The failure of Bayes system reliability inference based on data with multi-level applicability (Englisch)
- Neue Suche nach: Philipson, L.L.
- Neue Suche nach: Philipson, L.L.
In:
IEEE Transactions on Reliability
;
45
, 1
;
66-68
;
1996
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:The failure of Bayes system reliability inference based on data with multi-level applicability
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Weitere Titelangaben:Über das Versagen von Zuverlässigkeits-Rechnungen nach dem Satz von Bayes bei Daten aus verschiedenenen System-Ebenen
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Beteiligte:Philipson, L.L. ( Autor:in )
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Erschienen in:IEEE Transactions on Reliability ; 45, 1 ; 66-68
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Verlag:
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Erscheinungsdatum:1996
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Format / Umfang:3 Seiten, 8 Quellen
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 45, Ausgabe 1
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