Stability of thin film resistors - Prediction and differences base on time-dependent Arrhenius law (Englisch)
- Neue Suche nach: Kuehl, Reiner W.
- Neue Suche nach: Kuehl, Reiner W.
In:
Microelectronics Reliability
;
49
, 1
;
51-58
;
2009
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Stability of thin film resistors - Prediction and differences base on time-dependent Arrhenius law
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Weitere Titelangaben:Stabilität von Dünnschichtwiderständen. Vorhersage und Unterschiede auf Basis des zeitabhängigen Arrhenius-Gesetzes
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Beteiligte:Kuehl, Reiner W. ( Autor:in )
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Erschienen in:Microelectronics Reliability ; 49, 1 ; 51-58
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Verlag:
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Erscheinungsdatum:2009
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Format / Umfang:8 Seiten, 14 Bilder, 7 Quellen
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 49, Ausgabe 1
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