A new generation-recombination model for device simulation including the Poole-Frenkel effect and phonon-assisted tunnelling (Englisch)
- Neue Suche nach: Lui, O.K.B.
- Neue Suche nach: Migliorato, P.
- Neue Suche nach: Lui, O.K.B.
- Neue Suche nach: Migliorato, P.
In:
Solid State Electronics
;
41
, 4
;
575-583
;
1997
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:A new generation-recombination model for device simulation including the Poole-Frenkel effect and phonon-assisted tunnelling
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Weitere Titelangaben:Ein neues Generations-Rekombinationsmodell in der Bauelementensimulation unter Berücksichtigung des Poole-Frenkel Effektes und des photonenbedingten Tunnelns
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Beteiligte:Lui, O.K.B. ( Autor:in ) / Migliorato, P. ( Autor:in )
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Erschienen in:Solid State Electronics ; 41, 4 ; 575-583
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Verlag:
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Erscheinungsdatum:1997
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Format / Umfang:9 Seiten, 8 Bilder, 1 Tabelle, 28 Quellen
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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