motion of breaking arc at each breaking operationSekikawa, J. / Kubono, T. et al. | 2005
- 340
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A novel concept utilizing conductive polymers on power connectors during hot swapping in live modular electronic systemsDo, T.K. et al. | 2005
- 346
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The evolution of contact erosion during an opening operation at 42VSwingler, J. / Sumption, A. / McBride, J.W. et al. | 2005
- 352
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Counter-measures for relay failures due to dynamic welding: a robust engineering designSchoepf, T.J. et al. | 2005
- 360
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Contact heating by long arcing during connector disconnectionCarvou, E. / Ben Jemaa, N. / Porte, M. / Razafiarivelo, J. et al. | 2005
- 366
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Breaker page| 2005
- 367
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Author index| 2005
- ii
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Copyright page| 2005
- iv
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IEEE Holm Conference Steering Committee| 2005
- v
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2005 IEEE Holm conference officers| 2005
- vii
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Table of contents| 2005
- xv
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Foreword| 2005
- xvi
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The 2005 Ragnar Holm scientific achievement award| 2005