Erscheinungsjahr
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Lizenz
Synonyme wurden verwendet für: Atomic force microscope
Suche ohne Synonyme: keywords:("Atomic force microscope")
Verwendete Synonyme:
- atomkraftmikroskop
- raster kraft mikroskop
- rasterkraftmikroskop
- scanning force microscope
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Feedforward compensation for hysteresis and dynamic behaviors of a high-speed atomic force microscope scanner
Online Contents | 2022|Schlagwörter: Atomic force microscope, High-speed atomic force microscope -
Impact of post deposition annealing in $ N_{2} $ ambient on structural properties of nanocrystalline hafnium oxide thin film
Online Contents | 2016|Schlagwörter: Atomic Force Microscope Data, Atomic Force Microscope, Atomic Force Microscope Analysis -
Mechanical and tribological characterization of a thermally actuated MEMS cantilever
Online Contents | 2012|Schlagwörter: Atomic Force Microscope, Atomic Force Microscope Measurement, Atomic Force Microscope Probe -
Mechanical strengthening of Si cantilever by chemical KOH etching and its surface analysis by TEM and AFM
Online Contents | 2014|Schlagwörter: Atomic Force Microscope, Atomic Force Microscope Measurement, Atomic Force Microscope Probe -
Mechanical and tribological characterization of a thermally actuated MEMS cantilever
Online Contents | 2012|Schlagwörter: Atomic Force Microscope, Atomic Force Microscope Measurement, Atomic Force Microscope Probe -
Analysis of crystallization property of LDPE/$ Fe_{3} $$ O_{4} $ nano-dielectrics based on AFM measurements
Online Contents | 2016|Schlagwörter: Atomic Force Microscope Image, Atomic Force Microscope -
Impact of post deposition annealing in $ N_{2} $ ambient on structural properties of nanocrystalline hafnium oxide thin film
Online Contents | 2016|Schlagwörter: Atomic Force Microscope Data, Atomic Force Microscope, Atomic Force Microscope Analysis -
Mechanical strengthening of Si cantilever by chemical KOH etching and its surface analysis by TEM and AFM
Online Contents | 2014|Schlagwörter: Atomic Force Microscope, Atomic Force Microscope Measurement, Atomic Force Microscope Probe -
A microwave probe nanostructure for atomic force microscopy
Online Contents | 2009|Schlagwörter: Atomic Force Microscope, Atomic Force Microscope Measurement, Atomic Force Microscope Probe -
Towards the implanting of ions and positioning of nanoparticles with nm spatial resolution
Online Contents | 2008|Schlagwörter: Atomic Force Microscope Device, Atomic Force Microscope, Atomic Force Microscope System, Atomic Force Microscope Operation -
Highly sensitive microcantilever-based immunosensor for the detection of carbofuran in soil and vegetable samples
Elsevier | 2017|Schlagwörter: Atomic force microscope -
Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy
Freier ZugriffDOAJ | 2020|Schlagwörter: atomic force microscope, high-speed atomic force microscope -
Towards the implanting of ions and positioning of nanoparticles with nm spatial resolution
Online Contents | 2008|Schlagwörter: Atomic Force Microscope Device, Atomic Force Microscope, Atomic Force Microscope System, Atomic Force Microscope Operation -
A microwave probe nanostructure for atomic force microscopy
Online Contents | 2009|Schlagwörter: Atomic Force Microscope, Atomic Force Microscope Measurement, Atomic Force Microscope Probe -
Adhesive surface interactions of cellulose nanocrystals from different sources
Online Contents | 2012|Schlagwörter: Atomic Force Microscope, Atomic Force Microscope Cantilever -
Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device
Elsevier | 2013|Schlagwörter: Atomic force microscope -
Analysis of crystallization property of LDPE/$ Fe_{3} $$ O_{4} $ nano-dielectrics based on AFM measurements
Online Contents | 2016|Schlagwörter: Atomic Force Microscope Image, Atomic Force Microscope -
Influence of chitosan-based coatings on the physicochemical properties and pectin nanostructure of Chinese cherry
Elsevier | 2017|Schlagwörter: Atomic force microscope -
A comparison of control architectures for atomic force microscopes
Wiley | 2009|Schlagwörter: Atomic force microscope -
Spontaneously formation of SEI layers on lithium metal from LiFSI/DME and LiTFSI/DME electrolytes
Elsevier | 2020|Schlagwörter: Atomic force microscope
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