Wavelength-tracked white light interferometry for highly sensitive strain and temperature measurements (Englisch)
- Neue Suche nach: Bhatia, V.
- Neue Suche nach: Sen, M.B.
- Neue Suche nach: Murphy, K.A.
- Neue Suche nach: Claus, R.O.
- Neue Suche nach: Bhatia, V.
- Neue Suche nach: Sen, M.B.
- Neue Suche nach: Murphy, K.A.
- Neue Suche nach: Claus, R.O.
In:
Electronics Letters
;
32
, 3
;
247-249
;
1996
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Wavelength-tracked white light interferometry for highly sensitive strain and temperature measurements
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Weitere Titelangaben:Wellenlängen-Tracking-Weißlicht-Interferometrie zur hochempfindlichen Dehnungs- und Temperaturmessung
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Beteiligte:Bhatia, V. ( Autor:in ) / Sen, M.B. ( Autor:in ) / Murphy, K.A. ( Autor:in ) / Claus, R.O. ( Autor:in )
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Erschienen in:Electronics Letters ; 32, 3 ; 247-249
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Verlag:
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Erscheinungsdatum:1996
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Format / Umfang:3 Seiten, 3 Bilder, 3 Quellen
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:Fabry-Perot-Interferometrie , Interferometrie , Dehnungsmessung , Temperaturmessung , faseroptischer Sensor , Licht , Auflösungsvermögen , Messbereich , Resonanz , Spektrallinienverschiebung , Monomodefaser , Transmissionsvermögen , Spektrum , Wellenlänge , Frequenzverschiebung , Fabry-Perot-Resonator
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Datenquelle:
Inhaltsverzeichnis – Band 32, Ausgabe 3
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