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Synonyme wurden verwendet für: Dicke
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YBa2Cu3O7−x thin film over 3 in. substrate using off‐axis excimer laser deposition
American Institute of Physics | 1996|Schlagwörter: THICKNESS -
X‐ray photoelectron study of surface layers on orthopaedic alloys. I. Ti–6Al–4V (ASTM F‐136) alloy
American Institute of Physics | 1993|Schlagwörter: THICKNESS -
X‐ray photoelectron spectroscopy study of surface layers on orthopaedic alloys. II. Co–Cr–Mo (ASTM F‐75) alloy
American Institute of Physics | 1993|Schlagwörter: THICKNESS -
X‐ray photoelectron spectroscopy study of submonolayer native oxides on HF‐treated Si surfaces
American Institute of Physics | 1995|Schlagwörter: THICKNESS -
X‐ray photoelectron spectroscopy and ellipsometry studies of the electrochemically controlled adsorption of benzotriazole on copper surfaces
American Institute of Physics | 1990|Schlagwörter: THICKNESS -
X‐ray photoelectron and Auger electron spectroscopy studies of photochemical vapor deposition silicon nitrides
American Institute of Physics | 1988|Schlagwörter: THICKNESS -
X‐ray phase lens design and fabrication
American Institute of Physics | 1983|Schlagwörter: thickness -
X‐ray double‐crystal diffraction studies of GaInAsP/InP heterostructures
American Institute of Physics | 1988|Schlagwörter: THICKNESS -
X‐ray characterization of single‐crystal Fe films on GaAs grown by molecular beam epitaxy
American Institute of Physics | 1985|Schlagwörter: THICKNESS -
X‐ray absorption in characterization of laser fusion targets
American Institute of Physics | 1983|Schlagwörter: thickness -
Withdrawing a Bingham viscoplastic fluid
American Institute of Physics | 2019|Schlagwörter: Film thickness -
Wetting of helium films to silver substrates
American Institute of Physics | 1989|Schlagwörter: THICKNESS -
Wavelength dependence of optically induced oxidation of GaAs(100)
American Institute of Physics | 1987|Schlagwörter: THICKNESS -
Virtual interface method for in situ ellipsometry of films grown on unknown substrates
American Institute of Physics | 1993|Schlagwörter: THICKNESS -
Vibration of a thick polygonal ring in its plane
American Institute of Physics | 1983|Schlagwörter: thickness -
Vibration and buckling of circular plates of variable thickness
American Institute of Physics | 1982|Schlagwörter: THICKNESS -
Vibrational study of the SiO2/Si interface by high resolution electron energy loss spectroscopy
American Institute of Physics | 1985|Schlagwörter: THICKNESS -
Via hole filling with gold melting by KrF excimer laser irradiation
American Institute of Physics | 1989|Schlagwörter: THICKNESS -
Very thin silicon epitaxial layers grown using rapid thermal vapor phase epitaxy
American Institute of Physics | 1989|Schlagwörter: THICKNESS -
Valence‐band offset and interface formation in ZnTe/GaSb(110) studied by photoemission using synchrotron radiation
American Institute of Physics | 1988|Schlagwörter: THICKNESS -
Vacuum vapor deposited thin films of a perylene dicarboximide derivative: Microstructure versus deposition parameters
American Institute of Physics | 1988|Schlagwörter: THICKNESS -
Vacuum outgassing of various materials
American Institute of Physics | 1984|Schlagwörter: thickness -
Use of hybrid reflectors to achieve low thresholds in all molecular‐beam epitaxy grown vertical cavity surface emitting laser diodes
American Institute of Physics | 1990|Schlagwörter: THICKNESS -
Uniform liquid‐fuel layer produced in a cryogenic inertial fusion target by a time‐dependent thermal gradient
American Institute of Physics | 1990|Schlagwörter: THICKNESS -
Uniformity of targets erosion and magnetic film thickness distribution in the target‐facing‐type sputtering method
American Institute of Physics | 1992|Schlagwörter: THICKNESS -
Underwater polyvinylidene fluoride (PVDF) acoustic sensors.
Freier ZugriffAmerican Institute of Physics | 1992|Schlagwörter: THICKNESS -
Ultrathin self‐assembled polymeric films on solid surfaces. III. Influence of acrylate dithioalkyl side chain length on polymeric monolayer formation on gold
American Institute of Physics | 1994|Schlagwörter: THICKNESS -
Ultrathin polymer films for microlithography
American Institute of Physics | 1988|Schlagwörter: THICKNESS -
Ultrathin gate dielectrics on 150 mm Si wafers via rapid thermal processing
American Institute of Physics | 1986|Schlagwörter: THICKNESS -
Ultrafast optical response of ultrathin YBCO films
American Institute of Physics | 1992|Schlagwörter: THICKNESS -
Ultimate resolution and contrast in ion‐beam lithography
American Institute of Physics | 1987|Schlagwörter: THICKNESS -
Tungsten chemical vapor deposition characteristics using SiH4 in a single wafer system
American Institute of Physics | 1988|Schlagwörter: THICKNESS -
Transmission spectroscopy of a thin membrane
American Institute of Physics | 1993|Schlagwörter: THICKNESS -
Transmission of turbulent boundary layer pressures through thin and thick shells
Freier ZugriffAmerican Institute of Physics | 1995|Schlagwörter: THICKNESS -
Transmission electron microscopy study of In0.25Ga0.75As epilayers grown on GaAs (001) by molecular beam epitaxy: The effect of epilayer thickness
American Institute of Physics | 1995|Schlagwörter: THICKNESS -
Transmission electron microscopy of elastic relaxation effects in Si–Ge strained layer superlattice structures
American Institute of Physics | 1988|Schlagwörter: THICKNESS -
Transmission electron microscope study of Hg‐based multilayer structures
American Institute of Physics | 1987|Schlagwörter: THICKNESS -
Transient fluorocarbon film thickness effects near the silicon dioxide/silicon interface in selective silicon dioxide reactive ion etching
American Institute of Physics | 1988|Schlagwörter: THICKNESS -
Transient capacitance study of epitaxial CoSi2/Si〈111〉 Schottky barriers
American Institute of Physics | 1985|Schlagwörter: THICKNESS -
To the numerical simulation of the correlation picture in Dicke superradiance
American Institute of Physics | 2022|Schlagwörter: Dicke superradiance -
Topography‐induced thickness variation anomalies for spin‐coated thin films
American Institute of Physics | 1985|Schlagwörter: THICKNESS -
Titanium–silicon and silicon dioxide reactions controlled by low temperature rapid thermal annealing
American Institute of Physics | 1986|Schlagwörter: THICKNESS -
Titanium silicide growth by rapid‐thermal processing of Ti films deposited on lightly doped and heavily doped silicon substrates
American Institute of Physics | 1987|Schlagwörter: THICKNESS -
TiN film coatings on alumina radio frequency windows
American Institute of Physics | 1992|Schlagwörter: THICKNESS -
Time of flight elastic recoil detection for thin film analysis
American Institute of Physics | 1999|Schlagwörter: THICKNESS -
Three‐dimensional acoustic propagation in a waveguide of variable thickness
Freier ZugriffAmerican Institute of Physics | 1995|Schlagwörter: THICKNESS -
Thin metal films deposited at low temperature for optoelectronic device application
American Institute of Physics | 1996|Schlagwörter: THICKNESS -
Thin‐film interferometry of patterned surfaces
American Institute of Physics | 1995|Schlagwörter: THICKNESS -
Thin film CdS/CdTe solar cells fabricated by electrodeposition
American Institute of Physics | 1994|Schlagwörter: THICKNESS
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