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Towards more quantitative results from three dimensional electron microscopy of macromolecules
British Library Conference Proceedings | 2000| -
Photoemission electron microscopy with high chemical and magnetic sensitivity
British Library Conference Proceedings | 2000| -
Electron energy-loss near-edge structures of silicon and silicon carbide
British Library Conference Proceedings | 2000| -
Application of EFTEM for cross-sectional on-product characterization of semiconductor devices
British Library Conference Proceedings | 2000| -
Application of low-energy backscattered electron detection in the inspection of semiconductor devices technology
British Library Conference Proceedings | 2000| -
A new method for the determination of the wave aberration function
British Library Conference Proceedings | 2000| -
Quantitative measurement of intensity profiles of equal thickness fringes of Si and MgO crystals and estimation of crystal potential
British Library Conference Proceedings | 2000| -
Simulation of electron trajectories in the 3D field of two coupled hemispherical electrostatic deflectors
British Library Conference Proceedings | 2000| -
Investigation of an EuS-coated cooled field emitter for application in state on the art electron microscopes
British Library Conference Proceedings | 2000| -
Magneto-optical linear dichroism in threshold photoemission electron microscopy of a polycrystalline Fe-film
British Library Conference Proceedings | 2000| -
Spectral distribution of backscattered electrons of charged insulators
British Library Conference Proceedings | 2000| -
Conditions of study of electrode masses structures in environmental scanning electron microscope
British Library Conference Proceedings | 2000| -
Electron ray-tracing for numerical determination of aberrations
British Library Conference Proceedings | 2000| -
New frame-transfer wide-angle slow-scan CCD camera allows recording of distortion-free images for digital montages
British Library Conference Proceedings | 2000| -
On actual questions in filtering and inelastic interactions
British Library Conference Proceedings | 2000| -
SEM resolution improvement at low voltage with gun monochromator
British Library Conference Proceedings | 2000| -
A high resolution add-on lens for scanning electron microscopes
British Library Conference Proceedings | 2000| -
Possibilities of measurement of magnetic field distributions by photoemission electron microscopy
British Library Conference Proceedings | 2000| -
Energy filtering transmission electron microscopy: fundamentals and applications
British Library Conference Proceedings | 2000| -
An anomalous contrast effect in scanning electron microscopy of insulators: the pseudo-mirror effect
British Library Conference Proceedings | 2000| -
Studies of biological specimens by environmental scanning electron microscopy
British Library Conference Proceedings | 2000| -
Dimension measurement in a cathode lens equipped low-energy SEM
British Library Conference Proceedings | 2000| -
X-ray photoemission and low energy electron microscope
British Library Conference Proceedings | 2000| -
Scanning low and very low energy electron microscopy
British Library Conference Proceedings | 2000| -
The Triebenberg laboratory - designed for highest resolution electron microscopy and holography
British Library Conference Proceedings | 2000| -
Performance of the mirror corrector for an ultrahigh-resolution spectromicroscope
British Library Conference Proceedings | 2000| -
Outline of a variable-axis lens with arbitrary shift of the axis in one direction
British Library Conference Proceedings | 2000| -
Applications of high resolution microcalorimeter type X-Ray spectrometers in material analysis
British Library Conference Proceedings | 2000| -
Combined TEM and CL of self-assembled CdSe quantum dots
British Library Conference Proceedings | 2000| -
Elemental mapping using omega filter and imaging plate
British Library Conference Proceedings | 2000| -
On the enhancement factors for electron field emitters
British Library Conference Proceedings | 2000| -
Computer-controlled transmission electron microscopy
British Library Conference Proceedings | 2000| -
ProcessDiffraction: a computer program to process electron diffraction patterns from polycrystalline or amorphous samples
British Library Conference Proceedings | 2000| -
Domain imaging and determination of magnetic moments in Co-films using XMCD-PEEM
British Library Conference Proceedings | 2000| -
Secondary electron field emission microscopy - SEFEM
British Library Conference Proceedings | 2000| -
Direct atomic scale characterization of interfaces and doping layers in field-effect transistors
British Library Conference Proceedings | 2000| -
Extraction of three-body distribution in amorphous silicon by wavelet analysis of EXELFS
British Library Conference Proceedings | 2000| -
Charging effects in S.E.M.: role of the working distance
British Library Conference Proceedings | 2000| -
SEM analysis of corrosion degradation on tinplate substrates
British Library Conference Proceedings | 2000| -
Low energy electron scattering - Monte Carlo simulation
British Library Conference Proceedings | 2000|
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