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CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers
NationallizenzTrans Tech Publications | 2010|Schlagwörter: Electron Beam Induced Current (EBIC) -
Electron-Beam-Induced Current Study of Electronic Property Change at SrTiO3 Bicrystal Interface Induced by Forming Process
NationallizenzTrans Tech Publications | 2012|Schlagwörter: Electron Beam Induced Current (EBIC) -
Electrical activity of grain boundaries in polycrystalline silicon – influences of grain boundary structure, chemistry and temperature
DeGruyter | 2022|Schlagwörter: Electron beam induced current (EBIC) -
Subsurface Imaging of Coupled Carrier Transport in GaAs/AlGaAs Core–Shell Nanowires
American Chemical Society | 2015|Schlagwörter: Electron beam induced current (EBIC) -
Progress in Cold-Wall Epitaxy for 4H-SiC High-Power Devices
NationallizenzTrans Tech Publications | 2007|Schlagwörter: Electron Beam Induced Current (EBIC) -
Dislocation Analysis in Highly Doped n-Type 4H-SiC by Using Electron Beam Induced Current and KOH+Na2O2 Etching
NationallizenzTrans Tech Publications | 2011|Schlagwörter: Electron Beam Induced Current (EBIC) -
On the emitter formation in nanotextured silicon solar cells to achieve improved electrical performances
Elsevier | 2016|Schlagwörter: Electron beam induced current (EBIC) -
Electron Beam Induced Current Observation of Dislocations in 4H-SiC Introduced by Mechanical Polishing
NationallizenzTrans Tech Publications | 2012|Schlagwörter: Electron Beam Induced Current (EBIC) -
Electron Beam Induced Current Contrast of Oxygen Precipitation Related Defects in Czochralski Silicon
NationallizenzTrans Tech Publications | 2001|Schlagwörter: Electron Beam Induced Current (EBIC) -
Simulation of EBIC Contrast for Extended Defects Inclined to the Surface
NationallizenzTrans Tech Publications | 2001|Schlagwörter: Electron Beam Induced Current (EBIC) -
Effects of Grain Boundary Structure and Chemistry on Electrical Activity in Polycrystalline Silicon
NationallizenzTrans Tech Publications | 2003|Schlagwörter: Electron Beam Induced Current (EBIC) -
Depth Profiling of the Recombination Activity of Defects Measured by Temperature-Dependent Cross-Sectional EBIC
NationallizenzTrans Tech Publications | 2001|Schlagwörter: Electron Beam Induced Current (EBIC) -
Reconstruction of Diffusion Length Distribution by the Modulated EBIC and OBIC
NationallizenzTrans Tech Publications | 2001|Schlagwörter: Electron Beam Induced Current (EBIC) -
The Electrical Activity of Dislocations in Edge-Defined Film-Fed Growth Silicon
NationallizenzTrans Tech Publications | 1994|Schlagwörter: Electron Beam Induced Current (EBIC) -
Characterization of Laser Structures by EBIC Measurements and Simulation
NationallizenzTrans Tech Publications | 1998|Schlagwörter: Electron Beam Induced Current (EBIC) -
Copper Precipitation at the Silicon/Silicon Dioxide Interface: Microstructure and Electrical Properties
NationallizenzTrans Tech Publications | 1993|Schlagwörter: Electron Beam Induced Current (EBIC) -
Defect Characterization in Metal-Oxide-Semiconductor Field-Effect-Transistors with Trench Gates by Electron Beam-Induced Current Technique
NationallizenzTrans Tech Publications | 1998|Schlagwörter: Electron Beam Induced Current (EBIC) -
Different Dissociation Behavior of [11-20] and Non-[11-20] Basal Plane Dislocations in 4H-SiС under Electron Beam Irradiation
NationallizenzTrans Tech Publications | 2012|Schlagwörter: Electron Beam Induced Current (EBIC) -
Characterisation of direct epitaxial silicon thin film solar cells on a low-cost substrate
Elsevier | 2003|Schlagwörter: Electron beam induced current (EBIC) -
Qualitative and Quantitative Analysis of Thin Film Heterostructures by Electron Beam Induced Current
NationallizenzTrans Tech Publications | 1999|Schlagwörter: Electron Beam Induced Current (EBIC)
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