Advanced electrical analysis of embedded memory cells using atomic force probing (Englisch)
- Neue Suche nach: Grutzner, M.
- Neue Suche nach: Grutzner, M.
In:
Microelectronics Reliability
;
45
, 9-11
;
1509-1513
;
2005
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Advanced electrical analysis of embedded memory cells using atomic force probing
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Beteiligte:Grutzner, M. ( Autor:in )
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Erschienen in:Microelectronics Reliability ; 45, 9-11 ; 1509-1513
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Verlag:
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Erscheinungsdatum:2005
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Format / Umfang:5 Seiten, 11 Quellen
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 45, Ausgabe 9-11
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Author index (Generate from contents)| 2005