Ohmic contacts with palladium diffusion barrier on III-V semiconductors (Englisch)
- Neue Suche nach: Galvan-Arellano, M.
- Neue Suche nach: Diaz-Reyes, J.
- Neue Suche nach: Pena-Sierra, R.
- Neue Suche nach: Galvan-Arellano, M.
- Neue Suche nach: Diaz-Reyes, J.
- Neue Suche nach: Pena-Sierra, R.
In:
Vacuum
;
84
, 10
;
1195-1198
;
2010
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Ohmic contacts with palladium diffusion barrier on III-V semiconductors
-
Beteiligte:
-
Erschienen in:Vacuum ; 84, 10 ; 1195-1198
-
Verlag:
-
Erscheinungsdatum:2010
-
Format / Umfang:4 Seiten, 13 Quellen
-
ISSN:
-
Coden:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
-
Schlagwörter:
-
Datenquelle:
Inhaltsverzeichnis – Band 84, Ausgabe 10
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1181
-
Symposium on advances in semiconducting materialsIgnatiev, Alex / Subramaniam, Velumani et al. | 2009
- 1181
-
Symposium on advances in semiconducting materials:XVI International Materials Research ConferenceIgnatiev, A. / Subramaniam, V. et al. | 2010
- 1182
-
Characterization of AlxGa1−xAs layers grown on (100) GaAs by metallic-arsenic-based-MOCVDDíaz-Reyes, J. / Galván-Arellano, M. / Castillo-Ojeda, R.S. / Peña-Sierra, R. et al. | 2009
- 1187
-
GaN buffer layer growth by MOCVD using a thermodynamic non-equilibrium modelGuarneros, C. / Sánchez, V. et al. | 2009
- 1191
-
Structural studies of ZnS thin films grown on GaAs by RF magnetron sputteringGayou, V.L. / Salazar-Hernandez, B. / Constantino, M.E. / Andrés, E. Rosendo / Díaz, T. / Macuil, R. Delgado / López, M. Rojas et al. | 2009
- 1195
-
Ohmic contacts with palladium diffusion barrier on III–V semiconductorsGalván-Arellano, M. / Díaz-Reyes, J. / Peña-Sierra, R. et al. | 2009
- 1199
-
Characterization on pulsed laser deposited nanocrystalline ZnO thin filmsVenkatachalam, S. / Kanno, Yoshinori / Velumani, S. et al. | 2009
- 1204
-
Effect of doping and substrate temperature on the structural and optical properties of reactive pulsed laser ablated tin oxide doped tantalum oxide thin filmsKrishnan, Renju R. / Nissamudeen, K.M. / Gopchandran, K.G. / Pillai, V.P. Mahadevan / Ganesan, V. et al. | 2009
- 1212
-
Characterization of Zinc-phthalocyanine–CdS composite thin films for photovoltaic applicationsSenthilarasu, S. / Sathyamoorthy, R. / Lee, Soo-Hyoung / Velumani, S. et al. | 2009
- 1216
-
Fabrication and characterization of n-CdSe0.7Te0.3/p-CdSe0.15Te0.85 solar cellMuthukumarasamy, N. / Velumani, S. / Balasundaraprabhu, R. / Jayakumar, S. / Kannan, M.D. et al. | 2009
- 1220
-
Structure and temperature dependence of conduction mechanisms in hot wall deposited CuInSe2 thin films and effect of back contact layer in CuInSe2 based solar cellsAgilan, S. / Mangalaraj, D. / Narayandass, Sa.K. / Mohan Rao, G. / Velumani, S. et al. | 2009
- 1226
-
High angle annular dark field-scanning transmission electron microscopy and high-resolution transmission electron microscopy studies in the Er2O3–ZrO2 systemAngeles-Chavez, C. / Salas, P. / Lopez-Luke, T. / de la Rosa, E. et al. | 2009
- 1232
-
Temperature dependence of electrophysical characteristics of zinc oxide based varistorsBidadi, H. / Hasanli, Sh.M. / Hekmatshoar, H. / Bidadi, S. / Mohammadi Aref, S. et al. | 2009
- 1236
-
Coatings made of tungsten carbide and tantalum carbide for machining toolsPalomar, F.E. / Zambrano, P.C. / Gómez, M.I. / Colás, R. / Guerrero, M.P. / Castillo, A. et al. | 2009
- 1240
-
Electrical and morphological properties of polystyrene thin films for organic electronic applicationsPrime, D. / Paul, S. et al. | 2009
- 1244
-
Optical and morphological characterisation of a silver nanoparticle/fluorescent poly(phenylenethynylene) composite for optical biosensorsRamos, Juan Carlos / Ledezma, Antonio / Arias, Eduardo / Moggio, Ivana / Martínez, Carlos Alberto / Castillon, Felipe et al. | 2009
- 1250
-
How the sensitivity in PIXE elemental analysis is affected by the type of particle, cross-sections, background radiation and other factors?Romo-Kröger, C.M. et al. | 2009
- IFC
-
Editorial Board & Publication Information| 2010